Investigations on the interfacial capacitance and the diffusion boundary layer thickness of ion exchange membrane using electrochemical impedance spectroscopy

• Published in: Journal of membrane science Vol. 502; pp. 37 - 47
• Main Authors: Zhang, Wenjuan, Ma, Jun, Wang, Panpan, Wang, Zhenghui, Shi, Fengmei, Liu, Huiling
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 15.03.2016
• Subjects: artificial membranes; capacitance; dielectric spectroscopy; Diffusion; Diffusion boundary layer thickness; Diffusion layers; Electrochemical impedance spectroscopy; electrochemistry; equations; Equivalent circuit; Interfacial capacitance; ion exchange; Ion exchangers; Mathematical analysis; Membranes; microstructure; scanning electron microscopes; Scanning electron microscopy; temperature; X-ray photoelectron spectroscopy; Zeta potential; AC; IEC; Diffusion boundary layer thickness; AEM; CEM; EDL; Interfacial capacitance; EIS; DBL; IEM; RED; TSP; Zeta potential; A.C; Equivalent circuit; CPE; SEM; XPS; OCP; ED; Electrochemical impedance spectroscopy

Electrochemical impedance spectroscopy (EIS) is a powerful tool to investigate the electrochemical processes. This work investigated the interfacial properties of ion exchange membranes using EIS. Scanning electron microscope (SEM), X-ray photoelectron spectroscopy (XPS) and zeta potential were also...