Precise Analysis of Nanoparticle Size Distribution in TEM Image
As an essential characterization, size distribution is an important indicator for the synthesis, optimization, and application of nanoparticles. Electron microscopes such as transmission electron microscopes (TEMs) are commonly utilized to collect size information on nanoparticles. However, the curr...
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| Published in | Methods and protocols Vol. 6; no. 4; p. 63 |
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| Main Authors | , |
| Format | Journal Article |
| Language | English |
| Published |
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| Abstract | As an essential characterization, size distribution is an important indicator for the synthesis, optimization, and application of nanoparticles. Electron microscopes such as transmission electron microscopes (TEMs) are commonly utilized to collect size information on nanoparticles. However, the current popular statistical method of manually measuring large particles one by one, using a ruler tool in the corresponding image analysis software is time-consuming and can introduce manual errors. Moreover, it is difficult to determine the measurement interval for irregularly shaped nanoparticles. Therefore, it is necessary to use an efficient and standard method to perform size distribution analysis of nanoparticles. In this work, we use basic ImageJ software (1.53 t) to analyze the size of typical silica nanoparticles in a TEM image and use Origin software to process the data, to obtain its accurate distribution quickly. Using it as a template, we believe that this work can provide a paradigm for the standardized analysis of nanoparticle size. |
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| AbstractList | As an essential characterization, size distribution is an important indicator for the synthesis, optimization, and application of nanoparticles. Electron microscopes such as transmission electron microscopes (TEMs) are commonly utilized to collect size information on nanoparticles. However, the current popular statistical method of manually measuring large particles one by one, using a ruler tool in the corresponding image analysis software is time-consuming and can introduce manual errors. Moreover, it is difficult to determine the measurement interval for irregularly shaped nanoparticles. Therefore, it is necessary to use an efficient and standard method to perform size distribution analysis of nanoparticles. In this work, we use basic
software (1.53 t) to analyze the size of typical silica nanoparticles in a TEM image and use
software to process the data, to obtain its accurate distribution quickly. Using it as a template, we believe that this work can provide a paradigm for the standardized analysis of nanoparticle size. As an essential characterization, size distribution is an important indicator for the synthesis, optimization, and application of nanoparticles. Electron microscopes such as transmission electron microscopes (TEMs) are commonly utilized to collect size information on nanoparticles. However, the current popular statistical method of manually measuring large particles one by one, using a ruler tool in the corresponding image analysis software is time-consuming and can introduce manual errors. Moreover, it is difficult to determine the measurement interval for irregularly shaped nanoparticles. Therefore, it is necessary to use an efficient and standard method to perform size distribution analysis of nanoparticles. In this work, we use basic ImageJ software (1.53 t) to analyze the size of typical silica nanoparticles in a TEM image and use Origin software to process the data, to obtain its accurate distribution quickly. Using it as a template, we believe that this work can provide a paradigm for the standardized analysis of nanoparticle size. As an essential characterization, size distribution is an important indicator for the synthesis, optimization, and application of nanoparticles. Electron microscopes such as transmission electron microscopes (TEMs) are commonly utilized to collect size information on nanoparticles. However, the current popular statistical method of manually measuring large particles one by one, using a ruler tool in the corresponding image analysis software is time-consuming and can introduce manual errors. Moreover, it is difficult to determine the measurement interval for irregularly shaped nanoparticles. Therefore, it is necessary to use an efficient and standard method to perform size distribution analysis of nanoparticles. In this work, we use basic ImageJ software (1.53 t) to analyze the size of typical silica nanoparticles in a TEM image and use Origin software to process the data, to obtain its accurate distribution quickly. Using it as a template, we believe that this work can provide a paradigm for the standardized analysis of nanoparticle size. As an essential characterization, size distribution is an important indicator for the synthesis, optimization, and application of nanoparticles. Electron microscopes such as transmission electron microscopes (TEMs) are commonly utilized to collect size information on nanoparticles. However, the current popular statistical method of manually measuring large particles one by one, using a ruler tool in the corresponding image analysis software is time-consuming and can introduce manual errors. Moreover, it is difficult to determine the measurement interval for irregularly shaped nanoparticles. Therefore, it is necessary to use an efficient and standard method to perform size distribution analysis of nanoparticles. In this work, we use basic ImageJ software (1.53 t) to analyze the size of typical silica nanoparticles in a TEM image and use Origin software to process the data, to obtain its accurate distribution quickly. Using it as a template, we believe that this work can provide a paradigm for the standardized analysis of nanoparticle size.As an essential characterization, size distribution is an important indicator for the synthesis, optimization, and application of nanoparticles. Electron microscopes such as transmission electron microscopes (TEMs) are commonly utilized to collect size information on nanoparticles. However, the current popular statistical method of manually measuring large particles one by one, using a ruler tool in the corresponding image analysis software is time-consuming and can introduce manual errors. Moreover, it is difficult to determine the measurement interval for irregularly shaped nanoparticles. Therefore, it is necessary to use an efficient and standard method to perform size distribution analysis of nanoparticles. In this work, we use basic ImageJ software (1.53 t) to analyze the size of typical silica nanoparticles in a TEM image and use Origin software to process the data, to obtain its accurate distribution quickly. Using it as a template, we believe that this work can provide a paradigm for the standardized analysis of nanoparticle size. |
| Audience | Academic |
| Author | Wang, Chao Zhang, Shan |
| AuthorAffiliation | 1 School of Materials Science and Engineering, Institute of Materials Science and Devices, Suzhou University of Science and Technology, 99 Xuefu Road, Suzhou 215011, China 2 The Russell H. Morgan Department of Radiology and Radiological Science, The Johns Hopkins University School of Medicine, 733 N. Broadway, Baltimore, MD 21218, USA |
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| Author_xml | – sequence: 1 givenname: Shan surname: Zhang fullname: Zhang, Shan – sequence: 2 givenname: Chao orcidid: 0000-0003-3137-1632 surname: Wang fullname: Wang, Chao |
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| Title | Precise Analysis of Nanoparticle Size Distribution in TEM Image |
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