APA (7th ed.) Citation

Yu, J., Wang, H., Zhuge, F., Chen, Z., Hu, M., Xu, X., . . . Zhai, T. (2023). Simultaneously ultrafast and robust two-dimensional flash memory devices based on phase-engineered edge contacts. Nature communications, 14(1), 5662-9. https://doi.org/10.1038/s41467-023-41363-x

Chicago Style (17th ed.) Citation

Yu, Jun, et al. "Simultaneously Ultrafast and Robust Two-dimensional Flash Memory Devices Based on Phase-engineered Edge Contacts." Nature Communications 14, no. 1 (2023): 5662-9. https://doi.org/10.1038/s41467-023-41363-x.

MLA (9th ed.) Citation

Yu, Jun, et al. "Simultaneously Ultrafast and Robust Two-dimensional Flash Memory Devices Based on Phase-engineered Edge Contacts." Nature Communications, vol. 14, no. 1, 2023, pp. 5662-9, https://doi.org/10.1038/s41467-023-41363-x.