The effect of length scale on the determination of geometrically necessary dislocations via EBSD continuum dislocation microscopy
Electron backscatter diffraction (EBSD) dislocation microscopy is an important, emerging field in metals characterization. Currently, calculation of geometrically necessary dislocation (GND) density is problematic because it has been shown to depend on the step size of the EBSD scan used to investig...
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| Published in | Ultramicroscopy Vol. 164; no. C; pp. 1 - 10 |
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| Main Authors | , , , |
| Format | Journal Article |
| Language | English |
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Elsevier B.V
01.05.2016
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| Abstract | Electron backscatter diffraction (EBSD) dislocation microscopy is an important, emerging field in metals characterization. Currently, calculation of geometrically necessary dislocation (GND) density is problematic because it has been shown to depend on the step size of the EBSD scan used to investigate the sample. This paper models the change in calculated GND density as a function of step size statistically. The model provides selection criteria for EBSD step size as well as an estimate of the total dislocation content. Evaluation of a heterogeneously deformed tantalum specimen is used to asses the method.
•The GND to SSD transition with increasing step size is analytically modeled.•Dislocation density of a microindented tantalum single crystal is measured.•Guidelines for step size selection in EBSD dislocation microscopy are presented. |
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| AbstractList | Electron backscatter diffraction (EBSD) dislocation microscopy is an important, emerging field in metals characterization. Currently, calculation of geometrically necessary dislocation (GND) density is problematic because it has been shown to depend on the step size of the EBSD scan used to investigate the sample. This paper models the change in calculated GND density as a function of step size statistically. The model provides selection criteria for EBSD step size as well as an estimate of the total dislocation content. Evaluation of a heterogeneously deformed tantalum specimen is used to asses the method. Electron backscatter diffraction (EBSD) dislocation microscopy is an important, emerging field in metals characterization. Currently, calculation of geometrically necessary dislocation (GND) density is problematic because it has been shown to depend on the step size of the EBSD scan used to investigate the sample. This paper models the change in calculated GND density as a function of step size statistically. The model provides selection criteria for EBSD step size as well as an estimate of the total dislocation content. Evaluation of a heterogeneously deformed tantalum specimen is used to asses the method. •The GND to SSD transition with increasing step size is analytically modeled.•Dislocation density of a microindented tantalum single crystal is measured.•Guidelines for step size selection in EBSD dislocation microscopy are presented. |
| Author | Fullwood, D.T. Rampton, T.M. Ruggles, T.J. Khosravani, A. |
| Author_xml | – sequence: 1 givenname: T.J. surname: Ruggles fullname: Ruggles, T.J. email: timmyruggs@gmail.com organization: National Institute of Aerospace, 100 Exploration Way, Hampton, VA 23666, USA – sequence: 2 givenname: T.M. surname: Rampton fullname: Rampton, T.M. organization: EDAX Inc., 91 McKee Drive, Mahwah, NJ 07430, USA – sequence: 3 givenname: A. surname: Khosravani fullname: Khosravani, A. organization: Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, GA 30332, USA – sequence: 4 givenname: D.T. surname: Fullwood fullname: Fullwood, D.T. organization: Department of Mechanical Engineering, Brigham Young University, Provo, UT 84602, USA |
| BackLink | https://www.ncbi.nlm.nih.gov/pubmed/26986021$$D View this record in MEDLINE/PubMed https://www.osti.gov/biblio/1359954$$D View this record in Osti.gov |
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| Keywords | High resolution EBSD Continuum dislocation microscopy Dislocation density EBSD step size |
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| SubjectTerms | Continuum dislocation microscopy Continuums Criteria Density Dislocation density Dislocations EBSD step size Electron back scatter diffraction High resolution EBSD Mathematical models Microscopy Samples |
| Title | The effect of length scale on the determination of geometrically necessary dislocations via EBSD continuum dislocation microscopy |
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