Diffraction Measurements of Residual Macrostress and Microstress Using X-Rays, Synchrotron and Neutrons
The present paper reviews some recent developments of the measurements of the macrostress and microstress by diffraction using X-rays, synchrotron and neutrons especially in Japan. These three methods are based on the same principle of the diffraction of crystals, and have different advantages. The...
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Published in | JSME international journal. Series A, Solid mechanics and material engineering Vol. 47; no. 3; pp. 252 - 263 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
01.07.2004
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Abstract | The present paper reviews some recent developments of the measurements of the macrostress and microstress by diffraction using X-rays, synchrotron and neutrons especially in Japan. These three methods are based on the same principle of the diffraction of crystals, and have different advantages. The conventional X-rays detect the stress very near the surface, while the neutron diffraction takes the stress in the interior of the materials. High-energy X-rays from synchrotron sources have the penetration depth in between and are suitable for the measurement of subsurface stresses. After describing the developments of the fundamentals of the methods, the paper covers the recent applications of the diffraction methods to the residual stress analysis in textured thin films, the nondestructive determination of the subsurface distribution of residual stress in shot-peened materials, local stress measurements near the crack tip, the stress measurements of single crystals, macrostress and microstress measurements in composites, and the determination of the internal distribution of the residual stress in welded joints. |
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AbstractList | The present paper reviews some recent developments of the measurements of the macrostress and microstress by diffraction using X-rays, synchrotron and neutrons especially in Japan. These three methods are based on the same principle of the diffraction of crystals, and have different advantages. The conventional X-rays detect the stress very near the surface, while the neutron diffraction takes the stress in the interior of the materials. High-energy X-rays from synchrotron sources have the penetration depth in between and are suitable for the measurement of subsurface stresses. After describing the developments of the fundamentals of the methods, the paper covers the recent applications of the diffraction methods to the residual stress analysis in textured thin films, the nondestructive determination of the subsurface distribution of residual stress in shot-peened materials, local stress measurements near the crack tip, the stress measurements of single crystals, macrostress and microstress measurements in composites, and the determination of the internal distribution of the residual stress in welded joints. |
Author | AKINIWA, Yoshiaki TANAKA, Keisuke |
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Cites_doi | 10.1016/S1359-6454(02)00068-X 10.2472/jsms.52.764 10.2472/jsms.44.1464 10.1016/0001-6160(73)90064-3 10.1107/S0021889899005506 10.1098/rspa.1957.0133 10.1007/BF01337948 10.2472/jsms.48.1437 10.1080/0733300310001634943 10.1002/zamm.19290090104 10.2472/jsms.52.1237 10.2472/jsms.27.251 10.1063/1.340503 10.1299/jsmea.46.86 10.2472/jsms.47.420 10.2472/jsms.47.755 10.2472/jsms.47.1301 10.2472/jsms.51.1429 10.1299/jsmea.41.290 |
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References | 23 24 25 Newman, J.C., Jr. (31) 1981 ITO T (19) 2003; 46 HAYASHI MAKOTO (39) 1995; 44 Tanaka, K., Akiniwa, Y. and Ito, T. (14) 2000; 6 Tanaka, K., Akiniwa, Y. and Hayashi (3) 2002; 8 Hanabusa, T. (16) 2000; 5 Pintschovius, L. (4) 2003 TANAKA KEISUKE (33) 2003; 52 Preuss, M., Withers, P.J., Maire, E (29) 2002; 50 Ohya, S., Nagahama, T., Kojima, R. (5) 2000; 6 Rauchs, G., Preuss, M. and Withers (28) 2002; 50 Kroner, E. (9) 1958; 151 30 Taira, S., Tanaka, K. and Yamasaki (26) 1978; 27 34 13 35 37 YANASE ETSUYA (22) 2002; 51 Tanaka, K., Ito, T., Akiniwa, Y. an (17) 2003 AKINIWA YOSHIAKI (20) 2003; 52 HAYASHI MAKOTO (6) 1998; 47 Voigt, W. (11) 1928 1 2 Tanaka, K., Suzuki, K., Sakaida, Y. (15) 2000; 6 AKINIWA YOSHIAKI (36) 1998; 47 Reuss, A. (10) 1929; 9 Sasaki, T. and Hirose, Y. (27) 1995; 44 7 TANAKA K (18) 1998; 41 SUYAMA YUJIRO (32) 1999; 48 TANAKA KEISUKE (8) 1998; 47 Akiniwa, Y., Tanaka, K., Minakawa (38) 2000; 6 Mura, T. (12) 1991 21 |
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