A Review on Conduction Mechanisms in Dielectric Films
The conduction mechanisms in dielectric films are crucial to the successful applications of dielectric materials. There are two types of conduction mechanisms in dielectric films, that is, electrode-limited conduction mechanism and bulk-limited conduction mechanism. The electrode-limited conduction...
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| Published in | Advances in materials science and engineering Vol. 2014; no. 2014; pp. 1 - 18 |
|---|---|
| Main Author | |
| Format | Journal Article |
| Language | English |
| Published |
Cairo, Egypt
Hindawi Publishing Corporation
01.01.2014
John Wiley & Sons, Inc Wiley |
| Subjects | |
| Online Access | Get full text |
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| Abstract | The conduction mechanisms in dielectric films are crucial to the successful applications of dielectric materials. There are two types of conduction mechanisms in dielectric films, that is, electrode-limited conduction mechanism and bulk-limited conduction mechanism. The electrode-limited conduction mechanism depends on the electrical properties at the electrode-dielectric interface. Based on this type of conduction mechanism, the physical properties of the barrier height at the electrode-dielectric interface and the effective mass of the conduction carriers in dielectric films can be extracted. The bulk-limited conduction mechanism depends on the electrical properties of the dielectric itself. According to the analyses of bulk-limited conduction mechanisms, several important physical parameters in the dielectric films can be obtained, including the trap level, the trap spacing, the trap density, the carrier drift mobility, the dielectric relaxation time, and the density of states in the conduction band. In this paper, the analytical methods of conduction mechanisms in dielectric films are discussed in detail. |
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| AbstractList | The conduction mechanisms in dielectric films are crucial to the successful applications of dielectric materials. There are two types of conduction mechanisms in dielectric films, that is, electrode-limited conduction mechanism and bulk-limited conduction mechanism. The electrode-limited conduction mechanism depends on the electrical properties at the electrode-dielectric interface. Based on this type of conduction mechanism, the physical properties of the barrier height at the electrode-dielectric interface and the effective mass of the conduction carriers in dielectric films can be extracted. The bulk-limited conduction mechanism depends on the electrical properties of the dielectric itself. According to the analyses of bulk-limited conduction mechanisms, several important physical parameters in the dielectric films can be obtained, including the trap level, the trap spacing, the trap density, the carrier drift mobility, the dielectric relaxation time, and the density of states in the conduction band. In this paper, the analytical methods of conduction mechanisms in dielectric films are discussed in detail. |
| Author | Chiu, Fu-Chien |
| Author_xml | – sequence: 1 fullname: Chiu, Fu-Chien |
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| Cites_doi | 10.1063/1.2401657 10.1063/1.3103282 10.1063/1.1846131 10.1063/1.1541107 10.1109/T-ED.1978.19266 10.1063/1.2789697 10.1149/1.1393194 10.1002/adma.200900375 10.1109/JPROC.2010.2070830 10.1063/1.122827 10.1103/PhysRevLett.15.967 10.1016/S1369-7021(08)70119-6 10.1063/1.372290 10.1063/1.1896435 10.1109/16.930653 10.1063/1.114720 10.1063/1.2767380 10.1063/1.1506941 10.1063/1.1330764 10.1186/1556-276X-7-178 |
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| Copyright | Copyright © 2014 Fu-Chien Chiu. Copyright © 2014 Fu-Chien Chiu. Fu-Chien Chiu et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. |
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Electrical Conduction Mechanisms in Solids 1988 Berlin, Germany VEB Deutscher Verlag der Wissenschaften – volume: 97 issue: 10 year: 2005 end-page: 5 ident: 32 article-title: Electrical conduction mechanisms of metal La O Si structure – volume: 43 issue: 7 year: 2010 end-page: 5 ident: 11 article-title: Optical and electrical characterizations of cerium oxide thin films – reference: Kao K. C. 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| Title | A Review on Conduction Mechanisms in Dielectric Films |
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