Determination of the orientation in small areas of the exit wave

• Published in: Ultramicroscopy Vol. 87; no. 1-2; pp. 89 - 96
• Main Authors: Bokel, R.M.J, Jansen, J, Zandbergen, H.W
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 01.03.2001; Elsevier Science
• Subjects: Condensed matter: structure, mechanical and thermal properties; Electron diffraction and scattering; Electron holography; Electron microscope design and characterisation; Electron, positron and ion microscopes, electron diffractometers and related techniques; Exact sciences and technology; Exit-wave reconstruction; High-resolution transmission electron microscopy; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; Physics; Structure of solids and liquids; crystallography; Exit-wave reconstruction; 07.78.+s Subject index terms: 001, 004; 61.14.Nm; High-resolution transmission electron microscopy; Electron microscope design and characterisation; 61.16.Lj; Data analysis; Inorganic compounds; Nickel nitrides; Boron nitrides; Refinement; Electron microscopy; Mechanical vibrations; Layer thickness; High-resolution methods; Superconductors; Signal reconstruction; Lanthanum nitrides; Quaternary compounds; Debye-Waller factor; TEM

Local differences in thickness and misorientation in a through-focus reconstructed exit wave hamper direct interpretation. These local thicknesses and misorientations can be refined on an atomic scale using the intensities of the Fourier components with the refinement procedure in which a least-squa...