Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore

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Bibliographic Details
Main Authors IEEE International Workshop on Memory Testing, Rajsuman, Rochit, Swee, Yong-Khim, Lau, Lee-Yee, IEEE Computer Society. Test Technology Technical Committee, IEEE Computer Society. Technical Committee on VLSI, IEEE Solid-State Circuits Council
Format Book
LanguageEnglish
Published Los Alamitos, Calif IEEE Computer Society Press 1996
Subjects
Random access memory > Congresses
Semiconductor storage devices > Testing > Congresses
Online AccessGet full text
ISBN0818674660
9780818674662

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Bibliography:"IEEE catalog number 96TB100042"--T.p. verso
Includes bibliographical references and index
ISBN:0818674660
9780818674662