Effect of Sb addition on Bi–2.6Ag–0.1Cu solders for high-temperature applications
Wettability of Bi–2.6Ag–0.1Cu–xSb alloys; (a) wetting angle and (b) multiple regression analysis as a function of temperature and Sb content. The wetting angle of the Bi–2.6Ag–0.1Cu–xSb solders on Cu plate was improved with increase in Sb content and test temperature. The contribution of the Sb cont...
Saved in:
Published in | Journal of alloys and compounds Vol. 592; pp. 207 - 212 |
---|---|
Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
Kidlington
Elsevier B.V
15.04.2014
Elsevier |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | Wettability of Bi–2.6Ag–0.1Cu–xSb alloys; (a) wetting angle and (b) multiple regression analysis as a function of temperature and Sb content. The wetting angle of the Bi–2.6Ag–0.1Cu–xSb solders on Cu plate was improved with increase in Sb content and test temperature. The contribution of the Sb content on the wettability was more significant than that of the test temperature. [Display omitted]
•Sb addition increased the liquidus temperatures suitable for high temperature solders.•Different solidification microstructure as compared with the phase diagram.•The wetting angle on Cu was improved with increase in Sb content and temperature.•Sb contents had more impact on the wettability than the test temperature.
The wetting, microstructural, and mechanical properties of Bi–2.6Ag–0.1Cu solders were investigated with various Sb contents. The Bi–Ag–Cu–xSb (x=0, 0.5, 1, 1.5, 2) alloys satisfied the optimum melting range of 261–275°C suitable for high-temperature applications. The microstructure of the Bi–2.6Ag–0.1Cu solder indicated a nearly eutectic mixture. Addition of Sb to the Bi–2.6Ag–0.1Cu solders resulted in the formation of intermetallic compounds such as η, ζ, and ε phases. In addition, the volume fraction of eutectic region decreased with increase in Sb content, together with the transformation of ζ phase to a larger-sized ε phase. The wetting angle of Bi–Ag–Cu–xSb solders on Cu plate was found to improve with increase in Sb content and test temperature. The Sb content contributed more significantly to the wettability than the test temperature. Furthermore, the hardness of Bi–Ag–Cu–xSb solders was found to increase with the Sb content. However, the addition of Sb deteriorated the electrical resistivity of Bi–Ag–Cu–xSb solders. |
---|---|
AbstractList | The wetting, microstructural, and mechanical properties of Bi-2.6Ag-0.1Cu solders were investigated with various Sb contents. The Bi-Ag-Cu-xSb (x = 0, 0.5, 1, 1.5, 2) alloys satisfied the optimum melting range of 261-275 [degrees]C suitable for high-temperature applications. The microstructure of the Bi-2.6Ag-0.1Cu solder indicated a nearly eutectic mixture. Addition of Sb to the Bi-2.6Ag-0.1Cu solders resulted in the formation of intermetallic compounds such as [eta], [zeta], and [epsilon] phases. In addition, the volume fraction of eutectic region decreased with