Evolution of the conductive filament system in HfO2-based memristors observed by direct atomic-scale imaging - Zhang, Ying; Mao, Ge-Qi; Zhao, Xiaolong; Li, Yu; Zhang, Meiyun; Wu, Zuheng; Wu, Wei; Sun, Huajun; Guo, Yizhong; Wang, Lihua; Zhang, Xumeng; Liu, Qi; et al. (Nature communications, 2021)
Keywords: 147/143; 639/925/357; 639/925/927/1007; Core-shell structure; Electrodes; Evolution; Filaments; Hafnium oxide; High resolution electron microscopy; Humanities and Social Sciences; Memristors; multidisciplinary; Oxidation; Oxygen; Phase transitions; Rupture; Rupturing; Science; Science (multidisciplinary); Switching; Transmission electron microscopy