Influence of Microstructure on the Ionic Conductivity of Plasma-Sprayed Yttria-Stabilized Zirconia Deposits
Yttria‐stabilized zirconia (YSZ) deposits were prepared by an atmospheric plasma spray (APS) on a stainless‐steel substrate preheated to different temperatures from room temperature to 1100°C. The microstructure of the deposits was characterized from polished and fractured cross sections by scanning...
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| Published in | Journal of the American Ceramic Society Vol. 91; no. 12; pp. 3931 - 3936 |
|---|---|
| Main Authors | , , , , |
| Format | Journal Article |
| Language | English |
| Published |
Malden, USA
Blackwell Publishing Inc
01.12.2008
Wiley Wiley Subscription Services, Inc |
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| Online Access | Get full text |
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| Abstract | Yttria‐stabilized zirconia (YSZ) deposits were prepared by an atmospheric plasma spray (APS) on a stainless‐steel substrate preheated to different temperatures from room temperature to 1100°C. The microstructure of the deposits was characterized from polished and fractured cross sections by scanning electron microscopy (SEM). The ionic conductivity of the deposits was measured using both DC and AC methods, and the relationship between ionic conductivity and microstructure of deposits was examined. SEM observation revealed that the YSZ deposits exhibit different microstructures with different deposition temperatures. With the increase of the deposition temperature, the columnar grain growth across lamellar interfaces was enhanced and subsequently the intersplat bonding ratio in the deposit was improved. The ionic conductivity of YSZ deposits at the direction perpendicular to the deposit surface was significantly increased through the microstructure development on increasing the deposition temperature. However, it was found that the intergrain resistance changed little despite a remarkable change of the deposition temperature. A microstructure model is proposed to correlate the relative conductivity to the mean lamellar interface bonding ratio. The increase in ionic conductivity of the YSZ deposit with the deposition temperature can be attributed to the increase in the lamellar interface bonding ratio. |
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| AbstractList | Yttria-stabilized zirconia (YSZ) deposits were prepared by an atmospheric plasma spray (APS) on a stainless-steel substrate preheated to different temperatures from room temperature to 1100{degrees}C. The microstructure of the deposits was characterized from polished and fractured cross sections by scanning electron microscopy (SEM). The ionic conductivity of the deposits was measured using both DC and AC methods, and the relationship between ionic conductivity and microstructure of deposits was examined. SEM observation revealed that the YSZ deposits exhibit different microstructures with different deposition temperatures. With the increase of the deposition temperature, the columnar grain growth across lamellar interfaces was enhanced and subsequently the intersplat bonding ratio in the deposit was improved. The ionic conductivity of YSZ deposits at the direction perpendicular to the deposit surface was significantly increased through the microstructure development on increasing the deposition temperature. However, it was found that the intergrain resistance changed little despite a remarkable change of the deposition temperature. A microstructure model is proposed to correlate the relative conductivity to the mean lamellar interface bonding ratio. The increase in ionic conductivity of the YSZ deposit with the deposition temperature can be attributed to the increase in the lamellar interface bonding ratio. Yttria-stabilized zirconia (YSZ) deposits were prepared by an atmospheric plasma spray (APS) on a stainless-steel substrate preheated to different temperatures from room temperature to 1100'C. The microstructure of the deposits was characterized from polished and fractured cross sections by scanning electron microscopy (SEM). The ionic conductivity of the deposits was measured using both DC and AC methods, and the relationship between ionic conductivity and microstructure of deposits was examined. SEM observation revealed that the YSZ deposits exhibit different microstructures with different deposition temperatures. With the increase of the deposition temperature, the columnar grain growth across lamellar interfaces was enhanced and subsequently the intersplat bonding ratio in the deposit was improved. The ionic conductivity of YSZ deposits at the direction perpendicular to the deposit surface was significantly increased through the microstructure development on increasing the deposition temperature. However, it was found that the intergrain resistance changed little despite a remarkable change of the deposition temperature. A microstructure model is proposed to correlate the relative conductivity to the mean lamellar interface bonding ratio. The increase in ionic conductivity of the YSZ deposit with the deposition temperature can be attributed to the increase in the lamellar interface bonding ratio. Yttria-stabilized zirconia (YSZ) deposits were prepared by an atmospheric plasma spray (APS) on a stainless-steel substrate preheated to different temperatures from room temperature to 1100...C. The microstructure of the deposits was characterized from polished and fractured cross sections by scanning electron microscopy (SEM). The ionic conductivity of the deposits was measured using both DC and AC methods, and the relationship between ionic conductivity and microstructure of deposits was