increase in Sb content, together with the transformation of [zeta] phase to a larger-sized [epsilon] phase. The wetting angle of Bi-Ag-Cu-xSb solders on Cu plate was found to improve with increase in Sb content and test temperature. The Sb content contributed more significantly to the wettability than the test temperature. Furthermore, the hardness of Bi-Ag-Cu-xSb solders was found to increase with the Sb content. However, the addition of Sb deteriorated the electrical resistivity of Bi-Ag-Cu-xSb solders. Wettability of Bi–2.6Ag–0.1Cu–xSb alloys; (a) wetting angle and (b) multiple regression analysis as a function of temperature and Sb content. The wetting angle of the Bi–2.6Ag–0.1Cu–xSb solders on Cu plate was improved with increase in Sb content and test temperature. The contribution of the Sb content on the wettability was more significant than that of the test temperature. [Display omitted] •Sb addition increased the liquidus temperatures suitable for high temperature solders.•Different solidification microstructure as compared with the phase diagram.•The wetting angle on Cu was improved with increase in Sb content and temperature.•Sb contents had more impact on the wettability than the test temperature. The wetting, microstructural, and mechanical properties of Bi–2.6Ag–0.1Cu solders were investigated with various Sb contents. The Bi–Ag–Cu–xSb (x=0, 0.5, 1, 1.5, 2) alloys satisfied the optimum melting range of 261–275°C suitable for high-temperature applications. The microstructure of the Bi–2.6Ag–0.1Cu solder indicated a nearly eutectic mixture. Addition of Sb to the Bi–2.6Ag–0.1Cu solders resulted in the formation of intermetallic compounds such as η, ζ, and ε phases. In addition, the volume fraction of eutectic region decreased with increase in Sb content, together with the transformation of ζ phase to a larger-sized ε phase. The wetting angle of Bi–Ag–Cu–xSb solders on Cu plate was found to improve with increase in Sb content and test temperature. The Sb content contributed more significantly to the wettability than the test temperature. Furthermore, the hardness of Bi–Ag–Cu–xSb solders was found to increase with the Sb content. However, the addition of Sb deteriorated the electrical resistivity of Bi–Ag–Cu–xSb solders. |
Author | Kang, Namhyun Lee, Dongyun Kim, Beomjun Lee, Chang-Woo |
Author_xml | – sequence: 1 givenname: Beomjun orcidid: 0000-0003-0943-4174 surname: Kim fullname: Kim, Beomjun organization: Education Program for Samsung Advanced Integrated Circuit, Pusan National University, Busan 609-735, Republic of Korea – sequence: 2 givenname: Chang-Woo surname: Lee fullname: Lee, Chang-Woo organization: Advanced Welding & Joining Technology Center, Korea Institute of Industrial Technology, Incheon 406-840, Republic of Korea – sequence: 3 givenname: Dongyun surname: Lee fullname: Lee, Dongyun organization: Department of Nanofusion Engineering, Pusan National University, Busan 609-735, Republic of Korea – sequence: 4 givenname: Namhyun surname: Kang fullname: Kang, Namhyun email: nhkang@pusan.ac.kr organization: Department of Materials Science and Engineering, Pusan National University, Busan 609-735, Republic of Korea |
BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=28259332$$DView record in Pascal Francis |
BookMark | eNqFkctqHDEQRUVwIOPHJxh6E8im23q0XqvgDM4DDFkkXosadcnW0NPqSD2B7PIP-cN8iTXM4K1BUJtzdYtT5-RsShMScs1oxyhTN9tuC-Po067jlImO8Y5L_oasmNGi7ZWyZ2RFLZetEca8I-elbCmlzAq2Ig93IaBfmhSaH5sGhiEuMU1NfZ_i_7__eKduH-usTet9U9I4YC5NSLl5io9P7YK7GTMs-4wNzPMYPRzi5ZK8DTAWvDrNC_Lw-e7n-mt7__3Lt_Xtfet7zZZ2o1EgIOdsUKj8RqiNZyB0r9EYFmxdmtcttfKoUApqArChB6BaGGEBxAX5cPx3zunXHsvidrF4HEeYMO2LY0pry6Tq7euolLbSxsqKyiPqcyolY3BzjjvIfxyj7mDcbd3JuDsYd4y7arzm3p8qoHgYQ4bJx_IS5oZLK8SB-3jksKr5HTG74iNOHoeY6y3ckOIrTc9geptB |
CitedBy_id | crossref_primary_10_1007_s10854_017_7032_1 crossref_primary_10_1039_C6RA08706J crossref_primary_10_1016_j_jallcom_2015_02_223 crossref_primary_10_1016_S1003_6326_23_66225_9 crossref_primary_10_1016_j_jmapro_2022_08_045 crossref_primary_10_1007_s10854_018_9308_5 crossref_primary_10_1016_j_jallcom_2019_151925 crossref_primary_10_1108_SSMT_08_2015_0023 crossref_primary_10_1108_SSMT_02_2018_0007 crossref_primary_10_1007_s10854_017_7611_1 crossref_primary_10_1088_1757_899X_117_1_012028 crossref_primary_10_3390_met7120540 crossref_primary_10_4028_www_scientific_net_MSF_928_188 crossref_primary_10_1007_s40194_019_00802_4 crossref_primary_10_1016_j_msea_2018_12_012 crossref_primary_10_1007_s11665_022_06648_0 crossref_primary_10_1016_j_microrel_2017_11_013 crossref_primary_10_1016_j_mtcomm_2024_109113 crossref_primary_10_1016_j_jallcom_2014_02_100 crossref_primary_10_1016_j_jallcom_2014_08_076 crossref_primary_10_2320_matertrans_MD201517 crossref_primary_10_1007_s11664_014_3304_1 crossref_primary_10_1016_j_matchar_2014_07_023 crossref_primary_10_1016_j_msea_2016_05_102 |
Cites_doi | 10.1016/j.mee.2010.12.072 10.1063/1.1517165 10.1109/95.335047 10.2320/matertrans.43.1873 10.1007/s11664-006-0295-6 10.2320/matertrans.MJ201004 10.1007/s11664-007-0344-9 10.1007/s11664-004-0034-9 10.1016/S1359-0286(00)00036-X 10.1007/BF02692565 10.1007/BF02647236 10.1109/77.919694 10.1007/s11661-007-9138-1 10.1007/s11664-004-0086-x 10.1016/j.jallcom.2009.06.018 10.1007/s11434-010-0056-z 10.1007/s11837-009-0013-y 10.1016/j.jallcom.2007.12.048 10.1016/S0026-2714(99)00158-4 |
ContentType | Journal Article |
Copyright | 2014 Elsevier B.V. 2015 INIST-CNRS |
Copyright_xml | – notice: 2014 Elsevier B.V. – notice: 2015 INIST-CNRS |
DBID | IQODW AAYXX CITATION 8BQ 8FD JG9 |
DOI | 10.1016/j.jallcom.2013.12.252 |
DatabaseName | Pascal-Francis CrossRef METADEX Technology Research Database Materials Research Database |
DatabaseTitle | CrossRef Materials Research Database Technology Research Database METADEX |
DatabaseTitleList | Materials Research Database Materials Research Database |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Chemistry Physics Applied Sciences |
EISSN | 1873-4669 |
