Accurate Nanoscale Crystallography in Real-Space Using Scanning Transmission Electron Microscopy
Here, we report reproducible and accurate measurement of crystallographic parameters using scanning transmission electron microscopy. This is made possible by removing drift and residual scan distortion. We demonstrate real-space lattice parameter measurements with <0.1% error for complex-layered...
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| Published in | Microscopy and microanalysis Vol. 21; no. 4; pp. 946 - 952 |
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| Main Authors | , , , , , , , , , , , |
| Format | Journal Article |
| Language | English |
| Published |
New York, USA
Cambridge University Press
01.08.2015
Oxford University Press Microscopy Society of America (MSA) |
| Subjects | |
| Online Access | Get full text |
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| Abstract | Here, we report reproducible and accurate measurement of crystallographic parameters using scanning transmission electron microscopy. This is made possible by removing drift and residual scan distortion. We demonstrate real-space lattice parameter measurements with <0.1% error for complex-layered chalcogenides Bi2Te3, Bi2Se3, and a Bi2Te2.7Se0.3 nanostructured alloy. Pairing the technique with atomic resolution spectroscopy, we connect local structure with chemistry and bonding. Combining these results with density functional theory, we show that the incorporation of Se into Bi2Te3 causes charge redistribution that anomalously increases the van der Waals gap between building blocks of the layered structure. The results show that atomic resolution imaging with electrons can accurately and robustly quantify crystallography at the nanoscale. |
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| AbstractList | Here, we report reproducible and accurate measurement of crystallographic parameters using scanning transmission electron microscopy. This is made possible by removing drift and residual scan distortion. We demonstrate real-space lattice parameter measurements with <0.1% error for complex-layered chalcogenides Bi2Te3, Bi2Se3, and a Bi2Te2.7Se0.3 nanostructured alloy. Pairing the technique with atomic resolution spectroscopy, we connect local structure with chemistry and bonding. Combining these results with density functional theory, we show that the incorporation of Se into Bi2Te3 causes charge redistribution that anomalously increases the van der Waals gap between building blocks of the layered structure. The results show that atomic resolution imaging with electrons can accurately and robustly quantify crystallography at the nanoscale. Abstract Here, we report reproducible and accurate measurement of crystallographic parameters using scanning transmission electron microscopy. This is made possible by removing drift and residual scan distortion. We demonstrate real-space lattice parameter measurements with <0.1% error for complex-layered chalcogenides Bi 2 Te 3 , Bi 2 Se 3 , and a Bi 2 Te 2.7 Se 0.3 nanostructured alloy. Pairing the technique with atomic resolution spectroscopy, we connect local structure with chemistry and bonding. Combining these results with density functional theory, we show that the incorporation of Se into Bi 2 Te 3 causes charge redistribution that anomalously increases the van der Waals gap between building blocks of the layered structure. The results show that atomic resolution imaging with electrons can accurately and robustly quantify crystallography at the nanoscale. Here, we report reproducible and accurate measurement of