Mechanical behavior study of microdevice and nanomaterials by Raman spectroscopy： a review

With the rapid development of micro/nano manufacturing technology and nanomaterials, the accurate measurement of the mechanical properties and behaviors at the micro-nano scale represents a new field of mechanical experiments. Raman spectroscopy, which is based on lattice dynamics theory, is applica...

Full description

Saved in:
Bibliographic Details
Published inChinese science bulletin Vol. 59; no. 23; pp. 2811 - 2824
Main Authors Qiu, Wei, Kang, Yi-Lan
Format Journal Article
LanguageEnglish
Published Heidelberg Springer-Verlag 01.08.2014
Science China Press
Subjects
carbon nanotubes
Chemistry/Food Science
Deformation
Earth Sciences
Engineering
Graphene
Humanities and Social Sciences
Lattices
Life Sciences
Mechanical properties
Microstructure
multidisciplinary
Nanomaterials
Physics
Raman spectroscopy
Residual stress
Review
Science
Science (multidisciplinary)
动力学理论
展望
微型
拉曼光谱仪
残余应力测量
纳米制造技术
纳米材料
行为研究
Experimental mechanics
Raman spectroscopy
Residual stress in microdevice
Mechanical property of nanomaterial
Online AccessGet full text

Cover

Abstract With the rapid development of micro/nano manufacturing technology and nanomaterials, the accurate measurement of the mechanical properties and behaviors at the micro-nano scale represents a new field of mechanical experiments. Raman spectroscopy, which is based on lattice dynamics theory, is applicable to the detection of the statistical information of the lattice structure deformation within the measuring points. Due to its peculiarities, such as non-destructiveness, convenience and high-resolution, this technology allows the on-line in situ measurement of residual stress in microstructures caused by processing and can also achieve the real-time deformation of graphene, carbon nanotubes and other nanomaterials under force loading. In recent years, mechanical measurements based on Raman spectroscopy technology have developed rapidly. In this review, Raman-based stress measurement theories for several commonly used materials are briefly described. Applications related to the residual stress measurements of microstructure and experimental investigations of the mechanical properties of low-dimensional nanomaterials are then reviewed. Finally, the development trend of this method is proposed.
AbstractList With the rapid development of micro/nano manufacturing technology and nanomaterials, the accurate measurement of the mechanical properties and behaviors at the micronano scale represents a new field of mechanical experiments. Raman spectroscopy, which is based on lat tice dynamics theory, is applicable to the detection of the statistical information of the lattice structure deformation within the measuring points. Due to its peculiarities, such as non-destructiveness, convenience and highresolution, this technology allows the online in situ measurement of residual stress in microstructures caused by processing and can also achieve the realtime deformation of graphene, carbon nanotubes and other nanomaterials under force loading. In recent years, mechanical measurements based on Raman spectroscopy technology have developed rapidly. In this review, Ramanbased stress measurement theories for several commonly used materials are briefly described. Applications related to the residual stress measurements of microstructure and experimental investigations of the mechanical properties of lowdimensional nanomaterials are then reviewed. Finally, the development trend of this method is proposed.
With the rapid development of micro/nano manufacturing technology and nanomaterials, the accurate measurement of the mechanical properties and behaviors at the micro-nano scale represents a new field of mechanical experiments. Raman spectroscopy, which is based on lattice dynamics theory, is applicable to the detection of the statistical information of the lattice structure deformation within the measuring points. Due to its peculiarities, such as non-destructiveness, convenience and high-resolution, this technology allows the on-line in situ measurement of residual stress in microstructures caused by processing and can also achieve the real-time deformation of graphene, carbon nanotubes and other nanomaterials under force loading. In recent years, mechanical measurements based on Raman spectroscopy technology have developed rapidly. In this review, Raman-based stress measurement theories for several commonly used materials are briefly described. Applications related to the residual stress measurements of microstructure and experimental investigations of the mechanical properties of low-dimensional nanomaterials are then reviewed. Finally, the development trend of this method is proposed.
Author Kang, Yi-Lan
Qiu, Wei
AuthorAffiliation Tianjin Key Laboratory of Modem Engineering Mechanics,Department of Mechanics, Tianjin University, Tianjin 300072,China
Author_xml – sequence: 1
  fullname: Qiu, Wei
– sequence: 2
  fullname: Kang, Yi-Lan
BookMark eNqFkstu1TAQhiNUJNrCA7DCYsUm4InjS5ao4iYVIQHdIVkTZ3KOq8Q-tXOKzqvwLLwTr4CPUrFg0S4sX_R9o9H8PqtOQgxUVc-BvwbO9ZsM0Iq25lBWy6E2j6pTMArqTrZwUs68PCopzJPqLOfrchOgm9Pqx2dyWwze4cR62uKtj4nlZT8cWBzZ7F2KA916RwzDwAKGOONCyeOUWX9gX3HGwPKO3JJidnF3-PP7F0OWikM_n1aPxwLSs7v9vLp6_-77xcf68suHTxdvL2snuVlqbdzQmEE4OTowfWcAxqEH6lFT0za95oK04k3vdC-JeNOZfkQ58BGdJBjFefVqrbtL8WZPebGzz46mCQPFfbageac7CV3zMKqUkNLosj2IStkpbZQ-VtUrWsaVc6LROr_g4mNYEvrJArfHlOyaki0p2WNK1hQT_jN3yc-YDvc6zerkwoYNJXsd9ymUCd8rvVilEaPFTfLZXn1rClC-Qqs6oQvx8q6VbQybm1L5Xy9KgTJlLkL8BQi1vLc
CitedBy_id crossref_primary_10_1016_j_compscitech_2022_109483
crossref_primary_10_1016_j_microrel_2017_10_010
crossref_primary_10_1021_acs_jpcc_9b05284
crossref_primary_10_1016_j_ijheatmasstransfer_2021_122279
crossref_primary_10_1021_acsami_5c00249
crossref_primary_10_1021_acsami_6b08812
crossref_primary_10_2139_ssrn_4120301
crossref_primary_10_3390_app8122333
crossref_primary_10_3390_ma14226737
crossref_primary_10_1016_j_ceramint_2024_12_063
crossref_primary_10_3390_cryst11060626
crossref_primary_10_1063_1_5080179
crossref_primary_10_1016_j_mtcomm_2023_105442
crossref_primary_10_1016_j_ceramint_2023_09_290
crossref_primary_10_1002_admi_201901217
crossref_primary_10_1007_s10409_016_0591_1
crossref_primary_10_1007_s10853_022_07294_6
crossref_primary_10_1016_j_apsusc_2022_155735
crossref_primary_10_1007_s10409_023_23418_x
crossref_primary_10_3390_mi8090286
crossref_primary_10_1088_1742_6596_1820_1_012046
crossref_primary_10_1016_j_optlaseng_2021_106825
crossref_primary_10_1063_1_4992106
crossref_primary_10_1007_s11340_023_01026_w
crossref_primary_10_1007_s11340_022_00856_4
crossref_primary_10_3390_coatings9080500
crossref_primary_10_1021_acsami_1c03941
crossref_primary_10_1063_1_4918899
crossref_primary_10_1155_2021_2860007
crossref_primary_10_1080_1536383X_2021_1936506
Cites_doi 10.1063/1.3449135
10.1103/PhysRevB.72.115411
10.1016/j.optlaseng.2004.09.005
10.1016/S0924-4247(02)00432-6
