Ultrafast Imaging and the Phase Problem for Inelastic X-Ray Scattering

• Published in: Advanced materials (Weinheim) Vol. 22; no. 10; pp. 1141 - 1147
• Main Authors: Abbamonte, Peter, Wong, Gerard C. L., Cahill, David G., Reed, James P., Coridan, Robert H., Schmidt, Nathan W., Lai, Ghee Hwee, Joe, Young Il, Casa, Diego
• Format: Journal Article
• Language: English
• Published: Weinheim WILEY-VCH Verlag 12.03.2010; WILEY‐VCH Verlag
• Subjects: Algorithms; Condensed matter; Dynamics; Elasticity; Electron density; Electrons; Fourier Analysis; Fourier transformation; Imaging; Inelastic scattering; Inelastic X-Ray Scattering; Neutron scattering; Neutrons; Phase Problem; Scattering, Radiation; Ultrafast imaging; X-Rays

A new method for imaging ultrafast dynamics in condensed matter using inelastic X‐ray scattering (IXS) is described. Using the concepts of causality and irreversibility a general solution to the inverse scattering problem (or “phase problem”) for IXS is illustrated, which enables direct imaging of d...