crystallographic parameters using scanning transmission electron microscopy. This is made possible by removing drift and residual scan distortion. We demonstrate real-space lattice parameter measurements with <0.1% error for complex-layered chalcogenides Bi2Te3, Bi2Se3, and a Bi2Te2.7Se0.3 nanostructured alloy. Pairing the technique with atomic resolution spectroscopy, we connect local structure with chemistry and bonding. Combining these results with density functional theory, we show that the incorporation of Se into Bi2Te3 causes charge redistribution that anomalously increases the van der Waals gap between building blocks of the layered structure. The results show that atomic resolution imaging with electrons can accurately and robustly quantify crystallography at the nanoscale. |
| Author | Dycus, J. Houston Sang, Xiahan Findlay, Scott D. Oni, Adedapo A. Chan, Tsung-ta E. Harris, Joshua S. Fancher, Chris M. Irving, Douglas L. LeBeau, James M. Allen, Leslie J. Jones, Jacob L. Koch, Carl C. |
| Author_xml | – sequence: 1 givenname: J. Houston surname: Dycus fullname: Dycus, J. Houston organization: Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695, USA – sequence: 2 givenname: Joshua S. surname: Harris fullname: Harris, Joshua S. organization: Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695, USA – sequence: 3 givenname: Xiahan surname: Sang fullname: Sang, Xiahan organization: Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695, USA – sequence: 4 givenname: Chris M. surname: Fancher fullname: Fancher, Chris M. organization: Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695, USA – sequence: 5 givenname: Scott D. orcidid: 0000-0003-4862-4827 surname: Findlay fullname: Findlay, Scott D. organization: School of Physics and Astronomy, Monash University, Clayton, VIC 3800, Australia – sequence: 6 givenname: Adedapo A. surname: Oni fullname: Oni, Adedapo A. organization: Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695, USA – sequence: 7 givenname: Tsung-ta E. surname: Chan fullname: Chan, Tsung-ta E. organization: Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695, USA – sequence: 8 givenname: Carl C. surname: Koch fullname: Koch, Carl C. organization: Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695, USA – sequence: 9 givenname: Jacob L. surname: Jones fullname: Jones, Jacob L. organization: Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695, USA – sequence: 10 givenname: Leslie J. surname: Allen fullname: Allen, Leslie J. organization: School of Physics, University of Melbourne, Parkville, VIC 3010, Australia – sequence: 11 givenname: Douglas L. surname: Irving fullname: Irving, Douglas L. organization: Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695, USA – sequence: 12 givenname: James M. surname: LeBeau fullname: LeBeau, James M. email: jmlebeau@ncsu.edu organization: Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695, USA |
| BackLink | https://www.ncbi.nlm.nih.gov/pubmed/26169835$$D View this record in MEDLINE/PubMed https://www.osti.gov/biblio/1225090$$D View this record in Osti.gov |
| BookMark | eNp1kU1v1DAQhi1URD_gB3BBEb30Euqx4zg5Vqt-SQWkbnsOk4l36yprBzs57L-v96OoAnHyK88z78zoPWYHzjvD2Gfg34CDPp9DIaEWugTFQWop3rGj9KXyCkAdbDXkm_ohO47xmXMuuS4_sENRQllXUh2xXxdEU8DRZD_Q-UjYm2wW1nHEvvfLgMPTOrMuuzfY5_MByWSP0bplNid0biMeArq4sjFa77LL3tAYkvhuKSQ3P6w_svcL7KP5tH9P2OPV5cPsJr_7eX07u7jLSfF6zAtUXVdsT-laEhWR0JpqRClaAVIZLGqkTshKaa0FVVSVSi1a3imOEgt5wr7ufH0cbRPJjoaeyDuXNmpAiDSFJ-hsBw3B_55MHJu0OZm-R2f8FBvQknPBq6pM6Olf6LOfgksnJGoLlRISBTtqc24MZtEMwa4wrBvgzSaj5p-MUs-XvfPUrkz3p-M1lATIvSmu2mC7pXkz-7-2L2Q0nBc |
