APA (7th ed.) Citation

Yang, H., Meng, C., & Wang, C. (2020). Data-Driven Feature Extraction for Analog Circuit Fault Diagnosis Using 1-D Convolutional Neural Network. IEEE access, 8, 18305-18315. https://doi.org/10.1109/ACCESS.2020.2968744

Chicago Style (17th ed.) Citation

Yang, Huahui, Chen Meng, and Cheng Wang. "Data-Driven Feature Extraction for Analog Circuit Fault Diagnosis Using 1-D Convolutional Neural Network." IEEE Access 8 (2020): 18305-18315. https://doi.org/10.1109/ACCESS.2020.2968744.

MLA (9th ed.) Citation

Yang, Huahui, et al. "Data-Driven Feature Extraction for Analog Circuit Fault Diagnosis Using 1-D Convolutional Neural Network." IEEE Access, vol. 8, 2020, pp. 18305-18315, https://doi.org/10.1109/ACCESS.2020.2968744.