Digital Twin for Training Bayesian Networks for Fault Diagnostics of Manufacturing Systems - Ademujimi, Toyosi; Prabhu, Vittaldas (Sensors (Basel, Switzerland), 2022)
Keywords: Algorithms; Bayesian network; Computational linguistics; Design of experiments; digital twin; Fault diagnosis; fault diagnostics; Heuristic; Industrial Internet of Things; Innovations; Language processing; Learning; Manufacturing; Natural language interfaces; OEM; Ontology; Random variables; Robots; Sensors; Simulation; small data set; smart manufacturing; structure learning; Subject specialists; Twins; New York; fault diagnostics; digital twin; smart manufacturing; Bayesian network; small data set; structure learning