Diffraction Measurements of Residual Macrostress and Microstress Using X-Rays, Synchrotron and Neutrons

• Published in: JSME international journal. Series A, Solid mechanics and material engineering Vol. 47; no. 3; pp. 252 - 263
• Main Authors: TANAKA, Keisuke, AKINIWA, Yoshiaki
• Format: Journal Article
• Language: English
• Published: 01.07.2004

The present paper reviews some recent developments of the measurements of the macrostress and microstress by diffraction using X-rays, synchrotron and neutrons especially in Japan. These three methods are based on the same principle of the diffraction of crystals, and have different advantages. The...