Fractal Nature of Metallic and Insulating Domain Configurations in a VO2 Thin Film Revealed by Kelvin Probe Force Microscopy

We investigated the surface work function ( W S ) and its spatial distribution for epitaxial VO 2 /TiO 2 thin films using Kelvin probe force microscopy (KPFM). Nearly grain-boundary-free samples allowed observation of metallic and insulating domains with distinct W S values, throughout the metal–ins...

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Published inScientific reports Vol. 5; no. 1; p. 10417
Main Authors Sohn, Ahrum, Kanki, Teruo, Sakai, Kotaro, Tanaka, Hidekazu, Kim, Dong-Wook
Format Journal Article
LanguageEnglish
Published London Nature Publishing Group UK 18.05.2015
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Abstract We investigated the surface work function ( W S ) and its spatial distribution for epitaxial VO 2 /TiO 2 thin films using Kelvin probe force microscopy (KPFM). Nearly grain-boundary-free samples allowed observation of metallic and insulating domains with distinct W S values, throughout the metal–insulator transition. The metallic fraction, estimated from W S maps, describes the evolution of the resistance based on a two-dimensional percolation model. The KPFM measurements also revealed the fractal nature of the domain configuration.
AbstractList We investigated the surface work function ( W S ) and its spatial distribution for epitaxial VO 2 /TiO 2 thin films using Kelvin probe force microscopy (KPFM). Nearly grain-boundary-free samples allowed observation of metallic and insulating domains with distinct W S values, throughout the metal–insulator transition. The metallic fraction, estimated from W S maps, describes the evolution of the resistance based on a two-dimensional percolation model. The KPFM measurements also revealed the fractal nature of the domain configuration.
We investigated the surface work function (WS ) and its spatial distribution for epitaxial VO2 /TiO2 thin films using Kelvin probe force microscopy (KPFM). Nearly grain-boundary-free samples allowed observation of metallic and insulating domains with distinct WS values, throughout the metal-insulator transition. The metallic fraction, estimated from WS maps, describes the evolution of the resistance based on a two-dimensional percolation model. The KPFM measurements also revealed the fractal nature of the domain configuration.
Abstract We investigated the surface work function ( W S ) and its spatial distribution for epitaxial VO 2 /TiO 2 thin films using Kelvin probe force microscopy (KPFM). Nearly grain-boundary-free samples allowed observation of metallic and insulating domains with distinct W S values, throughout the metal–insulator transition. The metallic fraction, estimated from W S maps, describes the evolution of the resistance based on a two-dimensional percolation model. The KPFM measurements also revealed the fractal nature of the domain configuration.
ArticleNumber 10417
Author Sakai, Kotaro
Kim, Dong-Wook
Sohn, Ahrum
Kanki, Teruo
Tanaka, Hidekazu
Author_xml – sequence: 1
  givenname: Ahrum
  surname: Sohn
  fullname: Sohn, Ahrum
  organization: Department of Physics, Ewha Womans University
– sequence: 2
  givenname: Teruo
  surname: Kanki
  fullname: Kanki, Teruo
  organization: The Institute of Scientific and Industrial Research, Osaka University
– sequence: 3
  givenname: Kotaro
  surname: Sakai
  fullname: Sakai, Kotaro
  organization: The Institute of Scientific and Industrial Research, Osaka University
– sequence: 4
  givenname: Hidekazu
  surname: Tanaka
  fullname: Tanaka, Hidekazu
  organization: The Institute of Scientific and Industrial Research, Osaka University
– sequence: 5
  givenname: Dong-Wook
  surname: Kim
  fullname: Kim, Dong-Wook
  organization: Department of Physics, Ewha Womans University
BackLink https://www.ncbi.nlm.nih.gov/pubmed/25982229$$D View this record in MEDLINE/PubMed
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Snippet We investigated the surface work function ( W S ) and its spatial distribution for epitaxial VO 2 /TiO 2 thin films using Kelvin probe force microscopy (KPFM)....
We investigated the surface work function (WS) and its spatial distribution for epitaxial VO2/TiO2 thin films using Kelvin probe force microscopy (KPFM)....
Abstract We investigated the surface work function ( W S ) and its spatial distribution for epitaxial VO 2 /TiO 2 thin films using Kelvin probe force...
We investigated the surface work function (WS ) and its spatial distribution for epitaxial VO2 /TiO2 thin films using Kelvin probe force microscopy (KPFM)....
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SubjectTerms 639/766/119/544
639/925/357/995
Humanities and Social Sciences
Microscopy
multidisciplinary
Science
Spatial distribution
Thin films
Titanium dioxide
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Title Fractal Nature of Metallic and Insulating Domain Configurations in a VO2 Thin Film Revealed by Kelvin Probe Force Microscopy
URI https://link.springer.com/article/10.1038/srep10417
https://www.ncbi.nlm.nih.gov/pubmed/25982229
https://www.proquest.com/docview/1899474286
https://search.proquest.com/docview/1682207656
https://pubmed.ncbi.nlm.nih.gov/PMC4434847
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