New Developments in Cathodoluminescence Spectroscopy for the Study of Luminescent Materials

• Published in: Materials Vol. 10; no. 3; p. 312
• Main Authors: Engelsen, Daniel den, Fern, George R, Harris, Paul G, Ireland, Terry G, Silver, Jack
• Format: Journal Article
• Language: English
• Published: Switzerland MDPI AG 17.03.2017; MDPI
• Subjects: backscattered electrons; Blanking; Cathodoluminescence; Charging; decay; Electron beams; Electron bombardment; Electron microscopes; electron microscopy; Luminous efficacy; Measurement methods; panchromatic image; Particle physics; Phosphors; Scanning electron microscopy; secondary electrons; shielding; STEM-image; Thin films; Transmission electron microscopy; secondary electrons; luminous efficacy; panchromatic image; charging; electron microscopy; shielding; decay; STEM-image; backscattered electrons
• ISSN: 1996-1944; 1996-1944
• DOI: 10.3390/ma10030312

Herein, we describe three advanced techniques for cathodoluminescence (CL) spectroscopy that have recently been developed in our laboratories. The first is a new method to accurately determine the CL-efficiency of thin layers of phosphor powders. When a wide band phosphor with a band gap (E > 5 eV) is bombarded with electrons, charging of the phosphor particles will occur, which eventually leads to erroneous results in the determination of the luminous efficacy. To overcome this problem of charging, a comparison method has been developed, which enables accurate measurement of the current density of the electron beam. The study of CL from phosphor specimens in a scanning electron microscope (SEM) is the second subject to be treated. A detailed description of a measuring method to determine the overall decay time of single phosphor crystals in a SEM without beam blanking is presented. The third technique is based on the unique combination of microscopy and spectrometry in the transmission electron microscope (TEM) of Brunel University London (UK). This combination enables the recording of CL-spectra of nanometre-sized specimens and determining spatial variations in CL emission across individual particles by superimposing the scanning TEM and CL-images.