APA (7th ed.) Citation

Kuo, W., Sarangadharan, I., Pulikkathodi, A. K., Chen, P., Wang, S., Wu, C., & Wang, Y. (2019). Investigation of Electrical Stability and Sensitivity of Electric Double Layer Gated Field-Effect Transistors (FETs) for miRNA Detection. Sensors (Basel, Switzerland), 19(7), 1484. https://doi.org/10.3390/s19071484

Chicago Style (17th ed.) Citation

Kuo, Wen-Che, Indu Sarangadharan, Anil Kumar Pulikkathodi, Po-Hsuan Chen, Shin-Li Wang, Chang-Run Wu, and Yu-Lin Wang. "Investigation of Electrical Stability and Sensitivity of Electric Double Layer Gated Field-Effect Transistors (FETs) for MiRNA Detection." Sensors (Basel, Switzerland) 19, no. 7 (2019): 1484. https://doi.org/10.3390/s19071484.

MLA (9th ed.) Citation

Kuo, Wen-Che, et al. "Investigation of Electrical Stability and Sensitivity of Electric Double Layer Gated Field-Effect Transistors (FETs) for MiRNA Detection." Sensors (Basel, Switzerland), vol. 19, no. 7, 2019, p. 1484, https://doi.org/10.3390/s19071484.