OOPS! (OntOlogy Pitfall Scanner!): An On-line Tool for Ontology Evaluation

• Published in: International journal on semantic web and information systems Vol. 10; no. 2; pp. 7 - 34
• Main Authors: Poveda-Villalón, María, Gómez-Pérez, Asunción, Suárez-Figueroa, Mari Carmen
• Format: Journal Article
• Language: English
• Published: Hershey IGI Global 01.04.2014
• Subjects: Analysis; Catalogues; Classification; Empirical analysis; Errors; Evaluation; Information systems; Modelling; On-line systems; Ontologies; Ontology; Scanners; Semantics; Software; Statistics; User satisfaction; Spain

This paper presents two contributions to the field of Ontology Evaluation. First, a live catalogue of pitfalls that extends previous works on modeling errors with new pitfalls resulting from an empirical analysis of over 693 ontologies. Such a catalogue classifies pitfalls according to the Structura...