Data-Driven Feature Extraction for Analog Circuit Fault Diagnosis Using 1-D Convolutional Neural Network - Yang, Huahui; Meng, Chen; Wang, Cheng (IEEE access, 2020)
Keywords: Adaptation models; Analog circuit fault diagnosis; Analog circuits; Artificial neural networks; Circuit faults; Circuits; Classification; convolutional neural network; data-driven method; Fault diagnosis; faults classification; Feature extraction; Hidden Markov models; Kernel; Neural networks; Signal processing