EndPage | 212 |
ExternalDocumentID | 10_1016_j_jallcom_2013_12_252 28259332 S0925838814000139 |
GroupedDBID | --K --M -~X .~1 0R~ 1B1 1~. 1~5 4.4 457 4G. 5GY 5VS 7-5 71M 8P~ 9JN AABNK AABXZ AACTN AAEDT AAEDW AAEPC AAIAV AAIKJ AAKOC AALRI AAOAW AAQFI AAXUO ABFNM ABJNI ABMAC ABXDB ABXRA ABYKQ ACDAQ ACGFS ACIWK ACNCT ACRLP ADBBV ADEZE AEBSH AEKER AENEX AEZYN AFKWA AFRZQ AFTJW AGHFR AGUBO AGYEJ AHHHB AIEXJ AIKHN AITUG AJBFU AJOXV ALMA_UNASSIGNED_HOLDINGS AMFUW AMRAJ AXJTR BKOJK BLXMC CS3 DU5 EBS EFJIC EFLBG EO8 EO9 EP2 EP3 F5P FDB FIRID FNPLU FYGXN G-Q GBLVA IHE J1W KOM M24 M41 MAGPM MO0 N9A O-L O9- OAUVE OZT P-8 P-9 P2P PC. Q38 RIG RNS ROL RPZ SDF SDG SES SPC SPCBC SPD SSM SSZ T5K TWZ XPP ZMT ~G- 08R 29J 6XO AALMO AAQXK ABFLS ABPIF ABPTK ACNNM ADALY ASPBG AVWKF AZFZN EJD FEDTE FGOYB G-2 HVGLF HZ~ IPNFZ IQODW R2- SEW SMS T9H WUQ AAXKI AAYXX ADMUD AFJKZ AKRWK CITATION 8BQ 8FD JG9 |
ID | FETCH-LOGICAL-c471t-b7e3eae221d6e6cb36bc1a3747e881f9092293176ce6e5308fa1d4aa073839aa3 |
IEDL.DBID | .~1 |
ISSN | 0925-8388 |
IngestDate | Fri Aug 16 22:19:20 EDT 2024 Fri Aug 16 02:05:58 EDT 2024 Thu Sep 26 18:08:34 EDT 2024 Thu Nov 24 18:34:37 EST 2022 Fri Feb 23 02:23:10 EST 2024 |
IsPeerReviewed | true |
IsScholarly | true |
Keywords | Intermetallics Metals and alloys Precipitation Microstructure Liquid–solid reactions Electrical conductivity Melting Impurity density Volume fraction Wetting Liquid―solid reactions Antimony additions Hardness Epsilon phase Wettability Bismuth base alloys Lead free solder Liquid solid reaction |
Language | English |
License | CC BY 4.0 |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c471t-b7e3eae221d6e6cb36bc1a3747e881f9092293176ce6e5308fa1d4aa073839aa3 |
Notes | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 ObjectType-Article-1 ObjectType-Feature-2 |
ORCID | 0000-0003-0943-4174 |
PQID | 1559677895 |
PQPubID | 23500 |
PageCount | 6 |
ParticipantIDs | proquest_miscellaneous_1677915649 proquest_miscellaneous_1559677895 crossref_primary_10_1016_j_jallcom_2013_12_252 pascalfrancis_primary_28259332 elsevier_sciencedirect_doi_10_1016_j_jallcom_2013_12_252 |
PublicationCentury | 2000 |
PublicationDate | 2014-04-15 |
PublicationDateYYYYMMDD | 2014-04-15 |
PublicationDate_xml | – month: 04 year: 2014 text: 2014-04-15 day: 15 |
PublicationDecade | 2010 |
PublicationPlace | Kidlington |
PublicationPlace_xml | – name: Kidlington |
PublicationTitle | Journal of alloys and compounds |
PublicationYear | 2014 |
Publisher | Elsevier B.V Elsevier |
Publisher_xml | – name: Elsevier B.V – name: Elsevier |
