APA (7th ed.) Citation

Voss-Fels, K. P., Keeble-Gagnère, G., Hickey, L. T., Tibbits, J., Nagornyy, S., Hayden, M. J., . . . Wittkop, B. (2019). High-resolution mapping of rachis nodes per rachis, a critical determinant of grain yield components in wheat. Theoretical and applied genetics, 132(9), 2707-2719. https://doi.org/10.1007/s00122-019-03383-4

Chicago Style (17th ed.) Citation

Voss-Fels, Kai P., et al. "High-resolution Mapping of Rachis Nodes Per Rachis, a Critical Determinant of Grain Yield Components in Wheat." Theoretical and Applied Genetics 132, no. 9 (2019): 2707-2719. https://doi.org/10.1007/s00122-019-03383-4.

MLA (9th ed.) Citation

Voss-Fels, Kai P., et al. "High-resolution Mapping of Rachis Nodes Per Rachis, a Critical Determinant of Grain Yield Components in Wheat." Theoretical and Applied Genetics, vol. 132, no. 9, 2019, pp. 2707-2719, https://doi.org/10.1007/s00122-019-03383-4.