Manipulating the processing window of directed self-assembly in contact hole shrinking with binary block copolymer/homopolymer blending

Directed self-assembly (DSA) lithography has demonstrated significant potential in fabricating integrated circuits. However, DSA encounters limited processing windows due to the requirement for precise matching between the period of block copolymers (BCPs) and graphoepitaxy templates. We propose a b...

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Bibliographic Details
Published iniScience Vol. 27; no. 4; p. 109425
Main Authors Wu, Zhiyong, Luo, Jiacheng, Li, Luyang, Dong, Qingshu, Zhang, Xiaohui, Li, Zili, Liu, Yadong, Ji, Shengxiang, Li, Weihua, Zhang, Yan, Xiong, Shisheng
Format Journal Article
LanguageEnglish
Published United States Elsevier Inc 19.04.2024
Elsevier
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