10.1103/PhysRevB.13.5518
10.1021/nl301073q
10.1016/S0894-9166(11)60003-7
10.1063/1.2191949
10.1364/OE.17.022351
10.1038/nature07049
10.1063/1.361485
10.1109/JMEMS.2010.2076782
10.1016/S0921-5093(00)00869-8
10.1016/j.tsf.2011.12.078
10.1007/s10409-006-0038-1
10.1016/j.jcrysgro.2010.12.019
10.1016/0038-1098(70)90588-0
10.1063/1.370723
10.1063/1.118798
10.1016/j.actamat.2007.04.036
10.1016/S0925-9635(02)00227-3
10.1126/science.1147635
10.1016/S0925-9635(97)00212-4
10.1134/S1063783408120019
10.1002/(SICI)1097-4555(199910)30:10<877::AID-JRS464>3.0.CO;2-5
10.1007/s11434-012-5256-2
10.1016/j.optlaseng.2012.12.003
10.1016/j.compositesa.2007.08.018
10.1007/BF02410522
10.1557/mrs2010.570
10.1103/PhysRevLett.92.236804
10.1002/adma.200904264
10.1016/S0925-9635(02)00109-7
10.1016/S0143-8166(01)00033-1
10.1103/PhysRevB.72.035425
10.1002/jrs.2584
10.1016/S0169-4332(97)00550-3
10.1016/S1359-835X(00)00105-6
10.1088/0960-1317/16/9/020
10.1016/S0143-8166(02)00099-4
10.1021/nl901035v
10.1166/jnn.2013.6028
10.1088/0960-1317/11/1/302
10.1016/j.msea.2012.04.015
10.1109/84.623107
10.1088/0256-307X/22/4/057
10.1088/0957-4484/22/22/225704
10.1063/1.2183353
10.1016/j.compscitech.2005.10.018
10.1088/0256-307X/26/8/080701
10.1016/S0925-8388(01)01740-6
10.1016/j.mssp.2004.09.100
10.1016/0956-7151(94)90502-9
10.1007/s11340-006-0406-6
10.1016/0003-4916(70)90029-1
10.1063/1.373529
10.1007/s11340-012-9706-1
10.1063/1.2944138
10.1016/S0925-9635(02)00103-6
10.1038/nature11458
10.1016/j.actamat.2008.07.031
10.1016/S0143-8166(03)00030-7
10.1063/1.2838716
10.1166/jnn.2013.6036
10.1063/1.3552685
10.1016/j.optlaseng.2009.12.012
10.1007/s11340-011-9586-9
10.1016/j.compscitech.2012.12.015
10.1021/nl0711155
10.1063/1.339296
10.1016/j.mseb.2008.10.059
10.1109/JMEMS.2003.820280
10.1088/1674-1137/33/12/060
10.1016/j.sna.2009.04.012
10.1016/S0921-4526(99)00404-4
10.1557/JMR.1998.0336
10.1016/0038-1098(96)00410-3
10.1088/0957-0233/20/6/065301
10.1088/0256-307X/21/7/054
10.1016/j.matlet.2009.09.061
10.1007/BF02897461
10.1016/j.optlaseng.2009.12.020
10.1063/1.3531548
10.1049/mnl.2012.0295
10.1088/0256-307X/20/12/012
10.1063/1.1502921
10.1016/j.carbon.2012.10.043
10.1016/j.tsf.2009.02.141
10.1016/j.surfcoat.2009.04.030
10.1021/nn2002079
10.1007/s00542-004-0460-x
10.1088/1674-1137/33/11/020
ContentType Journal Article
Copyright Science China Press and Springer-Verlag Berlin Heidelberg 2014
Copyright_xml – notice: Science China Press and Springer-Verlag Berlin Heidelberg 2014
DBID 2RA
92L
CQIGP
~WA
FBQ
AAYXX
CITATION
7SC
7SP
7SR
7TB
7U5
8BQ
8FD
FR3
JG9
JQ2
KR7
L7M
L~C
L~D
7S9
L.6
DOI 10.1007/s11434-014-0401-8
DatabaseName 维普期刊资源整合服务平台
中文科技期刊数据库-CALIS站点
维普中文期刊数据库
中文科技期刊数据库- 镜像站点
AGRIS
CrossRef
Computer and Information Systems Abstracts
Electronics & Communications Abstracts
Engineered Materials Abstracts
Mechanical & Transportation Engineering Abstracts
Solid State and Superconductivity Abstracts
METADEX
Technology Research Database
Engineering Research Database
Materials Research Database
ProQuest Computer Science Collection
Civil Engineering Abstracts
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts – Academic
Computer and Information Systems Abstracts Professional
AGRICOLA
AGRICOLA - Academic
DatabaseTitle CrossRef
Materials Research Database
Civil Engineering Abstracts
Technology Research Database
Computer and Information Systems Abstracts – Academic
Mechanical & Transportation Engineering Abstracts
Electronics & Communications Abstracts
ProQuest Computer Science Collection
Computer and Information Systems Abstracts
METADEX
Computer and Information Systems Abstracts Professional
Engineered Materials Abstracts
Solid State and Superconductivity Abstracts
Engineering Research Database
Advanced Technologies Database with Aerospace
AGRICOLA
AGRICOLA - Academic
DatabaseTitleList

Materials Research Database
AGRICOLA
Materials Research Database
Database_xml – sequence: 1
  dbid: FBQ
  name: AGRIS
  url: http://www.fao.org/agris/Centre.asp?Menu_1ID=DB&Menu_2ID=DB1&Language=EN&Content=http://www.fao.org/agris/search?Language=EN
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Sciences (General)
Engineering
Physics
DocumentTitleAlternate Mechanical behavior study of microdevice and nanomaterials by Raman spectroscopy： a review
EISSN 1861-9541
EndPage 2824
ExternalDocumentID 10_1007_s11434_014_0401_8
US201400146937
661683553
GroupedDBID -Y2
-~X
.86
0R~
1N0
29B
2B.
2C.
2RA
2VQ
4.4
40D
40G
5GY
67Z
6J9
6NX
8UJ
92E
92I
92L
92Q
93N
AARTL
ABJOX
ABMNI
ABTMW
ACCUX
ACGFO
ACGFS
ACOMO
ADHIR
AEGNC
AEOHA
AFGCZ
AGQMX
ALMA_UNASSIGNED_HOLDINGS
AMKLP
BA0
BGNMA
CAG
COF
CQIGP
CS3
CW9
DU5
EBS
EJD
ESBYG
F5P
GX1
HF~
HZ~
IHE
I~X
I~Z
KOV
KQ8
M4Y
M~E
NB0
NU0
O9-
OK1
RNS
RPX
RSV
S1Z
S27
SCL
SDH
SHS
SOJ
T13
TCJ
TN5
U2A
UG4
W48
WK8
~02
~WA
ABPTK
FBQ
AAHBH
ABJNI
CJPJV
H13
AAYXX
CITATION
7SC
7SP
7SR
7TB
7U5
8BQ
8FD
FR3
JG9
JQ2
KR7
L7M
L~C
L~D
7S9
L.6
ID FETCH-LOGICAL-c508t-78cd28d3c5fc18b9811fdb1eba7e242b703e7602bc7b5ee0298bfa5d0fac5e1f3
IEDL.DBID 40G
ISSN 1001-6538
IngestDate Fri Jul 11 07:03:36 EDT 2025
Thu Jul 10 20:39:38 EDT 2025
Thu Jul 10 20:54:18 EDT 2025
Tue Jul 01 00:48:27 EDT 2025
Thu Apr 24 23:10:15 EDT 2025
Fri Feb 21 02:34:25 EST 2025
Tue Nov 07 23:15:29 EST 2023
Wed Feb 14 10:35:16 EST 2024
IsPeerReviewed false
IsScholarly false
Issue 23
Keywords Experimental mechanics
Raman spectroscopy
Residual stress in microdevice
Mechanical property of nanomaterial
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c508t-78cd28d3c5fc18b9811fdb1eba7e242b703e7602bc7b5ee0298bfa5d0fac5e1f3
Notes Raman spectroscopy ; Residual stress inmicrodevice ; Mechanical property of nanomaterial;Experimental mechanics
Wei Qiu ,Yi-Lan Kang （Tianjin Key Laboratory of Modem Engineering Mechanics, Department of Mechanics, Tianjin University, Tianjin 300072, China）
With the rapid development of micro/nano manufacturing technology and nanomaterials, the accurate measurement of the mechanical properties and behaviors at the micronano scale represents a new field of mechanical experiments. Raman spectroscopy, which is based on lat tice dynamics theory, is applicable to the detection of the statistical information of the lattice structure deformation within the measuring points. Due to its peculiarities, such as non-destructiveness, convenience and highresolution, this technology allows the online in situ measurement of residual stress in microstructures caused by processing and can also achieve the realtime deformation of graphene, carbon nanotubes and other nanomaterials under force loading. In recent years, mechanical measurements based on Raman spectroscopy technology have developed rapidly. In this review, Ramanbased stress measurement theories for several commonly used materials are briefly described. Applications related to the residual stress measurements of microstructure and experimental investigations of the mechanical properties of lowdimensional nanomaterials are then reviewed. Finally, the development trend of this method is proposed.
