Three-dimensional textures and defects of soft material layering revealed by thermal sublimation

Layering is found and exploited in a variety of soft material systems, ranging from complex macromolecular self-assemblies to block copolymer and small-molecule liquid crystals. Because the control of layer structure is required for applications and characterization, and because defects reveal key f...

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Published inProceedings of the National Academy of Sciences - PNAS Vol. 110; no. 48; pp. 19263 - 19267
Main Authors Ki Yoon, Dong, Kim, Yun Ho, Kim, Dae Seok, Dae Oha, Seong, Smalyukh, Ivan I., Clark, Noel A., Jung, Hee-Tae
Format Journal Article
LanguageEnglish
Published United States National Academy of Sciences 26.11.2013
NATIONAL ACADEMY OF SCIENCES
National Acad Sciences
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Summary:Layering is found and exploited in a variety of soft material systems, ranging from complex macromolecular self-assemblies to block copolymer and small-molecule liquid crystals. Because the control of layer structure is required for applications and characterization, and because defects reveal key features of the symmetries of layered phases, a variety of techniques have been developed for the study of soft-layer structure and defects, including X-ray diffraction and visualization using optical transmission and fluorescence confocal polarizing microscopy, atomic force microscopy, and SEM and transmission electron microscopy, including freeze-fracture transmission electron microscopy. Here, it is shown that thermal sublimation can be usefully combined with such techniques to enable visualization of the 3D structure of soft materials. Sequential sublimation removes material in a stepwise fashion, leaving a remnant layer structure largely unchanged and viewable using SEM, as demonstrated here using a lamellar smectic liquid crystal.
Bibliography:http://dx.doi.org/10.1073/pnas.1317922110
Author contributions: D.K.Y. and H.-T.J. designed research; D.K.Y. and Y.H.K. performed research; D.K.Y., Y.H.K., D.S.K., S.D.O., I.I.S., and N.A.C. contributed new reagents/analytic tools; D.K.Y., Y.H.K., D.S.K., I.I.S., N.A.C., and H.-T.J. analyzed data; and D.K.Y., Y.H.K., I.I.S., N.A.C., and H.-T.J. wrote the paper.
Contributed by Noel A. Clark, October 15, 2013 (sent for review August 28, 2013)
1D.K.Y. and Y.H.K. contributed equally to this work.
ISSN:0027-8424
1091-6490
DOI:10.1073/pnas.1317922110