Cell-Deformability-Monitoring Chips Based on Strain-Dependent Cell-Lysis Rates

• Published in: Journal of microelectromechanical systems Vol. 17; no. 2; pp. 302 - 308
• Main Authors: YOUN, Sechan, DONG WOO LEE, CHO, Young-Ho
• Format: Journal Article
• Language: English
• Published: New York, NY IEEE 01.04.2008; Institute of Electrical and Electronics Engineers; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Area measurement; Areal strain; Arrays; Biomembranes; Capacitive sensors; cell deformability; cell lysis; Cells (biology); Chemicals; Chips; Computerized monitoring; erythrocyte deformability; Erythrocytes; Exact sciences and technology; Filters; Formability; Fracture mechanics; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; Mechanical factors; Mechanical instruments, equipment and techniques; Membranes; Micromechanical devices and systems; Monitoring; Physics; Semiconductor device measurement; Strain; Strain measurement; High performance; Membranes; Ruptures; Areal strain; Mechanical properties; System on a chip; Experimental study; cell deformability; erythrocyte deformability; Aging; Microelectromechanical device; Monitoring; cell lysis

We present a novel cell-deformability-monitoring chip based on the digitally measured cell-lysis rate which is dependent on the areal strain of the cell membrane. This method offers simple and automated cell-deformability monitoring based on the mechanical property of the cell membrane. We suggest a...