Manipulating the processing window of directed self-assembly in contact hole shrinking with binary block copolymer/homopolymer blending
Directed self-assembly (DSA) lithography has demonstrated significant potential in fabricating integrated circuits. However, DSA encounters limited processing windows due to the requirement for precise matching between the period of block copolymers (BCPs) and graphoepitaxy templates. We propose a b...
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Published in | iScience Vol. 27; no. 4; p. 109425 |
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Main Authors | , , , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
United States
Elsevier Inc
19.04.2024
Elsevier |
Subjects | |
Online Access | Get full text |
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