11-1785/N
http://dx.doi.org/10.1007/s11434-014-0401-8
ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ObjectType-Article-1
ObjectType-Feature-2
PQID 1559678672
PQPubID 23500
PageCount 14
ParticipantIDs proquest_miscellaneous_1709795192
proquest_miscellaneous_1663558766
proquest_miscellaneous_1559678672
crossref_citationtrail_10_1007_s11434_014_0401_8
crossref_primary_10_1007_s11434_014_0401_8
springer_journals_10_1007_s11434_014_0401_8
fao_agris_US201400146937
chongqing_primary_661683553
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2014-08-01
PublicationDateYYYYMMDD 2014-08-01
PublicationDate_xml – month: 08
  year: 2014
  text: 2014-08-01
  day: 01
PublicationDecade 2010
PublicationPlace Heidelberg
PublicationPlace_xml – name: Heidelberg
PublicationTitle Chinese science bulletin
PublicationTitleAbbrev Chin. Sci. Bull
PublicationTitleAlternate Chinese Science Bulletin
PublicationYear 2014
Publisher Springer-Verlag
Science China Press
Publisher_xml – name: Springer-Verlag
– name: Science China Press
References Lei, Quan, Wei (CR29) 2013; 51
Anastassakis, Cardona (CR43) 1998
De Wolf (CR32) 1999; 30
Kang, Qiu, Lei (CR53) 2005; 43
Li, Qiu, Tan (CR36) 2010; 48
Hartman, Jouzi, Barnett (CR80) 2004; 92
Ma, Liu, Zhang (CR87) 2009; 9
Starman, Lott, Amer (CR69) 2003; 104
Li, Niu, Zeng (CR83) 2013; 13
Lei, Kang, Qiu (CR55) 2004; 21
Piluso, Anzalone, Camarda (CR66) 2012; 522
Goncalves, Sandonato, Iha (CR49) 2002; 11
Wu, Zhou, Dong (CR77) 2005; 72
Bernardi, Goni, Alonso (CR64) 2006; 99
Srikar, Spearing (CR7) 2003; 43
Alhomoudi, Newaz (CR45) 2009; 517
Wermelinger, Mornaghini, Hinderling (CR72) 2010; 64
Kang, Han, Saif (CR10) 2010; 19
Nugent, Prawer (CR47) 1998; 7
Li, Yang (CR14) 2006; 16
Li, Su, Zhang (CR21) 2009; 153
Shi, Zhao, Liu (CR23) 2012; 7
De Wolf, Jian, van Spengen (CR65) 2001; 36
Erasmus, Daniel, Comins (CR73) 2011; 109
Gigler, Huber, Bauer (CR74) 2009; 17
Lee, Yoon, Cheong (CR93) 2012; 12
Li, Wang, Kang (CR85) 2012; 549
Romano, Van de Walle, Krusor (CR61) 1999; 273
Xie, Li, Geer (CR15) 2003; 40
Duan, Zhang, Wu (CR13) 2003; 20
Zhou, He, Song (CR37) 2005; 50
Cronin, Swan, Ünlü (CR75) 2005; 72
CR89
Lei, Kang, Cen (CR54) 2005; 22
Pandey, D’Cunha, Tyagi (CR48) 2002; 333
Novoselov, Fal, Colombo (CR4) 2012; 490
Hytch, Houdellier, Hue (CR22) 2008; 453
Liu, Xie, Zhang (CR84) 2013; 13
Qiu, Kang, Lei (CR94) 2009; 26
Demangeot, Frandon, Renucci (CR34) 1996; 100
Kämpfe (CR2) 2000; 288
Koziol, Vilatela, Moisala (CR3) 2007; 318
Moutanabbir, Reiche, Hahnel (CR60) 2010; 96
Lei, Qiu, Kang (CR27) 2008; 39
Zhang, Zhang, Chen (CR88) 2012; 57
Srivastava, Mehta, Yu (CR90) 2011; 98
Deng, Qiu, Li (CR86) 2014; 54
Qiu, Kang, Lei (CR28) 2010; 41
Bowden, Gardiner, Wood (CR68) 2001; 11
Zhu, Ke, Espinosa (CR20) 2007; 47
Shi, Fu, Quan (CR12) 2009; 20
Briggs, Ramdas (CR42) 1976; 13
Dieing, Hollricher, Toporski (CR26) 2010
Wermelinger, Borgia, Solenthaler (CR71) 2007; 55
Shang, Xie, Liu (CR16) 2004; 41
Gilkes, Sands, Batchelder (CR51) 1997; 70
Ganesan, Maradudin, Oitmaa (CR38) 1970; 56
Lourie, Wagner (CR79) 1998; 13
Starman, Coutu (CR1) 2012; 52
Sawano, Usami, Arimoto (CR59) 2005; 8
Sharpe, Yuan, Edwards (CR9) 1997; 6
Xu, Huang, Dong (CR24) 2009; 33
Anastassakis, Pinczuk, Burstein (CR33) 1970; 8
Anastassakis, Liarokapis (CR39) 1987; 62
Gong, Kinloch, Young (CR91) 2010; 22
Srikar, Swan, Unlu (CR67) 2003; 12
Qiu, Li, Lei (CR95) 2012; 53
Li, Xie, Kang (CR6) 2010; 23
Golovin (CR18) 2008; 50
Yang, Zhang, Jiang (CR19) 2008; 92
Ogura, Kosemura, Takei (CR57) 2009; 159–160
Talaat, Negm, Schaffer (CR41) 1998; 123–124
Wood, Zhao, Wagner (CR82) 2001; 32
Anastassakis (CR40) 1999; 86
Tripathy, Chua, Chen (CR44) 2002; 92
Duan, Son, Gao (CR76) 2007; 7
Qiu, Kang, Li (CR56) 2008; 92
Bassi, Beghi, Casari (CR78) 2003; 12
Xing, Kishimoto, Zhao (CR17) 2006; 22
Sheeja, Tay, Leong (CR50) 2002; 11
Fleck, Muller, Ashby (CR8) 1994; 42
Xu, Hu, Miao (CR25) 2010; 48
Ghosh, Subhash, Orlovskaya (CR35) 2008; 56
Ahmed, Durst, Rosiwal (CR46) 2009; 204
Haque, Espinosa, Lee (CR11) 2010; 35
Liu, Li, Gao (CR30) 2013; 77
Romano, Van de Walle, Ager (CR62) 2000; 87
Young, Gong, Kinloch (CR92) 2011; 5
De Wolf, Maes, Jones (CR31) 1996; 79
Qian, Yu, Zhao (CR70) 2005; 11
Waters, Guduru, Xu (CR81) 2006; 66
Kunz, Hessmann, Meidel (CR52) 2011; 314
Irmer, Brumme, Herms (CR63) 2008; 19
Li, Kang, Qiu (CR5) 2011; 22
Saito, Motohashi, Hayazawa (CR58) 2006; 88
ZK Lei (401_CR27) 2008; 39
JF Waters (401_CR81) 2006; 66
HX Shang (401_CR16) 2004; 41
K Nugent (401_CR47) 1998; 7
ZK Lei (401_CR54) 2005; 22
JL Starman (401_CR69) 2003; 104
V Srikar (401_CR67) 2003; 12
NA Fleck (401_CR8) 1994; 42
WL Deng (401_CR86) 2014; 54
N Piluso (401_CR66) 2012; 522
X Li (401_CR21) 2009; 153
W Kang (401_CR10) 2010; 19
AM Gigler (401_CR74) 2009; 17
X Zhang (401_CR88) 2012; 57
F Demangeot (401_CR34) 1996; 100
D Sheeja (401_CR50) 2002; 11
H Shi (401_CR12) 2009; 20
L Starman (401_CR1) 2012; 52
X Li (401_CR6) 2010; 23
401_CR89
I De Wolf (401_CR31) 1996; 79
AZ Hartman (401_CR80) 2004; 92
E Anastassakis (401_CR40) 1999; 86
T Xu (401_CR24) 2009; 33
M Hytch (401_CR22) 2008; 453
F Ahmed (401_CR46) 2009; 204
A Bernardi (401_CR64) 2006; 99
ZK Lei (401_CR29) 2013; 51
S Ganesan (401_CR38) 1970; 56
L Romano (401_CR62) 2000; 87
K Koziol (401_CR3) 2007; 318
JU Lee (401_CR93) 2012; 12
T Wermelinger (401_CR72) 2010; 64
A Anastassakis (401_CR43) 1998
YL Kang (401_CR53) 2005; 43
G Wu (401_CR77) 2005; 72
R Erasmus (401_CR73) 2011; 109
O Lourie (401_CR79) 1998; 13
XJ Duan (401_CR76) 2007; 7
M Bowden (401_CR68) 2001; 11
XD Li (401_CR14) 2006; 16
Y Saito (401_CR58) 2006; 88
K Novoselov (401_CR4) 2012; 490
BQ Shi (401_CR23) 2012; 7
W Qiu (401_CR28) 2010; 41
S Tripathy (401_CR44) 2002; 92
LQ Liu (401_CR84) 2013; 13
W Qiu (401_CR56) 2008; 92
G Irmer (401_CR63) 2008; 19
JZ Li (401_CR83) 2013; 13
R Briggs (401_CR42) 1976; 13
T Kunz (401_CR52) 2011; 314
H Talaat (401_CR41) 1998; 123–124
MA Haque (401_CR11) 2010; 35
E Anastassakis (401_CR33) 1970; 8
I De Wolf (401_CR32) 1999; 30
L Romano (401_CR61) 1999; 273
W Qiu (401_CR94) 2009; 26
K Gilkes (401_CR51) 1997; 70
W Ma (401_CR87) 2009; 9
Q Li (401_CR85) 2012; 549
Q Li (401_CR5) 2011; 22
YM Xing (401_CR17) 2006; 22
D Ghosh (401_CR35) 2008; 56
ZK Lei (401_CR55) 2004; 21
J Wood (401_CR82) 2001; 32
RJ Young (401_CR92) 2011; 5
ZH Duan (401_CR13) 2003; 20
K Sawano (401_CR59) 2005; 8
E Anastassakis (401_CR39) 1987; 62
Q Li (401_CR36) 2010; 48
A Ogura (401_CR57) 2009; 159–160
AL Bassi (401_CR78) 2003; 12
F Xu (401_CR25) 2010; 48
Y Golovin (401_CR18) 2008; 50
WN Sharpe (401_CR9) 1997; 6
J Goncalves (401_CR49) 2002; 11
Y Zhu (401_CR20) 2007; 47
S Cronin (401_CR75) 2005; 72
J Qian (401_CR70) 2005; 11
T Wermelinger (401_CR71) 2007; 55
I Srivastava (401_CR90) 2011; 98
V Srikar (401_CR7) 2003; 43
O Moutanabbir (401_CR60) 2010; 96
I De Wolf (401_CR65) 2001; 36
LQ Liu (401_CR30) 2013; 77
R Yang (401_CR19) 2008; 92
T Dieing (401_CR26) 2010
YS Zhou (401_CR37) 2005; 50
M Pandey (401_CR48) 2002; 333
HM Xie (401_CR15) 2003; 40
W Qiu (401_CR95) 2012; 53
IA Alhomoudi (401_CR45) 2009; 517
B Kämpfe (401_CR2) 2000; 288
L Gong (401_CR91) 2010; 22
References_xml – volume: 96
  start-page: 233105
  year: 2010
  ident: CR60
  article-title: UV-Raman imaging of the in-plane strain in single ultrathin strained silicon-on-insulator patterned structure
  publication-title: Appl Phys Lett
  doi: 10.1063/1.3449135
– volume: 72
  start-page: 115411
  year: 2005
  ident: CR77
  article-title: Raman modes of the deformed single-wall carbon nanotubes
  publication-title: Phys Rev B
  doi: 10.1103/PhysRevB.72.115411
– volume: 43
  start-page: 847
  year: 2005
  end-page: 855
  ident: CR53
  article-title: An application of Raman spectroscopy on the measurement of residual stress in porous silicon
  publication-title: Opt Laser Eng
  doi: 10.1016/j.optlaseng.2004.09.005
– volume: 104
  start-page: 107
  year: 2003
  end-page: 116
  ident: CR69
  article-title: Stress characterization of MEMS microbridges by micro-Raman spectroscopy
  publication-title: Sens Actuators A
  doi: 10.1016/S0924-4247(02)00432-6
– volume: 13
  start-page: 5518
  year: 1976
  end-page: 5529
  ident: CR42
  article-title: Piezospectroscopic study of the Raman spectrum of cadmium sulfide
  publication-title: Phys Rev B
  doi: 10.1103/PhysRevB.13.5518
– volume: 12
  start-page: 4444
  year: 2012
  end-page: 4448
  ident: CR93
  article-title: Estimation of Young’s modulus of graphene by Raman spectroscopy