References | Lee, Lee, Kim (b0020) 2007; 3 Tang, He, Liu, Ivey (b0040) 2008; 19 Wang, Ho, Tsai (b0110) 2010; 51 Takaku, Felicia, Ohnuma, Kainuam, Ishida (b0050) 2008; 37 Lee, Chen, Jao, Hsu (b0095) 2004; 33 Zhang, Yuan, Zhao, Zang, Li (b0105) 2010; 55 Song, Chuang, Wu (b0055) 2006; 35 Tanaka, Ninomiya, Ishigohka, Kurahashi (b0060) 2001; 11 Song, Chuang, Wen (b0065) 2007; 38 Wondrak (b0075) 1999; 39 Askeland, Phule (b0115) 2009 Chung, Chen, Lin, Chen (b0030) 2009; 485 Arenas, Acoff (b0100) 2004; 33 Chidambaram, Hattel, Hald (b0025) 2011; 88 Suganuma, Kim, Kim (b0015) 2009; 61 Dreike (b0070) 1994; 17 Liu, Sun (b0085) 1989; 2 Yost, Karnowsky, Drotning, Gieske (b0035) 1990; 21 Suganuma (b0005) 2001; 5 Tu, Gusak, Li (b0010) 2003; 93 Takaku, Ohnuma, Kainuma, Yamada, Yagi, Nishibe, Ishida (b0080) 2006; 35 Kim, Jeong, Lee (b0090) 2002; 43 Kang, Na, Kim, Kang (b0045) 2009; 467 Yost (10.1016/j.jallcom.2013.12.252_b0035) 1990; 21 Tanaka (10.1016/j.jallcom.2013.12.252_b0060) 2001; 11 Song (10.1016/j.jallcom.2013.12.252_b0055) 2006; 35 Tu (10.1016/j.jallcom.2013.12.252_b0010) 2003; 93 Song (10.1016/j.jallcom.2013.12.252_b0065) 2007; 38 Lee (10.1016/j.jallcom.2013.12.252_b0020) 2007; 3 Chung (10.1016/j.jallcom.2013.12.252_b0030) 2009; 485 Dreike (10.1016/j.jallcom.2013.12.252_b0070) 1994; 17 Wang (10.1016/j.jallcom.2013.12.252_b0110) 2010; 51 Askeland (10.1016/j.jallcom.2013.12.252_b0115) 2009 Tang (10.1016/j.jallcom.2013.12.252_b0040) 2008; 19 Kim (10.1016/j.jallcom.2013.12.252_b0090) 2002; 43 Takaku (10.1016/j.jallcom.2013.12.252_b0050) 2008; 37 Lee (10.1016/j.jallcom.2013.12.252_b0095) 2004; 33 Zhang (10.1016/j.jallcom.2013.12.252_b0105) 2010; 55 Suganuma (10.1016/j.jallcom.2013.12.252_b0005) 2001; 5 Arenas (10.1016/j.jallcom.2013.12.252_b0100) 2004; 33 Kang (10.1016/j.jallcom.2013.12.252_b0045) 2009; 467 Chidambaram (10.1016/j.jallcom.2013.12.252_b0025) 2011; 88 Takaku (10.1016/j.jallcom.2013.12.252_b0080) 2006; 35 Wondrak (10.1016/j.jallcom.2013.12.252_b0075) 1999; 39 Suganuma (10.1016/j.jallcom.2013.12.252_b0015) 2009; 61 Liu (10.1016/j.jallcom.2013.12.252_b0085) 1989; 2 |
References_xml | – volume: 51 start-page: 1735 year: 2010 end-page: 1740 ident: b0110 publication-title: Mater. Trans. contributor: fullname: Tsai – volume: 39 start-page: 1113 year: 1999 end-page: 1120 ident: b0075 publication-title: Microelectron. Reliab. contributor: fullname: Wondrak – volume: 21 start-page: 1885 year: 1990 end-page: 1889 ident: b0035 publication-title: Metall. Mater. Trans. A. contributor: fullname: Gieske – volume: 38 start-page: 1371 year: 2007 end-page: 1375 ident: b0065 publication-title: Metall. Mater. Trans. A. contributor: fullname: Wen – volume: 35 start-page: 1041 year: 2006 end-page: 1049 ident: b0055 publication-title: J. Electron Mater. contributor: fullname: Wu – volume: 35 start-page: 1926 year: 2006 ident: b0080 publication-title: Electron. Mater. contributor: fullname: Ishida – volume: 37 start-page: 314 year: 2008 end-page: 323 ident: b0050 publication-title: J. Electron Mater. contributor: fullname: Ishida – year: 2009 ident: b0115 article-title: The Science and Engineering of Materials contributor: fullname: Phule – volume: 11 start-page: 3002 year: 2001 end-page: 3005 ident: b0060 publication-title: IEEE Trans. Appl. Supercond. contributor: fullname: Kurahashi – volume: 33 start-page: 1048 year: 2004 end-page: 1054 ident: b0095 publication-title: J. Electron. Mater. contributor: