Nanobeams and AFM Subject to Piezoelectric and Surface Scale Effects - Carvalho, Joao; Tonetto, Leticia; Copetti, Rosemaira; Claeyssen, Julio (Advances in Mathematical Physics, 2018)
Keywords: Analysis; Atomic force microscopes; Atomic force microscopy; Boundary conditions; Carbon nanotubes; Computer simulation; Differential equations; Eigenvalues; Elastic beams; Formability; Mathematical problems; Microscopy; Modelling; Nanotechnology; Nanotubes; Physical properties; Physics; Piezoelectricity; Sensors; Shear deformation; Signal processing; Smart materials; Stress analysis; Vibration; United States