X-ray peak profile analysis of solid-state sintered alumina doped zinc oxide ceramics by Williamson–Hall and size-strain plot methods

• Published in: Journal of Asian Ceramic Societies Vol. 5; no. 2; pp. 94 - 103
• Main Authors: Rajesh Kumar, B., Hymavathi, B.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.06.2017; Taylor & Francis; Taylor & Francis Group
• Subjects: Scanning electron microscopy; Solid-state reaction; XRD; Scanning electron microscopy; Solid-state reaction; XRD

ZnO doped with different concentrations of Al2O3 (2, 4, 6, 8 and 10wt%) is prepared by conventional solid-state reaction method. X-ray diffraction results revealed that the samples were crystalline with a hexagonal wurtzite phase. As the concentration of alumina (Al2O3) increases in ZnO, the X-ray d...