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| ContentType | Journal Article |
| Copyright | Microscopy Society of America 2015 |
| Copyright_xml | – notice: Microscopy Society of America 2015 |
| CorporateAuthor | Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS) |
| CorporateAuthor_xml | – name: Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS) |
| DBID | NPM AAYXX CITATION 3V. 7QO 7RV 7TK 7X7 7XB 88E 8FD 8FE 8FG 8FH 8FI 8FJ 8FK ABUWG AFKRA ARAPS AZQEC BBNVY BENPR BGLVJ BHPHI CCPQU DWQXO FR3 FYUFA GHDGH GNUQQ HCIFZ K9. KB0 LK8 M0S M1P M7P NAPCQ P5Z P62 P64 PQEST PQQKQ PQUKI 7X8 OTOTI |
| DOI | 10.1017/S1431927615013732 |
| DatabaseName | PubMed CrossRef ProQuest Central (Corporate) Biotechnology Research Abstracts Nursing & Allied Health Database Neurosciences Abstracts Health & Medical Collection ProQuest Central (purchase pre-March 2016) Medical Database (Alumni Edition) Technology Research Database ProQuest SciTech Collection ProQuest Technology Collection ProQuest Natural Science Collection Hospital Premium Collection Hospital Premium Collection (Alumni Edition) ProQuest Central (Alumni) (purchase pre-March 2016) ProQuest Central (Alumni) ProQuest Central Advanced Technologies & Aerospace Collection ProQuest Central Essentials Biological Science Collection AUTh Library subscriptions: ProQuest Central Technology Collection ProQuest Natural Science Collection ProQuest One Community College ProQuest Central Korea Engineering Research Database Health Research Premium Collection Health Research Premium Collection (Alumni) ProQuest Central Student SciTech Premium Collection ProQuest Health & Medical Complete (Alumni) Nursing & Allied Health Database (Alumni Edition) Biological Sciences Health & Medical Collection (Alumni Edition) PML(ProQuest Medical Library) Biological Science Database Nursing & Allied Health Premium Advanced Technologies & Aerospace Database ProQuest Advanced Technologies & Aerospace Collection Biotechnology and BioEngineering Abstracts ProQuest One Academic Eastern Edition (DO NOT USE) ProQuest One Academic ProQuest One Academic UKI Edition MEDLINE - Academic OSTI.GOV |
| DatabaseTitle | PubMed CrossRef ProQuest Central Student Technology Collection Technology Research Database ProQuest Advanced Technologies & Aerospace Collection ProQuest Central Essentials ProQuest Health & Medical Complete (Alumni) ProQuest Central (Alumni Edition) SciTech Premium Collection ProQuest One Community College ProQuest Natural Science Collection ProQuest Central Health Research Premium Collection Biotechnology Research Abstracts Health and Medicine Complete (Alumni Edition) Natural Science Collection ProQuest Central Korea Biological Science Collection ProQuest Medical Library (Alumni) Advanced Technologies & Aerospace Collection ProQuest Biological Science Collection ProQuest One Academic Eastern Edition ProQuest Nursing & Allied Health Source ProQuest Hospital Collection ProQuest Technology Collection Health Research Premium Collection (Alumni) Biological Science Database ProQuest SciTech Collection Neurosciences Abstracts ProQuest Hospital Collection (Alumni) Biotechnology and BioEngineering Abstracts Advanced Technologies & Aerospace Database Nursing & Allied Health Premium ProQuest Health & Medical Complete ProQuest Medical Library ProQuest One Academic UKI Edition ProQuest Nursing & Allied Health Source (Alumni) Engineering Research Database ProQuest One Academic ProQuest Central (Alumni) MEDLINE - Academic |
| DatabaseTitleList | PubMed CrossRef ProQuest Central Student MEDLINE - Academic |