fullname: Hsu – volume: 43 start-page: 1873 year: 2002 end-page: 1878 ident: b0090 publication-title: Mater. Trans. contributor: fullname: Lee – volume: 55 start-page: 797 year: 2010 end-page: 801 ident: b0105 publication-title: Chin. Sci. Bull. contributor: fullname: Li – volume: 5 start-page: 55 year: 2001 end-page: 64 ident: b0005 publication-title: Curr. Opin. Solid State Mater. Sci. contributor: fullname: Suganuma – volume: 61 start-page: 64 year: 2009 end-page: 71 ident: b0015 publication-title: JOM-J. Min. Met. Mat. S. contributor: fullname: Kim – volume: 88 start-page: 981 year: 2011 end-page: 989 ident: b0025 publication-title: Microelectron. Eng. contributor: fullname: Hald – volume: 485 start-page: 219 year: 2009 end-page: 224 ident: b0030 publication-title: J. Alloys Comp. contributor: fullname: Chen – volume: 93 start-page: 1335 year: 2003 end-page: 1352 ident: b0010 publication-title: J. Appl. Phys. contributor: fullname: Li – volume: 19 start-page: 1176 year: 2008 end-page: 1183 ident: b0040 publication-title: J. Mater. Sci.: Mater. Electron. contributor: fullname: Ivey – volume: 17 start-page: 594 year: 1994 end-page: 609 ident: b0070 publication-title: IEEE Trans. Comp. Pack. Manuf. Technol. A contributor: fullname: Dreike – volume: 2 start-page: 151 year: 1989 end-page: 152 ident: b0085 publication-title: Acta Metall. Sin. (Engl. Lett.). contributor: fullname: Sun – volume: 467 start-page: 246 year: 2009 end-page: 250 ident: b0045 publication-title: J. Alloys Comp. contributor: fullname: Kang – volume: 3 start-page: 221 year: 2007 end-page: 228 ident: b0020 publication-title: EML contributor: fullname: Kim – volume: 33 start-page: 1452 year: 2004 end-page: 1458 ident: b0100 publication-title: J. Electron. Mater. contributor: fullname: Acoff – year: 2009 ident: 10.1016/j.jallcom.2013.12.252_b0115 contributor: fullname: Askeland – volume: 88 start-page: 981 year: 2011 ident: 10.1016/j.jallcom.2013.12.252_b0025 publication-title: Microelectron. Eng. doi: 10.1016/j.mee.2010.12.072 contributor: fullname: Chidambaram – volume: 19 start-page: 1176 year: 2008 ident: 10.1016/j.jallcom.2013.12.252_b0040 publication-title: J. Mater. Sci.: Mater. Electron. contributor: fullname: Tang – volume: 93 start-page: 1335 year: 2003 ident: 10.1016/j.jallcom.2013.12.252_b0010 publication-title: J. Appl. Phys. doi: 10.1063/1.1517165 contributor: fullname: Tu – volume: 17 start-page: 594 year: 1994 ident: 10.1016/j.jallcom.2013.12.252_b0070 publication-title: IEEE Trans. Comp. Pack. Manuf. Technol. A doi: 10.1109/95.335047 contributor: fullname: Dreike – volume: 43 start-page: 1873 year: 2002 ident: 10.1016/j.jallcom.2013.12.252_b0090 publication-title: Mater. Trans. doi: 10.2320/matertrans.43.1873 contributor: fullname: Kim – volume: 35 start-page: 1926 year: 2006 ident: 10.1016/j.jallcom.2013.12.252_b0080 publication-title: Electron. Mater. doi: 10.1007/s11664-006-0295-6 contributor: fullname: Takaku – volume: 51 start-page: 