Ultrafast Imaging and the Phase Problem for Inelastic X-Ray Scattering
A new method for imaging ultrafast dynamics in condensed matter using inelastic X‐ray scattering (IXS) is described. Using the concepts of causality and irreversibility a general solution to the inverse scattering problem (or “phase problem”) for IXS is illustrated, which enables direct imaging of d...
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| Published in | Advanced materials (Weinheim) Vol. 22; no. 10; pp. 1141 - 1147 |
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| Main Authors | , , , , , , , , |
| Format | Journal Article |
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Weinheim
WILEY-VCH Verlag
12.03.2010
WILEY‐VCH Verlag |
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| Abstract | A new method for imaging ultrafast dynamics in condensed matter using inelastic X‐ray scattering (IXS) is described. Using the concepts of causality and irreversibility a general solution to the inverse scattering problem (or “phase problem”) for IXS is illustrated, which enables direct imaging of dynamics of the electron density with resolutions of ∼1 attosecond (10−18 s) in time and <1 Å in space. This method is not just Fourier transformation of the IXS data, but a means to impose causality on the data and reconstruct the charge propagator. The method can also be applied to inelastic electron or neutron scattering. A general outline of phenomena that can and cannot be studied with this technique and an outlook for the future is provided.
A space–time image of valence excitation in a model insulator, LiF, is shown in the figure. The quantity shown is the “density Green's function”, which can be imagined as a ripple of density generated by an idealized point source (depicted as bright light in the image). The image was reconstructed from inelastic X‐ray scattering experiments and has an effective time resolution of 26 as (2.6 × 10−17 s). |
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| AbstractList | A new method for imaging ultrafast dynamics in condensed matter using inelastic X‐ray scattering (IXS) is described. Using the concepts of causality and irreversibility a general solution to the inverse scattering problem (or “phase problem”) for IXS is illustrated, which enables direct imaging of dynamics of the electron density with resolutions of ∼1 attosecond (10−18 s) in time and <1 Å in space. This method is not just Fourier transformation of the IXS data, but a means to impose causality on the data and reconstruct the charge propagator. The method can also be applied to inelastic electron or neutron scattering. A general outline of phenomena that can and cannot be studied with this technique and an outlook for the future is provided.
A space–time image of valence excitation in a model insulator, LiF, is shown in the figure. The quantity shown is the “density Green's function”, which can be imagined as a ripple of density generated by an idealized point source (depicted as bright light in the image). The image was reconstructed from inelastic X‐ray scattering experiments and has an effective time resolution of 26 as (2.6 × 10−17 s). A new method for imaging ultrafast dynamics in condensed matter using inelastic X-ray scattering (IXS) is described. Using the concepts of causality and irreversibility a general solution to the inverse scattering problem (or 'phase problem') for IXS is illustrated, which enables direct imaging of dynamics of the electron density with resolutions of [approx]1 attosecond (10 super(-18) s) in time and 1 Aa in space. This method is not just Fourier transformation of the IXS data, but a means to impose causality on the data and reconstruct the charge propagator. The method can also be applied to inelastic electron or neutron scattering. A general outline of phenomena that can and cannot be studied with this technique and an outlook for the future is provided. A new method for imaging ultrafast dynamics in condensed matter using inelastic X‐ray scattering (IXS) is described. Using the concepts of causality and irreversibility a general solution to the inverse scattering problem (or “phase problem”) for IXS is illustrated, which enables direct imaging of dynamics of the electron density with resolutions of ∼1 attosecond (10 −18 s) in time and <1 Å in space. This method is not just Fourier transformation of the IXS data, but a means to impose causality on the data and reconstruct the charge propagator. The method can also be applied to inelastic electron or neutron scattering. A general outline of phenomena that can and cannot be studied with this technique and an outlook for the future is provided. A new method for imaging ultrafast dynamics in condensed matter using inelastic X-ray scattering (IXS) is described. Using the concepts of causality and irreversibility a general solution to the inverse scattering problem (or "phase problem") for IXS is illustrated, which enables direct imaging of dynamics of the electron density with resolutions of approximately 1 attosecond (10(-18) s) in time and <1 A in space. This method is not just Fourier transformation of the IXS data, but a means to impose causality on the data and reconstruct the charge propagator. The method can also be applied to inelastic electron or neutron scattering. A general outline of phenomena that can and cannot be studied with this technique and an outlook for the future is provided. |
| Author | Joe, Young Il Casa, Diego Abbamonte, Peter Cahill, David G. Schmidt, Nathan W. Lai, Ghee Hwee Coridan, Robert H. Wong, Gerard C. L. Reed, James P. |
| Author_xml | – sequence: 1 givenname: Peter surname: Abbamonte fullname: Abbamonte, Peter email: abbamonte@mrl.uiuc.edu organization: Frederick Seitz Materials Research Laboratory University of Illinois Urbana, IL, 61801 (USA) – sequence: 2 givenname: Gerard C. L. surname: Wong fullname: Wong, Gerard C. L. organization: Frederick Seitz Materials Research Laboratory University of Illinois Urbana, IL, 61801 (USA) – sequence: 3 givenname: David G. surname: Cahill fullname: Cahill, David G. organization: Frederick Seitz Materials Research Laboratory University of Illinois Urbana, IL, 61801 (USA) – sequence: 4 givenname: James P. surname: Reed fullname: Reed, James P. organization: Frederick Seitz Materials Research Laboratory University of Illinois Urbana, IL, 61801 (USA) – sequence: 5 givenname: Robert H. surname: Coridan fullname: Coridan, Robert H. organization: Frederick Seitz Materials Research Laboratory University of Illinois Urbana, IL, 61801 (USA) – sequence: 6 givenname: Nathan W. surname: Schmidt fullname: Schmidt, Nathan W. organization: Frederick Seitz Materials Research Laboratory University of Illinois Urbana, IL, 61801 (USA) – sequence: 7 givenname: Ghee Hwee surname: Lai fullname: Lai, Ghee Hwee organization: Frederick Seitz Materials Research Laboratory University of Illinois Urbana, IL, 61801 (USA) – sequence: 8 givenname: Young Il surname: Joe fullname: Joe, Young Il organization: Frederick Seitz Materials Research Laboratory University of Illinois Urbana, IL, 61801 (USA) – sequence: 9 givenname: Diego surname: Casa fullname: Casa, Diego organization: Advanced Photon Source Argonne National Laboratory Argonne, IL, 60439 (USA) |
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| Snippet | A new method for imaging ultrafast dynamics in condensed matter using inelastic X‐ray scattering (IXS) is described. Using the concepts of causality and... A new method for imaging ultrafast dynamics in condensed matter using inelastic X-ray scattering (IXS) is described. Using the concepts of causality and... |
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| SubjectTerms | Algorithms Condensed matter Dynamics Elasticity Electron density Electrons Fourier Analysis Fourier transformation Imaging Inelastic scattering Inelastic X-Ray Scattering Neutron scattering Neutrons Phase Problem Scattering, Radiation Ultrafast imaging X-Rays |
| Title | Ultrafast Imaging and the Phase Problem for Inelastic X-Ray Scattering |
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