Influence of the substrate on the phase composition and electrical properties of 0.65PMN–0.35PT thick films

• Published in: Journal of the European Ceramic Society Vol. 30; no. 10; pp. 2081 - 2092
• Main Authors: Uršič, H., Hrovat, M., Holc, J., Tellier, J., Drnovšek, S., Guiblin, N., Dkhil, B., Kosec, M.
• Format: Journal Article
• Language: English
• Published: Elsevier Ltd 01.08.2010; Elsevier
• Subjects: 0.65PMN–0.35PT; Aluminum oxide; Condensed Matter; Density; Dielectric constant; Electrical properties; Materials Science; Microstructure; Phase composition; Physics; Platinum; Residual stress; Sintering; Stresses; Thick films; X-ray methods; X-rays; Films; Electrical properties; X-ray methods; 0.65PMN–0.35PT; Residual stress

Thick films with the nominal composition 0.65Pb(Mg 1/3Nb 2/3)O 3–0.35PbTiO 3 (0.65PMN–0.35PT) were produced by screen-printing and firing paste prepared from an organic vehicle and pre-reacted powder. The films were fired for 2 h at 950 °C on alumina (Al 2O 3), platinum (Pt), aluminium nitride (AlN)...