  publication-title: Nano Lett
  doi: 10.1021/nl301073q
– volume: 23
  start-page: 498
  year: 2010
  end-page: 548
  ident: CR6
  article-title: A brief review and prospect of experimental solid mechanics in China
  publication-title: Acta Mech Solida Sin
  doi: 10.1016/S0894-9166(11)60003-7
– volume: 88
  start-page: 143109
  year: 2006
  ident: CR58
  article-title: Nanoscale characterization of strained silicon by tip-enhanced Raman spectroscope in reflection mode
  publication-title: Appl Phys Lett
  doi: 10.1063/1.2191949
– volume: 17
  start-page: 22351
  year: 2009
  end-page: 22357
  ident: CR74
  article-title: Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy
  publication-title: Opt Express
  doi: 10.1364/OE.17.022351
– volume: 453
  start-page: 1085
  year: 2008
  end-page: 1086
  ident: CR22
  article-title: Nanoscale holographic interferometry for strain measurements in electronic devices
  publication-title: Nature
  doi: 10.1038/nature07049
– volume: 79
  start-page: 7148
  year: 1996
  end-page: 7156
  ident: CR31
  article-title: Stress measurements in silicon devices through Raman spectroscopy: bridging the gap between theory and experiment
  publication-title: J Appl Phys
  doi: 10.1063/1.361485
– volume: 19
  start-page: 1322
  year: 2010
  end-page: 1330
  ident: CR10
  article-title: A novel method for in situ uniaxial tests at the micro/nanoscale-Part II: experiment
  publication-title: J Microelectromech Syst
  doi: 10.1109/JMEMS.2010.2076782
– volume: 288
  start-page: 119
  year: 2000
  end-page: 125
  ident: CR2
  article-title: Investigation of residual stresses in microsystems using X-ray diffraction
  publication-title: Mater Sci Eng A
  doi: 10.1016/S0921-5093(00)00869-8
– volume: 522
  start-page: 20
  year: 2012
  end-page: 22
  ident: CR66
  article-title: Stress fields analysis in 3C–SiC free-standing microstructures by micro-Raman spectroscopy
  publication-title: Thin Solid Films
  doi: 10.1016/j.tsf.2011.12.078
– volume: 22
  start-page: 595
  year: 2006
  end-page: 602
  ident: CR17
  article-title: An electron moiré method for a common SEM
  publication-title: Acta Mech Sin
  doi: 10.1007/s10409-006-0038-1
– volume: 314
  start-page: 53
  year: 2011
  end-page: 57
  ident: CR52
  article-title: Micro-Raman mapping on layers for crystalline silicon thin-film solar cells
  publication-title: J Cryst Growth
  doi: 10.1016/j.jcrysgro.2010.12.019
– volume: 8
  start-page: 133
  year: 1970
  end-page: 138
  ident: CR33
  article-title: Effect of static uniaxial stress on the Raman spectrum of silicon
  publication-title: Solid State Commun
  doi: 10.1016/0038-1098(70)90588-0
– volume: 86
  start-page: 249
  year: 1999
  end-page: 258
  ident: CR40
  article-title: Strain characterization of polycrystalline diamond and silicon systems
  publication-title: J Appl Phys
  doi: 10.1063/1.370723
– volume: 70
  start-page: 1980
  year: 1997
  end-page: 1982
  ident: CR51
  article-title: Direct observation of sp3 bonding in tetrahedral amorphous carbon using ultraviolet Raman spectroscopy
  publication-title: Appl Phys Lett
  doi: 10.1063/1.118798
– volume: 55
  start-page: 4657
  year: 2007
  end-page: 4665
  ident: CR71
  article-title: 3-D Raman spectroscopy measurements of the symmetry of residual stress fields in plastically deformed sapphire crystals
  publication-title: Acta Mater
  doi: 10.1016/j.actamat.2007.04.036
– volume: 12
  start-page: 806
  year: 2003
  end-page: 810
  ident: CR78
  article-title: Inelastic light scattering from magnetically aligned single-walled carbon nanotubes and estimate of their two-dimensional Young’s modulus
  publication-title: Diam Relat Mater
  doi: 10.1016/S0925-9635(02)00227-3
– volume: 318
  start-page: 1892
  year: 2007
  end-page: 1895
  ident: CR3
  article-title: High-performance carbon nanotube fiber
  publication-title: Science
  doi: 10.1126/science.1147635
– volume: 7
  start-page: 215
  year: 1998
  end-page: 221
  ident: CR47
  article-title: Confocal Raman strain mapping of isolated single CVD diamond crystals
  publication-title: Diam Relat Mater
  doi: 10.1016/S0925-9635(97)00212-4
– volume: 50
  start-page: 2205
  year: 2008
  end-page: 2236
  ident: CR18
  article-title: Nanoindentation and mechanical properties of solids in submicrovolumes, thin near-surface layers, and films: a review
  publication-title: Phys Solid State
  doi: 10.1134/S1063783408120019
– year: 2010
  ident: CR26
  publication-title: Confocal Raman microscopy
– volume: 30
  start-page: 877
  year: 1999
  end-page: 883
  ident: CR32
  article-title: Stress measurements in Si microelectronics devices using Raman spectroscopy
  publication-title: J Raman Spectrosc
  doi: 10.1002/(SICI)1097-4555(199910)30:10<877::AID-JRS464>3.0.CO;2-5
– volume: 57
  start-page: 3045
  year: 2012
  end-page: 3050
  ident: CR88
  article-title: Electrochemical reduction of graphene oxide films: preparation, characterization and their electrochemical properties
  publication-title: Chin Sci Bull
  doi: 10.1007/s11434-012-5256-2
– volume: 51
  start-page: 358
  year: 2013
  end-page: 363
  ident: CR29
  article-title: Micromechanics of fiber-crack interaction studied by micro-Raman spectroscopy: bridging fiber
  publication-title: Opt Laser Eng
  doi: 10.1016/j.optlaseng.2012.12.003
– volume: 39
  start-page: 113
  year: 2008
  end-page: 118
  ident: CR27
  article-title: Stress transfer of single fiber/microdroplet tensile test studied by micro-Raman spectroscopy
  publication-title: Compos Part A
  doi: 10.1016/j.compositesa.2007.08.018
– volume: 43
  start-page: 238
  year: 2003
  end-page: 247
  ident: CR7
  article-title: A critical review of microscale mechanical testing methods used in the design of microelectromechanical systems
  publication-title: Exp Mech
  doi: 10.1007/BF02410522
– volume: 35
  start-page: 375
  year: 2010
  end-page: 381
  ident: CR11
  article-title: MEMS for in situ testing-handling, actuation, loading, and displacement measurements
  publication-title: MRS Bull
  doi: 10.1557/mrs2010.570
– volume: 92
  start-page: 236804
  year: 2004
  ident: CR80
  article-title: Theoretical and experimental studies of carbon nanotube electromechanical coupling
  publication-title: Phys Rev Lett
  doi: 10.1103/PhysRevLett.92.236804
– volume: 22
  start-page: 2694
  year: 2010
  end-page: 2697
  ident: CR91
  article-title: Interfacial stress transfer in a graphene monolayer nanocomposite
  publication-title: Adv Mater
  doi: 10.1002/adma.200904264
– volume: 11
  start-page: 1643
  year: 2002
  end-page: 1647
  ident: CR50
  article-title: Effect of film thickness on the stress and adhesion of diamond-like carbon coatings
  publication-title: Diam Relat Mater
  doi: 10.1016/S0925-9635(02)00109-7
– volume: 36
  start-page: 213
  year: 2001
  end-page: 223
  ident: CR65
  article-title: The investigation of microsystems using Raman spectroscopy
  publication-title: Opt Laser Eng
  doi: 10.1016/S0143-8166(01)00033-1
– volume: 72
  start-page: 035425
  year: 2005
  ident: CR75
  article-title: Resonant Raman spectroscopy of individual metallic and semiconducting single-wall carbon nanotubes under uniaxial strain
  publication-title: Phys Rev B
  doi: 10.1103/PhysRevB.72.035425
– volume: 41
  start-page: 1216
  year: 2010
  end-page: 1220
  ident: CR28
  article-title: Experimental study of the Raman strain rosette based on the carbon nanotube strain sensor
  publication-title: J Raman Spectrosc
  doi: 10.1002/jrs.2584
– volume: 123–124
  start-page: 742
  year: 1998
  end-page: 745
  ident: CR41
  article-title: Raman microprobe analysis of strained polysilicon deposited layers
  publication-title: Appl Surf Sci
  doi: 10.1016/S0169-4332(97)00550-3
– volume: 32
  start-page: 391
  year: 2001
  end-page: 399
  ident: CR82
  article-title: Orientation of carbon nanotubes in polymers and its detection by Raman spectroscopy
  publication-title: Compos Part A
  doi: 10.1016/S1359-835X(00)00105-6
– volume: 16
  start-page: 1897
  year: 2006
  end-page: 1907
  ident: CR14
  article-title: An optical probe stage and its applications in mechanical behavior measurements of micro-objects and thin films
  publication-title: J Micromech Microeng
  doi: 10.1088/0960-1317/16/9/020
– volume: 40
  start-page: 163
  year: 2003
  end-page: 177
  ident: CR15
  article-title: Focused ion beam Moiré method
  publication-title: Opt Laser Eng