1735 year: 2010 ident: 10.1016/j.jallcom.2013.12.252_b0110 publication-title: Mater. Trans. doi: 10.2320/matertrans.MJ201004 contributor: fullname: Wang – volume: 3 start-page: 221 year: 2007 ident: 10.1016/j.jallcom.2013.12.252_b0020 publication-title: EML contributor: fullname: Lee – volume: 37 start-page: 314 year: 2008 ident: 10.1016/j.jallcom.2013.12.252_b0050 publication-title: J. Electron Mater. doi: 10.1007/s11664-007-0344-9 contributor: fullname: Takaku – volume: 33 start-page: 1048 year: 2004 ident: 10.1016/j.jallcom.2013.12.252_b0095 publication-title: J. Electron. Mater. doi: 10.1007/s11664-004-0034-9 contributor: fullname: Lee – volume: 5 start-page: 55 year: 2001 ident: 10.1016/j.jallcom.2013.12.252_b0005 publication-title: Curr. Opin. Solid State Mater. Sci. doi: 10.1016/S1359-0286(00)00036-X contributor: fullname: Suganuma – volume: 2 start-page: 151 year: 1989 ident: 10.1016/j.jallcom.2013.12.252_b0085 publication-title: Acta Metall. Sin. (Engl. Lett.). contributor: fullname: Liu – volume: 35 start-page: 1041 year: 2006 ident: 10.1016/j.jallcom.2013.12.252_b0055 publication-title: J. Electron Mater. doi: 10.1007/BF02692565 contributor: fullname: Song – volume: 21 start-page: 1885 year: 1990 ident: 10.1016/j.jallcom.2013.12.252_b0035 publication-title: Metall. Mater. Trans. A. doi: 10.1007/BF02647236 contributor: fullname: Yost – volume: 11 start-page: 3002 year: 2001 ident: 10.1016/j.jallcom.2013.12.252_b0060 publication-title: IEEE Trans. Appl. Supercond. doi: 10.1109/77.919694 contributor: fullname: Tanaka – volume: 38 start-page: 1371 year: 2007 ident: 10.1016/j.jallcom.2013.12.252_b0065 publication-title: Metall. Mater. Trans. A. doi: 10.1007/s11661-007-9138-1 contributor: fullname: Song – volume: 33 start-page: 1452 year: 2004 ident: 10.1016/j.jallcom.2013.12.252_b0100 publication-title: J. Electron. Mater. doi: 10.1007/s11664-004-0086-x contributor: fullname: Arenas – volume: 485 start-page: 219 year: 2009 ident: 10.1016/j.jallcom.2013.12.252_b0030 publication-title: J. Alloys Comp. doi: 10.1016/j.jallcom.2009.06.018 contributor: fullname: Chung – volume: 55 start-page: 797 year: 2010 ident: 10.1016/j.jallcom.2013.12.252_b0105 publication-title: Chin. Sci. Bull. doi: 10.1007/s11434-010-0056-z contributor: fullname: Zhang – volume: 61 start-page: 64 year: 2009 ident: 10.1016/j.jallcom.2013.12.252_b0015 publication-title: JOM-J. Min. Met. Mat. S. doi: 10.1007/s11837-009-0013-y contributor: fullname: Suganuma – volume: 467 start-page: 246 year: 2009 ident: 10.1016/j.jallcom.2013.12.252_b0045 publication-title: J. Alloys Comp. doi: 10.1016/j.jallcom.2007.12.048 contributor: fullname: Kang – volume: 39 start-page: 1113 year: 1999 ident: 10.1016/j.jallcom.2013.12.252_b0075 publication-title: Microelectron. Reliab. doi: 10.1016/S0026-2714(99)00158-4 contributor: fullname: Wondrak |
SSID | ssj0001931 |
Score | 2.3040507 |
