Model‐independent recovery of interfacial structure from multi‐contrast neutron reflectivity data

• Published in: Journal of applied crystallography Vol. 52; no. 3; pp. 538 - 547
• Main Author: Koutsioubas, Alexandros
• Format: Journal Article
• Language: English
• Published: 5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01.06.2019; Blackwell Publishing Ltd
• Subjects: Computer simulation; data fitting; Fourier transforms; Interfaces; neutron reflectivity; Reflectance; Research Papers; Scattering; Simulated annealing; soft interfaces; Spatial resolution; structure recovery; Thin films; data fitting; neutron reflectivity; soft interfaces; structure recovery

Neutron specular reflectivity at soft interfaces provides sub‐nanometre information concerning the molecular distribution of thin films, while the application of contrast variation can highlight the scattering from different parts of the system and lead to an overall reduction in fitting ambiguity....