| Database_xml | – sequence: 1 dbid: NPM name: PubMed url: https://proxy.k.utb.cz/login?url=http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed sourceTypes: Index Database – sequence: 2 dbid: 8FG name: ProQuest Technology Collection url: https://search.proquest.com/technologycollection1 sourceTypes: Aggregation Database |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Biology |
| DocumentTitleAlternate | Joseph H. Dycus et al. Accurate Nanoscale Crystallography in Real-Space |
| EISSN | 1435-8115 |
| EndPage | 952 |
| ExternalDocumentID | 1225090 3763580721 10_1017_S1431927615013732 26169835 |
| Genre | Journal Article Feature |
| GroupedDBID | --- -E. .FH 09C 0E1 0R~ 123 29M 3V. 4.4 53G 5VS 5WD 74X 74Y 7RV 7X7 7~V 88E 8FE 8FG 8FH 8FI 8FJ 8R4 8R5 9M5 AAAZR AABES AABWE AACJH AAEED AAGFV AAKTX AARAB AASVR AATID AAUKB ABBXD ABEFU ABITZ ABJNI ABKKG ABMWE ABPTD ABQTM ABQWD ABROB ABTCQ ABUWG ABWCF ABWST ABZCX ACBEK ACBMC ACCHT ACFRR ACGFS ACIMK ACIPB ACIWK ACPRK ACQFJ ACQPF ACREK ACUFI ACUIJ ACUYZ ACWGA ACYZP ACZBM ACZUX ACZWT ADAZD ADBBV ADCGK ADFEC ADGEJ ADIPN ADIYS ADKIL ADOCW ADOVH ADQBN ADRDM ADVEK AEBAK AEHGV AEMTW AENEX AENGE AEYYC AFFUJ AFGWE AFKQG AFKRA AFKSM AFLOS AFLVW AFRAH AFUTZ AGABE AGBYD AGJUD AGOOT AHIPN AHLTW AHMBA AHQXX AIGNW AIHIV AIOIP AISIE AJ7 AJCYY AJPFC AJQAS ALMA_UNASSIGNED_HOLDINGS ALVPG ALWZO ANFBD ANPSP AQJOH ARABE ARAPS ATUCA AUXHV AZGZS BBLKV BBNVY BENPR BGHMG BGLVJ BGNMA BHPHI BKEYQ BLZWO BMAJL BPHCQ BRIRG BVXVI C0O CAG CBIIA CCPQU CCQAD CFAFE CJCSC COF CS3 DC4 DOHLZ DU5 EBS EJD EX3 F5P FYUFA HCIFZ HG- HMCUK HST HZ~ I.6 IH6 IOEEP IS6 I~P J36 J38 J3A JHPGK JKPOH JQKCU JVRFK KCGVB KFECR KOP L98 LAS LK8 LW7 M-V M1P M4Y M7P NAPCQ NIKVX NU0 O9- OBOKY OJZSN OVD OWPYF OYBOY P62 PQQKQ PROAC PSQYO PYCCK Q2X RAMDC RCA RIG RNS ROL RR0 S6- S6U SAAAG SDH SY4 T9M TEORI UKHRP UT1 UU6 VUG WFFJZ WOW WQ3 WXU WXY WYP ZYDXJ AAUAY ATGXG CTKSN H13 NPM AAYXX CITATION 7QO 7TK 7XB 8FD 8FK AZQEC DWQXO FR3 GNUQQ K9. P64 PQEST PQUKI 7X8 09E AAPXW AIAFM CHEAL OTOTI |
| ID | FETCH-LOGICAL-c509t-4a5dd427615dbc28cc277c9aa32b2135ea49acd23857772c8c8655fb0d50a3a43 |
| IEDL.DBID | BENPR |
| ISSN | 1431-9276 |
| IngestDate | Thu May 18 18:29:20 EDT 2023 Fri Oct 25 03:27:41 EDT 2024 Thu Oct 10 21:01:59 EDT 2024 Thu Sep 26 16:56:18 EDT 2024 Sat Sep 28 08:07:47 EDT 2024 Thu Mar 28 08:08:12 EDT 2024 |
| IsDoiOpenAccess | false |
| IsOpenAccess | true |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 4 |
| Keywords | Bi2Te3 scanning transmission electron microscopy atomic resolution spectroscopy nanoscale metrology |
| Language | English |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-c509t-4a5dd427615dbc28cc277c9aa32b2135ea49acd23857772c8c8655fb0d50a3a43 |
| Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 USDOE Office of Science (SC) |
| ORCID | 0000-0003-4862-4827 |
| OpenAccessLink | https://research.monash.edu/files/252076909/3574711_oa.pdf |
| PMID | 26169835 |
| PQID | 1700208631 |
| PQPubID | 33692 |
| PageCount | 7 |
| ParticipantIDs | osti_scitechconnect_1225090 proquest_miscellaneous_1730020886 proquest_journals_1700208631 crossref_primary_10_1017_S1431927615013732 pubmed_primary_26169835 cambridge_journals_10_1017_S1431927615013732 |
| PublicationCentury | 2000 |
| PublicationDate | 2015-08-01 |
| PublicationDateYYYYMMDD | 2015-08-01 |
| PublicationDate_xml | – month: 08 year: 2015 text: 2015-08-01 day: 01 |
| PublicationDecade | 2010 |
| PublicationPlace | New York, USA |
| PublicationPlace_xml | – name: New York, USA – name: United States – name: Oxford |
| PublicationTitle | Microscopy and microanalysis |
| PublicationTitleAlternate | Microsc Microanal |
| PublicationYear | 2015 |