  doi: 10.1016/S0143-8166(02)00099-4
– volume: 9
  start-page: 2855
  year: 2009
  end-page: 2861
  ident: CR87
  article-title: High-strength composite fibers: realizing true potential of carbon nanotubes in polymer matrix through continuous reticulate architecture and molecular level couplings
  publication-title: Nano Lett
  doi: 10.1021/nl901035v
– volume: 13
  start-page: 1145
  year: 2013
  end-page: 1148
  ident: CR83
  article-title: In-situ Raman spectra of single-walled carbon nanotube/epoxy nanocomposite film under strain
  publication-title: J Nanosci Nanotechnol
  doi: 10.1166/jnn.2013.6028
– year: 1998
  ident: CR43
  publication-title: High pressure in semiconductor physics II
– volume: 11
  start-page: 7
  year: 2001
  end-page: 12
  ident: CR68
  article-title: Raman and finite-element analysis of a mechanically strained silicon microstructure
  publication-title: J Micromech Microeng
  doi: 10.1088/0960-1317/11/1/302
– volume: 549
  start-page: 118
  year: 2012
  end-page: 122
  ident: CR85
  article-title: Multi-scale study of the strength and toughness of carbon nanotube fiber materials
  publication-title: Mater Sci Eng A
  doi: 10.1016/j.msea.2012.04.015
– volume: 6
  start-page: 193
  year: 1997
  end-page: 199
  ident: CR9
  article-title: A new technique for measuring the mechanical properties of thin films
  publication-title: J Microelectromech Syst
  doi: 10.1109/84.623107
– volume: 22
  start-page: 984
  year: 2005
  end-page: 986
  ident: CR54
  article-title: Residual stress on surface and cross-section of porous silicon studied by micro-Raman spectroscopy
  publication-title: Chin Phys Lett
  doi: 10.1088/0256-307X/22/4/057
– ident: CR89
– volume: 22
  start-page: 225704
  year: 2011
  ident: CR5
  article-title: Deformation mechanisms of carbon nanotube fibres under tensile loading by in situ Raman spectroscopy analysis
  publication-title: Nanotechnology
  doi: 10.1088/0957-4484/22/22/225704
– volume: 99
  start-page: 063512
  year: 2006
  ident: CR64
  article-title: Probing residual strain in InGaAs/GaAs micro-origami tubes by micro-Raman spectroscopy
  publication-title: J Appl Phys
  doi: 10.1063/1.2183353
– volume: 66
  start-page: 1141
  year: 2006
  end-page: 1150
  ident: CR81
  article-title: Nanotube mechanics—recent progress in shell buckling mechanics and quantum electromechanical coupling
  publication-title: Compos Sci Technol
  doi: 10.1016/j.compscitech.2005.10.018
– volume: 26
  start-page: 080701
  year: 2009
  ident: CR94
  article-title: A new theoretical model of a carbon nanotube strain sensor
  publication-title: Chin Phys Lett
  doi: 10.1088/0256-307X/26/8/080701
– volume: 333
  start-page: 260
  year: 2002
  end-page: 265
  ident: CR48
  article-title: Defects in CVD diamond: Raman and XRD studies
  publication-title: J Alloys Compd
  doi: 10.1016/S0925-8388(01)01740-6
– volume: 19
  start-page: 51
  year: 2008
  end-page: 57
  ident: CR63
  article-title: Anisotropic strain on phonons in a-plane GaN layers studied by Raman scattering
  publication-title: J Mater Sci
– volume: 8
  start-page: 177
  year: 2005
  end-page: 180
  ident: CR59
  article-title: Observation of strain field fluctuation in SiGe-relaxed buffer layers and its influence on overgrown structures
  publication-title: Mater Sci Semicond Proc
  doi: 10.1016/j.mssp.2004.09.100
– volume: 42
  start-page: 475
  year: 1994
  end-page: 484
  ident: CR8
  article-title: Strain gradient plasticity: theory and experiment
  publication-title: Acta Mater
  doi: 10.1016/0956-7151(94)90502-9
– volume: 47
  start-page: 7
  year: 2007
  end-page: 24
  ident: CR20
  article-title: Experimental techniques for the mechanical characterization of one-dimensional nanostructures
  publication-title: Exp Mech
  doi: 10.1007/s11340-006-0406-6
– volume: 56
  start-page: 556
  year: 1970
  end-page: 594
  ident: CR38
  article-title: A lattice theory of morphic effects in crystals of the diamond structure
  publication-title: Ann Phys
  doi: 10.1016/0003-4916(70)90029-1
– volume: 87
  start-page: 7745
  year: 2000
  end-page: 7752
  ident: CR62
  article-title: Effect of Si doping on strain, cracking, and microstructure in GaN thin films grown by metalorganic chemical vapor deposition
  publication-title: J Appl Phys
  doi: 10.1063/1.373529
– volume: 54
  start-page: 3
  year: 2014
  end-page: 10
  ident: CR86
  article-title: Multi-scale experiments and interfacial mechanical modeling of carbon nanotube fiber
  publication-title: Exp Mech
  doi: 10.1007/s11340-012-9706-1
– volume: 92
  start-page: 231906
  year: 2008
  ident: CR19
  article-title: Experimental verification and theoretical analysis of the relationships between hardness, elastic modulus, and the work of indentation
  publication-title: Appl Phys Lett
  doi: 10.1063/1.2944138
– volume: 11
  start-page: 1578
  year: 2002
  end-page: 1583
  ident: CR49
  article-title: Characterization of boron doped CVD diamond films by Raman spectroscopy and X-ray diffractometry
  publication-title: Diam Relat Mater
  doi: 10.1016/S0925-9635(02)00103-6
– volume: 490
  start-page: 192
  year: 2012
  end-page: 200
  ident: CR4
  article-title: A roadmap for graphene
  publication-title: Nature
  doi: 10.1038/nature11458
– volume: 56
  start-page: 5345
  year: 2008
  end-page: 5354
  ident: CR35
  article-title: Measurement of scratch-induced residual stress within SiC grains in ZrB2–SiC composite using micro-Raman spectroscopy
  publication-title: Acta Mater
  doi: 10.1016/j.actamat.2008.07.031
– volume: 41
  start-page: 755
  year: 2004
  end-page: 765
  ident: CR16
  article-title: Phase shifting nano-moiré method with scanning tunneling microscope
  publication-title: Opt Laser Eng
  doi: 10.1016/S0143-8166(03)00030-7
– volume: 92
  start-page: 041906
  year: 2008
  ident: CR56
  article-title: Experimental analysis for the effect of dynamic capillarity on stress transformation in porous silicon
  publication-title: Appl Phys Lett
  doi: 10.1063/1.2838716
– volume: 13
  start-page: 1574
  year: 2013
  end-page: 1577
  ident: CR84
  article-title: Influence of carbon nanotubes microstructures inside composites on the loading role of nanotubes bore
  publication-title: J Nanosci Nanotechnol
  doi: 10.1166/jnn.2013.6036
– volume: 98
  start-page: 063102
  year: 2011
  ident: CR90
  article-title: Raman study of interfacial load transfer in graphene nanocomposites
  publication-title: Appl Phys Lett
  doi: 10.1063/1.3552685
– volume: 48
  start-page: 1082
  year: 2010
  end-page: 1088
  ident: CR25
  article-title: In situ investigation of ceramic sintering by synchrotron radiation X-ray computed tomography
  publication-title: Opt Laser Eng
  doi: 10.1016/j.optlaseng.2009.12.012
– volume: 52
  start-page: 1341
  year: 2012
  end-page: 1353
  ident: CR1
  article-title: Stress monitoring of post-processed MEMS silicon microbridge structures using Raman spectroscopy
  publication-title: Exp Mech
  doi: 10.1007/s11340-011-9586-9
– volume: 77
  start-page: 101
  year: 2013
  end-page: 109
  ident: CR30
  article-title: Single carbon fiber fracture embedded in an epoxy matrix modified by nanoparticles
  publication-title: Compos Sci Technol
  doi: 10.1016/j.compscitech.2012.12.015
– volume: 7
  start-page: 2116
  year: 2007
  end-page: 2121
  ident: CR76
  article-title: Resonant Raman spectroscopy of individual strained single-wall carbon nanotubes
  publication-title: Nano Lett
  doi: 10.1021/nl0711155
– volume: 62
  start-page: 3346
  year: 1987
  end-page: 3352
  ident: CR39
  article-title: Polycrystalline Si under strain: elastic and latticedynamical considerations
  publication-title: J Appl Phys
  doi: 10.1063/1.339296
– volume: 159–160
  start-page: 206
  year: 2009
  end-page: 211
  ident: CR57
  article-title: Evaluation of local strain in Si using UV-Raman spectroscopy
  publication-title: Mater Sci Eng B
  doi: 10.1016/j.mseb.2008.10.059
– volume: 12
  start-page: 779
  year: 2003
  end-page: 787
  ident: CR67
  article-title: Micro-Raman measurement of bending stresses in micromachined silicon flexures
  publication-title: J Microelectromech Syst
  doi: 10.1109/JMEMS.2003.820280
– volume: 33
  start-page: 1028
  year: 2009
  end-page: 1032
  ident: CR24
  article-title: In situ X-ray diffraction investigation of compression behavior in Gd40Y16Al24Co20 bulk metallic glass under high pressure with synchrotron radiation
