Recent Developments of Crystallographic Analysis Methods in the Scanning Electron Microscope for Applications in Metallurgy

• Published in: Critical reviews in solid state and materials sciences Vol. 43; no. 6; pp. 455 - 474
• Main Authors: Borrajo-Pelaez, Rafael, Hedström, Peter
• Format: Journal Article
• Language: English
• Published: Boca Raton Taylor & Francis 02.11.2018; Taylor & Francis Ltd
• Subjects: Angular resolution; Channeling; Crystal defects; Crystallography; Deformation; Diffraction; Dislocation density; EBSD; ECCI; Electron backscatter diffraction; Electron beams; Electron diffraction; Electron microscopy; Electron sources; Foils; Free surfaces; Industrial development; Instrumentation; Lattice strain; Metallography; Metallurgical analysis; Metallurgy; Metals; Optics; Organic chemistry; Rotation; Scanning electron microscopy; Scanning transmission electron microscopy; Spatial resolution; steels; TKD; Transmission electron microscopy

The field of metallurgy has greatly benefited from the development of electron microscopy over the last two decades. Scanning electron microscopy (SEM) has become a powerful tool for the investigation of nano- and microstructures. This article reviews the complete set of tools for crystallographic a...