Optical shape analysis based on discrete Fourier transform and second-order moment analysis of the brightness distribution for the detection of sub-micron range tracks in nuclear emulsion

Abstract To recognize sub-micron-range low-energy tracks recorded in a super-fine-grained nuclear emulsion (Nano Imaging Tracker), an elliptical fitting method was devised to analyze anisotropic images taken by an optical microscope. We report on this newly developed method using a discrete Fourier...

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Published inProgress of theoretical and experimental physics Vol. 2020; no. 10
Main Authors Umemoto, Atsuhiro, Naka, Tatsuhiro, Nakano, Toshiyuki, Kobayashi, Ryuta, Shiraishi, Takuya, Asada, Takashi
Format Journal Article
LanguageEnglish
Published Oxford Oxford University Press 01.10.2020
Subjects
Accuracy
Carbon
Charged particles
Crystals
Efficiency
Energy
Fourier transforms
Ion implantation
Sensors
Velocity
H41
C43
H20
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Abstract Abstract To recognize sub-micron-range low-energy tracks recorded in a super-fine-grained nuclear emulsion (Nano Imaging Tracker), an elliptical fitting method was devised to analyze anisotropic images taken by an optical microscope. We report on this newly developed method using a discrete Fourier transform and second-order moment analysis of the brightness distribution. We succeeded in lowering the ellipticity threshold, thereby improving the selection efficiency and angular resolution. Notably, the success of detecting carbon 30 keV tracks is the first such achievement in the world, where the incident direction of carbon 30 keV ions was determined with an accuracy of 41$^\circ$ and an efficiency of $1.7 \pm 0.1\%$.
AbstractList To recognize sub-micron-range low-energy tracks recorded in a super-fine-grained nuclear emulsion (Nano Imaging Tracker), an elliptical fitting method was devised to analyze anisotropic images taken by an optical microscope. We report on this newly developed method using a discrete Fourier transform and second-order moment analysis of the brightness distribution. We succeeded in lowering the ellipticity threshold, thereby improving the selection efficiency and angular resolution. Notably, the success of detecting carbon 30 keV tracks is the first such achievement in the world, where the incident direction of carbon 30 keV ions was determined with an accuracy of 41$^\circ$ and an efficiency of $1.7 \pm 0.1\%$.
Abstract To recognize sub-micron-range low-energy tracks recorded in a super-fine-grained nuclear emulsion (Nano Imaging Tracker), an elliptical fitting method was devised to analyze anisotropic images taken by an optical microscope. We report on this newly developed method using a discrete Fourier transform and second-order moment analysis of the brightness distribution. We succeeded in lowering the ellipticity threshold, thereby improving the selection efficiency and angular resolution. Notably, the success of detecting carbon 30 keV tracks is the first such achievement in the world, where the incident direction of carbon 30 keV ions was determined with an accuracy of 41$^\circ$ and an efficiency of $1.7 \pm 0.1\%$.
Author Asada, Takashi
Shiraishi, Takuya
Umemoto, Atsuhiro
Nakano, Toshiyuki
Kobayashi, Ryuta
Naka, Tatsuhiro
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  organization: Laboratori Nazionali del Gran Sasso Via G. Acitelli, 22 67100 Assergi L’Aquila, Italy
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CitedBy_id crossref_primary_10_1103_PhysRevC_107_014608
crossref_primary_10_1088_1742_6596_2156_1_012044
crossref_primary_10_1016_j_cpc_2022_108312
crossref_primary_10_1093_ptep_ptab030
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10.7567/JJAP.52.112601
10.1093/ptep/ptv041
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Snippet Abstract To recognize sub-micron-range low-energy tracks recorded in a super-fine-grained nuclear emulsion (Nano Imaging Tracker), an elliptical fitting method...
To recognize sub-micron-range low-energy tracks recorded in a super-fine-grained nuclear emulsion (Nano Imaging Tracker), an elliptical fitting method was...
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SubjectTerms Accuracy
Carbon
Charged particles
Crystals
Efficiency
Energy
Fourier transforms
Ion implantation
Sensors
Velocity
Title Optical shape analysis based on discrete Fourier transform and second-order moment analysis of the brightness distribution for the detection of sub-micron range tracks in nuclear emulsion
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