Investigation of Electrical Stability and Sensitivity of Electric Double Layer Gated Field-Effect Transistors (FETs) for miRNA Detection - Kuo, Wen-Che; Sarangadharan, Indu; Pulikkathodi, Anil Kumar; Chen, Po-Hsuan; Wang, Shin-Li; Wu, Chang-Run; Wang, Yu-Lin (Sensors (Basel, Switzerland), 2019)
Keywords: electric double layer (EDL); field-effect transistors (FETs); miRNA; sensors; stability; electric double layer (EDL); miRNA; sensors; stability; field-effect transistors (FETs)