examined. SEM observation revealed that the YSZ deposits exhibit different microstructures with different deposition temperatures. With the increase of the deposition temperature, the columnar grain growth across lamellar interfaces was enhanced and subsequently the intersplat bonding ratio in the deposit was improved. The ionic conductivity of YSZ deposits at the direction perpendicular to the deposit surface was significantly increased through the microstructure development on increasing the deposition temperature. However, it was found that the intergrain resistance changed little despite a remarkable change of the deposition temperature. A microstructure model is proposed to correlate the relative conductivity to the mean lamellar interface bonding ratio. The increase in ionic conductivity of the YSZ deposit with the deposition temperature can be attributed to the increase in the lamellar interface bonding ratio. (ProQuest: ... denotes formulae/symbols omitted.) Yttria‐stabilized zirconia (YSZ) deposits were prepared by an atmospheric plasma spray (APS) on a stainless‐steel substrate preheated to different temperatures from room temperature to 1100°C. The microstructure of the deposits was characterized from polished and fractured cross sections by scanning electron microscopy (SEM). The ionic conductivity of the deposits was measured using both DC and AC methods, and the relationship between ionic conductivity and microstructure of deposits was examined. SEM observation revealed that the YSZ deposits exhibit different microstructures with different deposition temperatures. With the increase of the deposition temperature, the columnar grain growth across lamellar interfaces was enhanced and subsequently the intersplat bonding ratio in the deposit was improved. The ionic conductivity of YSZ deposits at the direction perpendicular to the deposit surface was significantly increased through the microstructure development on increasing the deposition temperature. However, it was found that the intergrain resistance changed little despite a remarkable change of the deposition temperature. A microstructure model is proposed to correlate the relative conductivity to the mean lamellar interface bonding ratio. The increase in ionic conductivity of the YSZ deposit with the deposition temperature can be attributed to the increase in the lamellar interface bonding ratio. |
| Author | Li, Chang-Jiu Yang, Guan-Jun Xing, Ya-Zhe Li, Cheng-Xin Zhang, Qiang |
| Author_xml | – sequence: 1 givenname: Ya-Zhe surname: Xing fullname: Xing, Ya-Zhe organization: State Key Laboratory for Mechanical Behavior of Materials, School of Materials Science and Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi 710049, China – sequence: 2 givenname: Chang-Jiu surname: Li fullname: Li, Chang-Jiu email: licj@mail.xjtu.edu.cn organization: State Key Laboratory for Mechanical Behavior of Materials, School of Materials Science and Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi 710049, China – sequence: 3 givenname: Qiang surname: Zhang fullname: Zhang, Qiang organization: State Key Laboratory for Mechanical Behavior of Materials, School of Materials Science and Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi 710049, China – sequence: 4 givenname: Cheng-Xin surname: Li fullname: Li, Cheng-Xin organization: State Key Laboratory for Mechanical Behavior of Materials, School of Materials Science and Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi 710049, China – sequence: 5 givenname: Guan-Jun surname: Yang fullname: Yang, Guan-Jun organization: State Key Laboratory for Mechanical Behavior of Materials, School of Materials Science and Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi 710049, China |
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| Keywords | Scanning electron microscopy Electrical conductivity Electrical properties Ionic conductivity Solid electrolyte Stabilized zirconia Experimental study Solid oxide fuel cell Oxide ceramics Yttrium Oxides Property structure relationship Zirconium Oxides Manufacturing Microstructure Plasma spraying Electroceramics |
| Language | English |
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| Notes | istex:7003C7FEDD70373D3699C302071A1F3C01BF61F6 ark:/67375/WNG-THM69JJM-W ArticleID:JACE02775 J. Stevenson—contributing editor This work was supported by National Natural Science Foundation of China (grant No. 50671080), National Science Fund for Distinguished Young Scholars (grant No.50725101), National Basic Research Program of China (grant No. 2007CB707702). ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 ObjectType-Article-2 ObjectType-Feature-1 content type line 23 |
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| Snippet | Yttria‐stabilized zirconia (YSZ) deposits were prepared by an atmospheric plasma spray (APS) on a stainless‐steel substrate preheated to different temperatures... Yttria-stabilized zirconia (YSZ) deposits were prepared by an atmospheric plasma spray (APS) on a stainless-steel substrate preheated to different temperatures... |
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| SubjectTerms | Applied sciences Building materials. Ceramics. Glasses Ceramic industries Ceramics Chemical industry and chemicals Conductivity Electrotechnical and electronic ceramics Energy Energy. Thermal use of fuels Equipments for energy generation and conversion: thermal, electrical, mechanical energy, etc Exact sciences and technology Fuel cells Ions Microstructure Plasma Stainless steel Technical ceramics Zirconium |
| Title | Influence of Microstructure on the Ionic Conductivity of Plasma-Sprayed Yttria-Stabilized Zirconia Deposits |
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