  publication-title: Chin Phys C
  doi: 10.1088/1674-1137/33/12/060
– volume: 153
  start-page: 13
  year: 2009
  end-page: 23
  ident: CR21
  article-title: A novel technique of microforce sensing and loading
  publication-title: Sens Actuators A
  doi: 10.1016/j.sna.2009.04.012
– volume: 273
  start-page: 50
  year: 1999
  end-page: 53
  ident: CR61
  article-title: Effect of Si doping on the strain and defect structure of GaN thin films
  publication-title: Physica B
  doi: 10.1016/S0921-4526(99)00404-4
– volume: 13
  start-page: 2418
  year: 1998
  end-page: 2422
  ident: CR79
  article-title: Evaluation of Young’s modulus of carbon nanotubes by micro-Raman spectroscopy
  publication-title: J Mater Res
  doi: 10.1557/JMR.1998.0336
– volume: 100
  start-page: 207
  year: 1996
  end-page: 210
  ident: CR34
  article-title: Raman determination of phonon deformation potentials in α-GaN
  publication-title: Solid State Commun
  doi: 10.1016/0038-1098(96)00410-3
– volume: 20
  start-page: 065301
  year: 2009
  ident: CR12
  article-title: Vibration measurement of a micro-structure by digital holographic microscopy
  publication-title: Meas Sci Technol
  doi: 10.1088/0957-0233/20/6/065301
– volume: 21
  start-page: 1377
  year: 2004
  end-page: 1380
  ident: CR55
  article-title: Experimental study of capillary effect in porous silicon using micro-raman spectroscopy and X-ray diffraction
  publication-title: Chin Phys Lett
  doi: 10.1088/0256-307X/21/7/054
– volume: 64
  start-page: 28
  year: 2010
  end-page: 30
  ident: CR72
  article-title: Correlation between the defect structure and the residual stress distribution in ZnO visualized by TEM and Raman microscopy
  publication-title: Mater Lett
  doi: 10.1016/j.matlet.2009.09.061
– volume: 50
  start-page: 446
  year: 2005
  end-page: 451
  ident: CR37
  article-title: An experiment study of quartz-coesite transition at differential stress
  publication-title: Chin Sci Bull
  doi: 10.1007/BF02897461
– volume: 48
  start-page: 1119
  year: 2010
  end-page: 1125
  ident: CR36
  article-title: Micro-Raman spectroscopy stress measurement method for porous silicon film
  publication-title: Opt Laser Eng
  doi: 10.1016/j.optlaseng.2009.12.020
– volume: 109
  start-page: 013527
  year: 2011
  ident: CR73
  article-title: Three-dimensional mapping of stresses in plastically deformed diamond using micro-Raman and photoluminescence spectroscopy
  publication-title: J Appl Phys
  doi: 10.1063/1.3531548
– volume: 7
  start-page: 676
  year: 2012
  end-page: 678
  ident: CR23
  article-title: In situ observation of structural rearrangement of a Cu nanotwin particle
  publication-title: Micro Nano Lett
  doi: 10.1049/mnl.2012.0295
– volume: 20
  start-page: 2130
  year: 2003
  end-page: 2132
  ident: CR13
  article-title: Uncooled optically readable bimaterial micro-cantilever infrared imaging device
  publication-title: Chin Phys Lett
  doi: 10.1088/0256-307X/20/12/012
– volume: 92
  start-page: 3503
  year: 2002
  end-page: 3510
  ident: CR44
  article-title: Micro-Raman investigation of strain in GaN and AI Ga N/GaN heterostructures grown on Si(111)
  publication-title: J Appl Phys
  doi: 10.1063/1.1502921
– volume: 53
  start-page: 161
  year: 2012
  end-page: 168
  ident: CR95
  article-title: The use of a carbon nanotube sensor for measuring strain by micro-Raman spectroscopy
  publication-title: Carbon
  doi: 10.1016/j.carbon.2012.10.043
– volume: 517
  start-page: 4372
  year: 2009
  end-page: 4378
  ident: CR45
  article-title: Residual stresses and Raman shift relation in anatase TiO thin film
  publication-title: Thin Solid Films
  doi: 10.1016/j.tsf.2009.02.141
– volume: 204
  start-page: 1022
  year: 2009
  end-page: 1025
  ident: CR46
  article-title: In-situ tensile testing of crystalline diamond coatings using Raman spectroscopy
  publication-title: Surf Coat Technol
  doi: 10.1016/j.surfcoat.2009.04.030
– volume: 5
  start-page: 3079
  year: 2011
  end-page: 3084
  ident: CR92
  article-title: Strain mapping in a graphene monolayer nanocomposite
  publication-title: ACS Nano
  doi: 10.1021/nn2002079
– volume: 11
  start-page: 97
  year: 2005
  end-page: 103
  ident: CR70
  article-title: Two-dimensional stress measurement of a micromachined piezoresistive structure with micro-Raman spectroscopy
  publication-title: Microsyst Technol
– volume: 99
  start-page: 063512
  year: 2006
  ident: 401_CR64
  publication-title: J Appl Phys
  doi: 10.1063/1.2183353
– volume: 100
  start-page: 207
  year: 1996
  ident: 401_CR34
  publication-title: Solid State Commun
  doi: 10.1016/0038-1098(96)00410-3
– volume: 273
  start-page: 50
  year: 1999
  ident: 401_CR61
  publication-title: Physica B
  doi: 10.1016/S0921-4526(99)00404-4
– volume: 22
  start-page: 595
  year: 2006
  ident: 401_CR17
  publication-title: Acta Mech Sin
  doi: 10.1007/s10409-006-0038-1
– volume: 522
  start-page: 20
  year: 2012
  ident: 401_CR66
  publication-title: Thin Solid Films
  doi: 10.1016/j.tsf.2011.12.078
– volume: 6
  start-page: 193
  year: 1997
  ident: 401_CR9
  publication-title: J Microelectromech Syst
  doi: 10.1109/84.623107
– volume: 77
  start-page: 101
  year: 2013
  ident: 401_CR30
  publication-title: Compos Sci Technol
  doi: 10.1016/j.compscitech.2012.12.015
– volume: 123–124
  start-page: 742
  year: 1998
  ident: 401_CR41
  publication-title: Appl Surf Sci
  doi: 10.1016/S0169-4332(97)00550-3
– volume: 92
  start-page: 041906
  year: 2008
  ident: 401_CR56
  publication-title: Appl Phys Lett
  doi: 10.1063/1.2838716
– volume: 53
  start-page: 161
  year: 2012
  ident: 401_CR95
  publication-title: Carbon
  doi: 10.1016/j.carbon.2012.10.043
– volume: 48
  start-page: 1082
  year: 2010
  ident: 401_CR25
  publication-title: Opt Laser Eng
  doi: 10.1016/j.optlaseng.2009.12.012
– volume: 11
  start-page: 97
  year: 2005
  ident: 401_CR70
  publication-title: Microsyst Technol
  doi: 10.1007/s00542-004-0460-x
– volume: 57
  start-page: 3045
  year: 2012
  ident: 401_CR88
  publication-title: Chin Sci Bull
  doi: 10.1007/s11434-012-5256-2
– volume: 7
  start-page: 676
  year: 2012
  ident: 401_CR23
  publication-title: Micro Nano Lett
  doi: 10.1049/mnl.2012.0295
– volume: 7
  start-page: 2116
  year: 2007
  ident: 401_CR76
  publication-title: Nano Lett
  doi: 10.1021/nl0711155
– volume: 92
  start-page: 231906
  year: 2008
  ident: 401_CR19
  publication-title: Appl Phys Lett
  doi: 10.1063/1.2944138
– volume: 12
  start-page: 806
  year: 2003
  ident: 401_CR78
  publication-title: Diam Relat Mater
  doi: 10.1016/S0925-9635(02)00227-3
– volume: 35
  start-page: 375
  year: 2010
  ident: 401_CR11
  publication-title: MRS Bull
  doi: 10.1557/mrs2010.570
– volume: 42
  start-page: 475
  year: 1994
  ident: 401_CR8
  publication-title: Acta Mater
  doi: 10.1016/0956-7151(94)90502-9
– volume: 30
  start-page: 877
  year: 1999
  ident: 401_CR32
  publication-title: J Raman Spectrosc
  doi: 10.1002/(SICI)1097-4555(199910)30:10<877::AID-JRS464>3.0.CO;2-5
– volume: 48
  start-page: 1119
  year: 2010
  ident: 401_CR36
  publication-title: Opt Laser Eng
  doi: 10.1016/j.optlaseng.2009.12.020
– volume-title: High pressure in semiconductor physics II
  year: 1998
  ident: 401_CR43
– volume: 36
  start-page: 213
  year: 2001
  ident: 401_CR65
  publication-title: Opt Laser Eng
  doi: 10.1016/S0143-8166(01)00033-1
– volume: 159–160
  start-page: 206
  year: 2009
  ident: 401_CR57
  publication-title: Mater Sci Eng B
  doi: 10.1016/j.mseb.2008.10.059
– volume: 88
  start-page: 143109
  year: 2006
  ident: 401_CR58
  publication-title: Appl Phys Lett
  doi: 10.1063/1.2191949
– volume: 9
  start-page: 2855
  year: 2009
  ident: 401_CR87
  publication-title: Nano Lett
  doi: 10.1021/nl901035v
– volume: 11
  start-page: 1578
  year: 2002
  ident: 401_CR49
  publication-title: Diam Relat Mater
  doi: 10.1016/S0925-9635(02)00103-6
– volume: 86
  start-page: 249
  year: 1999
  ident: 401_CR40
  publication-title: J Appl Phys
  doi: 10.1063/1.370723
– volume: 22
  start-page: 984
  year: 2005
  ident: 401_CR54
  publication-title: Chin Phys Lett
  doi: 10.1088/0256-307X/22/4/057
– volume: 98
  start-page: 063102
  year: 2011
  ident: 401_CR90
  publication-title: Appl Phys Lett
  doi: 10.1063/1.3552685
– volume: 33
  start-page: 1028
  year: 2009
  ident: 401_CR24
  publication-title: Chin Phys C
  doi: 10.1088/1674-1137/33/11/020
