A Novel Baseline Removal Paradigm for Subject-Independent Features in Emotion Classification Using EEG

Emotion plays a vital role in understanding the affective state of mind of an individual. In recent years, emotion classification using electroencephalogram (EEG) has emerged as a key element of affective computing. Many researchers have prepared datasets, such as DEAP and SEED, containing EEG signa...

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Bibliographic Details
Published inBioengineering (Basel) Vol. 10; no. 1; p. 54
Main Authors Ahmed, Md. Zaved Iqubal, Sinha, Nidul, Ghaderpour, Ebrahim, Phadikar, Souvik, Ghosh, Rajdeep
Format Journal Article
LanguageEnglish
Published Switzerland MDPI AG 01.01.2023
MDPI
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Summary:Emotion plays a vital role in understanding the affective state of mind of an individual. In recent years, emotion classification using electroencephalogram (EEG) has emerged as a key element of affective computing. Many researchers have prepared datasets, such as DEAP and SEED, containing EEG signals captured by the elicitation of emotion using audio–visual stimuli, and many studies have been conducted to classify emotions using these datasets. However, baseline power removal is still considered one of the trivial aspects of preprocessing in feature extraction. The most common technique that prevails is subtracting the baseline power from the trial EEG power. In this paper, a novel method called InvBase method is proposed for removing baseline power before extracting features that remain invariant irrespective of the subject. The features extracted from the baseline removed EEG data are then used for classification of two classes of emotion, i.e., valence and arousal. The proposed scheme is compared with subtractive and no-baseline-correction methods. In terms of classification accuracy, it outperforms the existing state-of-art methods in both valence and arousal classification. The InvBase method plus multilayer perceptron shows an improvement of 29% over the no-baseline-correction method and 15% over the subtractive method.
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ISSN:2306-5354
2306-5354
DOI:10.3390/bioengineering10010054