| Publisher | Cambridge University Press Oxford University Press Microscopy Society of America (MSA) |
| Publisher_xml | – name: Cambridge University Press – name: Oxford University Press – name: Microscopy Society of America (MSA) |
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| SSID | ssj0003076 |
| Score | 2.2940283 |
| Snippet | Here, we report reproducible and accurate measurement of crystallographic parameters using scanning transmission electron microscopy. This is made possible by... Abstract Here, we report reproducible and accurate measurement of crystallographic parameters using scanning transmission electron microscopy. This is made... |
| SourceID | osti proquest crossref pubmed cambridge |
| SourceType | Open Access Repository Aggregation Database Index Database Publisher |
| StartPage | 946 |
| SubjectTerms | Accuracy Alloys Calibration Crystal structure Crystallography Materials Applications and Techniques Software Transmission electron microscopy X-rays |
| Title | Accurate Nanoscale Crystallography in Real-Space Using Scanning Transmission Electron Microscopy |
| URI | https://www.cambridge.org/core/product/identifier/S1431927615013732/type/journal_article https://www.ncbi.nlm.nih.gov/pubmed/26169835 https://www.proquest.com/docview/1700208631 https://search.proquest.com/docview/1730020886 https://www.osti.gov/biblio/1225090 |
| Volume | 21 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1Li9swEB66CYW9lD63brZBhZ7KisaybNmnsg1JQyGhJBvIzZUlGRaKneZxyL_vjF-7pTQXH2Thx4xm5htpHgAfYx2b0EQ-j4UWXFoUqVj6ktvISStznVtFicLzRTRby--bcNNsuO2bsMpWJ1aK2paG9sg_Ux05gfg78L9sf3PqGkWnq00LjQvoC_QURA_6XyeLH8tOF-MKrvOLAp8nQkXtuSYVjaZBGkNI5AeK-o88VFf4y0r1SpS2_yPQyhJNn8OzBkKy25rnL-CJK17C07qp5OkV_Lw15kgFIBhqznKPPHBsvDshCvzV1qdm9wVbIkLkK_SYHavCBtjK1O2LWGW-kP20j8YmTZscNqfIPcphOb2G9XRyN57xpo8CNwgHDlzq0FpZ_anNjIiNEUqZROtAZMIPQqdloo1F4x0qBNsmNpStmmcjG450oGXwBnpFWbi3wNCbzvLEWWFRjlHasxzdKY0QC2GiROfJg5uOhmkjDfu0jiRT6T8k9-BTS-Z0W1fXODd5QIxIERpQfVtDgUDmkPqokUbJyIPrlj-PXtwtGg8-dLeRgnQqogtXHmlOUE2KIw-uar5234LuZZQgRn13_uEDuEQcFdZxgdfQO-yO7j1ilUM2hAu1UXiNp9-GzeL8A5kl5Bk |
| link.rule.ids | 230,315,783,787,888,12070,12779,21402,27938,27939,31733,31734,33387,33388,33758,33759,43324,43614,43819 |
| linkProvider | ProQuest |
| linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1ZS8QwEB50RfRFvK1nBJ_E4DZNrycRUdZjffCAfatpkoIg7eruPuy_d6aXiuhrG3rMZCbfJDPfABxFKtK-DlweCSW4NGhSkXQlN4GVRmYqMyEVCvfvg96zvBn4g3rDbVSnVTY-sXTUptC0R35KPHIC8bfnng3fOXWNotPVuoXGLMwRDxdx54eDNuCi-VtVF3kuj0UYNKeaRBlNF-kaAiLXC6n7yBe3wo81qlOgrf2NP8t16GoZlmoAyc4rja_AjM1XYb5qKTldg5dzrSdE_8DQbxYj1IBlFx9TxIBvDTs1e83ZA-JD_ojxsmVl0gB71FXzIlYuXqh82kVjl3WTHNanvD2qYJmuw_PV5dNFj9ddFLhGMDDmUvnGyPJPTapFpLUIQx0r5YlUuJ5vlYyVNrh0-yFCbR1pqlXN0q7xu8pT0tuATl7kdgsYxtJpFlsjDFox2nqaYTClEGAhSJQYOjlw0sowqW1hlFR5ZGHyS-QOHDdiToYVt8Z_g3dIEQkCA2K31ZQGpMeJi_6oG3cd2G308-3F7ZRx4LC9jRKkMxGV22JCY7xyUBQ4sFnptf0WDC6DGBHq9v8PP4CF3lP_Lrm7vr_dgUVEVH6VIbgLnfHHxO4hahmn--XU_ATd8ePX |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Accurate+Nanoscale+Crystallography+in+Real-Space+Using+Scanning+Transmission+Electron+Microscopy&rft.jtitle=Microscopy+and+microanalysis&rft.au=Dycus%2C+J+Houston&rft.au=Harris%2C+Joshua+S&rft.au=Sang%2C+Xiahan&rft.au=Fancher%2C+Chris+M&rft.date=2015-08-01&rft.pub=Oxford+University+Press&rft.issn=1431-9276&rft.eissn=1435-8115&rft.volume=21&rft.issue=4&rft.spage=946&rft_id=info:doi/10.1017%2FS1431927615013732&rft.externalDocID=3763580721 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1431-9276&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1431-9276&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1431-9276&client=summon |