– volume: 92
  start-page: 236804
  year: 2004
  ident: 401_CR80
  publication-title: Phys Rev Lett
  doi: 10.1103/PhysRevLett.92.236804
– volume: 8
  start-page: 177
  year: 2005
  ident: 401_CR59
  publication-title: Mater Sci Semicond Proc
  doi: 10.1016/j.mssp.2004.09.100
– volume: 549
  start-page: 118
  year: 2012
  ident: 401_CR85
  publication-title: Mater Sci Eng A
  doi: 10.1016/j.msea.2012.04.015
– volume: 50
  start-page: 2205
  year: 2008
  ident: 401_CR18
  publication-title: Phys Solid State
  doi: 10.1134/S1063783408120019
– volume: 333
  start-page: 260
  year: 2002
  ident: 401_CR48
  publication-title: J Alloys Compd
  doi: 10.1016/S0925-8388(01)01740-6
– volume: 153
  start-page: 13
  year: 2009
  ident: 401_CR21
  publication-title: Sens Actuators A
  doi: 10.1016/j.sna.2009.04.012
– volume: 19
  start-page: 51
  year: 2008
  ident: 401_CR63
  publication-title: J Mater Sci
– volume: 13
  start-page: 1145
  year: 2013
  ident: 401_CR83
  publication-title: J Nanosci Nanotechnol
  doi: 10.1166/jnn.2013.6028
– volume: 20
  start-page: 065301
  year: 2009
  ident: 401_CR12
  publication-title: Meas Sci Technol
  doi: 10.1088/0957-0233/20/6/065301
– volume: 52
  start-page: 1341
  year: 2012
  ident: 401_CR1
  publication-title: Exp Mech
  doi: 10.1007/s11340-011-9586-9
– volume: 55
  start-page: 4657
  year: 2007
  ident: 401_CR71
  publication-title: Acta Mater
  doi: 10.1016/j.actamat.2007.04.036
– volume: 96
  start-page: 233105
  year: 2010
  ident: 401_CR60
  publication-title: Appl Phys Lett
  doi: 10.1063/1.3449135
– volume: 22
  start-page: 225704
  year: 2011
  ident: 401_CR5
  publication-title: Nanotechnology
  doi: 10.1088/0957-4484/22/22/225704
– volume: 92
  start-page: 3503
  year: 2002
  ident: 401_CR44
  publication-title: J Appl Phys
  doi: 10.1063/1.1502921
– volume: 72
  start-page: 115411
  year: 2005
  ident: 401_CR77
  publication-title: Phys Rev B
  doi: 10.1103/PhysRevB.72.115411
– volume: 64
  start-page: 28
  year: 2010
  ident: 401_CR72
  publication-title: Mater Lett
  doi: 10.1016/j.matlet.2009.09.061
– volume: 50
  start-page: 446
  year: 2005
  ident: 401_CR37
  publication-title: Chin Sci Bull
  doi: 10.1007/BF02897461
– volume: 87
  start-page: 7745
  year: 2000
  ident: 401_CR62
  publication-title: J Appl Phys
  doi: 10.1063/1.373529
– volume: 288
  start-page: 119
  year: 2000
  ident: 401_CR2
  publication-title: Mater Sci Eng A
  doi: 10.1016/S0921-5093(00)00869-8
– volume: 56
  start-page: 5345
  year: 2008
  ident: 401_CR35
  publication-title: Acta Mater
  doi: 10.1016/j.actamat.2008.07.031
– volume: 17
  start-page: 22351
  year: 2009
  ident: 401_CR74
  publication-title: Opt Express
  doi: 10.1364/OE.17.022351
– volume: 40
  start-page: 163
  year: 2003
  ident: 401_CR15
  publication-title: Opt Laser Eng
  doi: 10.1016/S0143-8166(02)00099-4
– volume: 490
  start-page: 192
  year: 2012
  ident: 401_CR4
  publication-title: Nature
  doi: 10.1038/nature11458
– volume: 70
  start-page: 1980
  year: 1997
  ident: 401_CR51
  publication-title: Appl Phys Lett
  doi: 10.1063/1.118798
– volume: 41
  start-page: 755
  year: 2004
  ident: 401_CR16
  publication-title: Opt Laser Eng
  doi: 10.1016/S0143-8166(03)00030-7
– volume: 314
  start-page: 53
  year: 2011
  ident: 401_CR52
  publication-title: J Cryst Growth
  doi: 10.1016/j.jcrysgro.2010.12.019
– volume: 104
  start-page: 107
  year: 2003
  ident: 401_CR69
  publication-title: Sens Actuators A
  doi: 10.1016/S0924-4247(02)00432-6
– volume: 54
  start-page: 3
  year: 2014
  ident: 401_CR86
  publication-title: Exp Mech
  doi: 10.1007/s11340-012-9706-1
– volume: 21
  start-page: 1377
  year: 2004
  ident: 401_CR55
  publication-title: Chin Phys Lett
  doi: 10.1088/0256-307X/21/7/054
– volume: 56
  start-page: 556
  year: 1970
  ident: 401_CR38
  publication-title: Ann Phys
  doi: 10.1016/0003-4916(70)90029-1
– volume: 11
  start-page: 7
  year: 2001
  ident: 401_CR68
  publication-title: J Micromech Microeng
  doi: 10.1088/0960-1317/11/1/302
– volume: 318
  start-page: 1892
  year: 2007
  ident: 401_CR3
  publication-title: Science
  doi: 10.1126/science.1147635
– volume: 51
  start-page: 358
  year: 2013
  ident: 401_CR29
  publication-title: Opt Laser Eng
  doi: 10.1016/j.optlaseng.2012.12.003
– volume: 13
  start-page: 2418
  year: 1998
  ident: 401_CR79
  publication-title: J Mater Res
  doi: 10.1557/JMR.1998.0336
– volume: 43
  start-page: 238
  year: 2003
  ident: 401_CR7
  publication-title: Exp Mech
  doi: 10.1007/BF02410522
– volume: 5
  start-page: 3079
  year: 2011
  ident: 401_CR92
  publication-title: ACS Nano
  doi: 10.1021/nn2002079
– volume: 13
  start-page: 1574
  year: 2013
  ident: 401_CR84
  publication-title: J Nanosci Nanotechnol
  doi: 10.1166/jnn.2013.6036
– volume: 19
  start-page: 1322
  year: 2010
  ident: 401_CR10
  publication-title: J Microelectromech Syst
  doi: 10.1109/JMEMS.2010.2076782
– volume: 41
  start-page: 1216
  year: 2010
  ident: 401_CR28
  publication-title: J Raman Spectrosc
  doi: 10.1002/jrs.2584
– volume: 23
  start-page: 498
  year: 2010
  ident: 401_CR6
  publication-title: Acta Mech Solida Sin
  doi: 10.1016/S0894-9166(11)60003-7
– volume: 11
  start-page: 1643
  year: 2002
  ident: 401_CR50
  publication-title: Diam Relat Mater
  doi: 10.1016/S0925-9635(02)00109-7
– volume: 26
  start-page: 080701
  year: 2009
  ident: 401_CR94
  publication-title: Chin Phys Lett
  doi: 10.1088/0256-307X/26/8/080701
– volume: 22
  start-page: 2694
  year: 2010
  ident: 401_CR91
  publication-title: Adv Mater
  doi: 10.1002/adma.200904264
– volume: 12
  start-page: 4444
  year: 2012
  ident: 401_CR93
  publication-title: Nano Lett
  doi: 10.1021/nl301073q
– volume: 62
  start-page: 3346
  year: 1987
  ident: 401_CR39
  publication-title: J Appl Phys
  doi: 10.1063/1.339296
– volume: 13
  start-page: 5518
  year: 1976
  ident: 401_CR42
  publication-title: Phys Rev B
  doi: 10.1103/PhysRevB.13.5518
– volume: 20
  start-page: 2130
  year: 2003
  ident: 401_CR13
  publication-title: Chin Phys Lett
  doi: 10.1088/0256-307X/20/12/012
– volume: 204
  start-page: 1022
  year: 2009
  ident: 401_CR46
  publication-title: Surf Coat Technol
  doi: 10.1016/j.surfcoat.2009.04.030
– volume: 12
  start-page: 779
  year: 2003
  ident: 401_CR67
  publication-title: J Microelectromech Syst
  doi: 10.1109/JMEMS.2003.820280
– volume: 16
  start-page: 1897
  year: 2006
  ident: 401_CR14
  publication-title: J Micromech Microeng
  doi: 10.1088/0960-1317/16/9/020
– volume: 66
  start-page: 1141
  year: 2006
  ident: 401_CR81
  publication-title: Compos Sci Technol
  doi: 10.1016/j.compscitech.2005.10.018
– volume: 517
  start-page: 4372
  year: 2009
  ident: 401_CR45
  publication-title: Thin Solid Films
  doi: 10.1016/j.tsf.2009.02.141
– volume-title: Confocal Raman microscopy
  year: 2010
  ident: 401_CR26
– volume: 8
  start-page: 133
  year: 1970
  ident: 401_CR33
  publication-title: Solid State Commun
  doi: 10.1016/0038-1098(70)90588-0
– volume: 109
  start-page: 013527
  year: 2011
  ident: 401_CR73
  publication-title: J Appl Phys
  doi: 10.1063/1.3531548
– ident: 401_CR89
– volume: 32
  start-page: 391
  year: 2001
  ident: 401_CR82
  publication-title: Compos Part A
  doi: 10.1016/S1359-835X(00)00105-6
– volume: 39
  start-page: 113
  year: 2008
  ident: 401_CR27
  publication-title: Compos Part A
  doi: 10.1016/j.compositesa.2007.08.018
– volume: 43
  start-page: 847
  year: 2005
  ident: 401_CR53
  publication-title: Opt Laser Eng
  doi: 10.1016/j.optlaseng.2004.09.005
– volume: 72
  start-page: 035425
  year: 2005
  ident: 401_CR75
  publication-title: Phys Rev B
  doi: 10.1103/PhysRevB.72.035425
– volume: 453
  start-page: 1085
  year: 2008
  ident: 401_CR22
  publication-title: Nature
  doi: 10.1038/nature07049
– volume: 47
  start-page: 7
  year: 2007
  ident: 401_CR20
  publication-title: Exp Mech
  doi: 10.1007/s11340-006-0406-6
– volume: 79
  start-page: 7148
  year: 1996
  ident: 401_CR31
  publication-title: J Appl Phys
  doi: 10.1063/1.361485
– volume: 7
  start-page: 215
  year: 1998
  ident: 401_CR47
  publication-title: Diam Relat Mater
  doi: 10.1016/S0925-9635(97)00212-4
SSID ssj0013172
Score 1.6816767
SecondaryResourceType review_article
Snippet With the rapid development of micro/nano manufacturing technology and nanomaterials, the accurate measurement of the mechanical properties and behaviors at the...
