Mass loading induced dephasing in nanomechanical resonators

• Published in: Journal of physics. Condensed matter Vol. 24; no. 47; pp. 475301 - 7
• Main Author: Atalaya, Juan
• Format: Journal Article
• Language: English
• Published: Bristol IOP Publishing 28.11.2012; Institute of Physics
• Subjects: Attachment; Condensed matter; Exact sciences and technology; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; Mathematical models; Mechanical instruments, equipment and techniques; mechanical resonators; Micromechanical devices and systems; Nanostructure; Noise; Particles (of physics); Physics; resolution; Resonators; sensor; Spectra; Phase shift; Eigenmode; Line widths; Nanoelectromechanical device; Numerical method; Background noise; Spectral line shift; Vibrational modes; Analytical method; Bending; Mass measurement; Diffusion coefficient; Cumulant; Nanomechanical resonator

This paper presents a study of dephasing of an underdamped nanomechanical resonator subject to random mass loading of small particles. A frequency noise model is presented which describes dephasing due to the attachment and detachment of particles at random points and particle diffusion along the re...