SourceID proquest
crossref
springer
fao
chongqing
SourceType Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 2811
SubjectTerms carbon nanotubes
Chemistry/Food Science
Deformation
Earth Sciences
Engineering
Graphene
Humanities and Social Sciences
Lattices
Life Sciences
Mechanical properties
Microstructure
multidisciplinary
Nanomaterials
Physics
Raman spectroscopy
Residual stress
Review
Science
Science (multidisciplinary)
动力学理论
展望
微型
拉曼光谱仪
残余应力测量
纳米制造技术
纳米材料
行为研究
Title Mechanical behavior study of microdevice and nanomaterials by Raman spectroscopy： a review
URI http://lib.cqvip.com/qk/86894X/201423/661683553.html
https://link.springer.com/article/10.1007/s11434-014-0401-8
https://www.proquest.com/docview/1559678672
https://www.proquest.com/docview/1663558766
https://www.proquest.com/docview/1709795192
Volume 59
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1NT9wwEB0Vqkr0gGALYgutjNQDLYqUxHHscEMVFBVRqYWVUC-W7TjLARzaLAf-PTP5YKFqV-oll0ycyM-eedbMvAB8EJansTGIgBQmyopYRJZ7FzmRSe8ywZ2jBuezb_nJJPt6KS77Pu5mqHYfUpKtp543u2Fop4oJKpzAM7BagpekJkZLOYu_zFMHiexSnGiT43YeUpl_G4IEFa7qMP2Fr3sWmJYqUz_jnH-kSdvoc7wGqz1tZIcdzuvwwocRvH4iJjiCV20xp2tGsN5v2Ibt9arSH9_AzzNPTb6ECRt681krLsvqit1QXV7pyW0wE0oWTKiRy3bLk9l79sPcmMDavkzSv6xv7w-YYV3jywZMjo8uPp9E_Y8VEIJYzSKpXJmqkjtRuUTZQiVJVdrEWyM9hmyLXsDLPE6tk1Z4TyrttjKijCvjhE8qvgnLoQ5-C5gzmcisRF5hfZbi2cqVhbGcE_HLFfdj2H6cYX3bCWho5AR4Twg-hniYc-16TXL6Nca1nqspE2QaIdMEmVZj-PT4yDDeAuMtBFKbKTpMPTlP6ThJajnIycawO6CrcUdRmsQEX981mhK1GMJzmS6waYkaRpJ8gY2MC4kEtsBx9oflo3sX0fz7o9_-l_U2rKTtgqaaxB1Ynv2-8--QJ83s-3Zf4PX0u8LrJD18AC61B9I
linkProvider Springer Nature
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwtV1Lb9QwEB61RQh6QHSh6rY8jAQSD0VKYjtOkDggoGxptwfoShUX13accmiTlmyF9vfwR5nJo0sRrMSh5ziO4xnPfKOZ-QzwVFoeh8agBJQ0gchCGVjuXeCkUN4JyZ2jBufxfjKaiE-H8nAJfva9ME21e5-SbCz1vNkNXTtVTFDhBMbAaVdJuetnPzBOq9_svEehPovj7Q8H70ZBd5UAfjRMp4FKXR6nOXeycFFqszSKitxG3hrl0UlZ1HuvkjC2TlnpPfGS28LIPCyMkz4qOM67DDdEpBKK8ET4cZ6qiFSbUsU1JWg--tTp35ZMBA7fqvL4HH_viiNcLkx1BeP-kZZtvN32XbjTwVT2ttWrNVjy5QBWfyMvHMDNpnjU1QNY6wxEzZ53LNYv7sHXsaemYtIB1nMBsIbMllUFO6U6wNyTmWKmzFlpygqxc3scmJ2xz-bUlKzpAyW-zeps9poZ1jba3IfJtez-OqyUVek3gDkjpLAKcYz1IsZYzuWZsZwT0ExS7oewdbnD-qwl7NCIQfCZlHwIYb_n2nUc6HQVx4meszeTyDSKTJPIdDqEl5ev9PMtGLyBgtTmGA20nnyJKXwldh7EgEN40ktX4wmmtIwpfXVRa0oMI2RIVLxgTAMM0XMlC8aoMFMImDOc51WvProzSfW_F735X6Mfw63RwXhP7-3s727B7bhRbqqHfAAr0-8X_iFitKl91JwRBkfXfSh_AS7fROA
linkToPdf http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwtV1Lb9QwEB61RSA4ILqAupSHkUDioaiJE8cJEoeKsmoprRCwUsXF2I5TDtRZmq2q_VX9i53Jo0sRrMSh5ziW43l9o5n5AvBMmJiHWqMEpNBBkociMLGzgRWJdDYRsbU04Ly3n26Pkw8H4mAJzvpZmKbbvS9JtjMNxNLkpxuTotyYD75hmKfuCWqiwHw467oqd93sFHO2-u3OFgr4Oeej91_fbQfdbwXwAGE2DWRmC54VsRWljTKTZ1FUFiZyRkuHAcugDTiZhtxYaYRzxFFuSi2KsNRWuKiMcd9luJbQ8DEa0JhvzssWkWzLq3imFF1JX0b925GJzOFH5Q9_4adeCorLpa4u4d0_SrRN5BvdgdsdZGWbrY6twpLzA7j1G5HhAK43jaS2HsBq5yxq9qJjtH55F77tORowJn1gPS8Aa4htWVWyI-oJLBy5LKZ9wbz2FeLo1jSYmbHP-kh71syEEvdmNZm9YZq1Qzf3YHwlt38fVnzl3RowqxORGImYxriEY15ni1ybOCbQmWaxG8L6xQ2rSUveoRCP4DMh4iGE_Z0r2_Gh0285fqo5kzOJTKHIFIlMZUN4dfFKv9-CxWsoSKUP0Vmr8RdOqSwx9SAeHMLTXroKrZlKNNq76qRWVCRG-JBKvmBNAxIxiqUL1sgwlwiec9znda8-qnNP9b8P_eC_Vj-BG5-2Rurjzv7uOtzkjW5Ta-RDWJken7hHCNem5nFjIgy-X7VNngNQJklO
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Mechanical+behavior+study+of+microdevice+and+nanomaterials+by+Raman+spectroscopy%EF%BC%9A+a+review&rft.jtitle=%E4%B8%AD%E5%9B%BD%E7%A7%91%E5%AD%A6%E9%80%9A%E6%8A%A5%EF%BC%9A%E8%8B%B1%E6%96%87%E7%89%88&rft.au=Wei+Qiu+Yi-Lan+Kang&rft.date=2014-08-01&rft.issn=1001-6538&rft.eissn=1861-9541&rft.issue=23&rft.spage=2811&rft.epage=2824&rft_id=info:doi/10.1007%2Fs11434-014-0401-8&rft.externalDocID=661683553
thumbnail_s http://utb.summon.serialssolutions.com/2.0.0/image/custom?url=http%3A%2F%2Fimage.cqvip.com%2Fvip1000%2Fqk%2F86894X%2F86894X.jpg