Snippet | Wettability of Bi–2.6Ag–0.1Cu–xSb alloys; (a) wetting angle and (b) multiple regression analysis as a function of temperature and Sb content. The wetting angle... The wetting, microstructural, and mechanical properties of Bi-2.6Ag-0.1Cu solders were investigated with various Sb contents. The Bi-Ag-Cu-xSb (x = 0, 0.5, 1,... |
SourceID | proquest crossref pascalfrancis elsevier |
SourceType | Aggregation Database Index Database Publisher |
StartPage | 207 |
SubjectTerms | Alloys Antimony Applied sciences Brazing. Soldering Condensed matter: structure, mechanical and thermal properties Eutectic temperature Exact sciences and technology Intermetallics Joining, thermal cutting: metallurgical aspects Liquid–solid reactions Metals and alloys Metals. Metallurgy Microstructure Phases Physics Precipitation Solders Solid-fluid interfaces Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) Wettability Wetting |
Title | Effect of Sb addition on Bi–2.6Ag–0.1Cu solders for high-temperature applications |
URI | https://dx.doi.org/10.1016/j.jallcom.2013.12.252 https://search.proquest.com/docview/1559677895 https://search.proquest.com/docview/1677915649 |
Volume | 592 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1dq9NAEB3KFbleRLTXi_WjrODrpsnuJu0-1mKpin2phb4tu8nm0lLSYtvXi__Bf-gvcSYftkW8ghAIhEmyzCwzJ5mzZwHeRQRKY5XxMFcpVwMXcudVzG0_Vz6KUyEd_dD_Mk0mc_VpES9aMGrWwhCtss79VU4vs3V9pVd7s7ddLnuzUAvq-ZFkUwlkaAU7FiOc08HdkeaBAKXcNQ-NOVkfV_H0VsHKrtdEGsEqKOmvoIjF3-rT463dodfyaruLPzJ3WY7GT-FJjSPZsBrqM2j5og2Xo2b7tjZcnSgNtuFhyfRMd9cwr_SK2SZnM8eITkShYXi8X_78_kMEyfAWzzj40YHhxCSiM0Nky0jYmJOSVS3DzE57389hPv7wdTTh9d4KPMVytOeu76W3XogoS3ySOpm4NLISPy48ejTX6C8EAlE_SX3iYxkOchtlylrMCAiprJU3cFFsCv8CmFQDHVE7UCNWyITTeLfE54TS5irJ0g4EjUfNtpLQMA23bGXqEBgKgYmEwRB0YND43ZzNBYNp_l-3ds_i9PuFtERXS4kGb5vAGQwIdUds4TeHnaH-LKnp6fgeGzTQJK-jX_7_GF_Bo5KCQFzC-DVc7L8d_BtENnvXLaduFx4MP36eTH8BR6n39A |
link.rule.ids | 315,786,790,4521,24144,27955,27956,45618,45712 |
linkProvider | Elsevier |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1bS-NAFD64LqIii3ZXvOzqCL5Om7kk7TxqWenuqi9a8G2YSSZLi7TFtq_if_Af-ks8JxcviLsgBALJSTKcM5z5MuebbwAOBYHSWGc8ynXKdcdH3Acdc9fOdRBxKpWnCf2z86TX17-v4qsF6NZrYYhWWeX-MqcX2bq60qq82ZoMBq2LyEiq-ZFkUwFkPsFnQgPE62rePvM8EKEU2-ahNSfz52U8rWFz6K6viTWCw6CiaUEZy_cGqLWJm6Lb8nK_izepuxiPTtbhSwUk2VHZ1g1YCKMGLHfr_dsasPpCarABSwXVM51-hX4pWMzGObvwjPhEFBuGx_Hg4e5eNpOjv3jGxnfnDHsmMZ0ZQltGysacpKwqHWb2svj9DfonPy-7PV5trsBTHI9m3LeDCi5IKbIkJKlXiU-FU_h3EdCluUF_IRIQ7SQNSYhV1MmdyLRzmBIQUzmnNmFxNB6FLWBKd4ygeqBBsJBJb_Bphe-JlMt1kqXb0Kw9aielhoatyWVDW4XAUgiskBZDsA2d2u_2VWewmOf_9-jeqzg9fZDW6Bql0OCgDpzFgFB5xI3CeD61VKAlOT0T_8MGDQzp65idj7dxH5Z7l2en9vTX-Z9dWME7BRdIxN9hcXYzDz8Q5sz8XtGNHwEMyvmT |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Effect+of+Sb+addition+on+Bi-2.6Ag-0.1Cu+solders+for+high-temperature+applications&rft.jtitle=Journal+of+alloys+and+compounds&rft.au=Kim%2C+Beomjun&rft.au=Lee%2C+Chang-Woo&rft.au=Lee%2C+Dongyun&rft.au=Kang%2C+Namhyun&rft.date=2014-04-15&rft.issn=0925-8388&rft.volume=592&rft.spage=207&rft.epage=212&rft_id=info:doi/10.1016%2Fj.jallcom.2013.12.252&rft.externalDBID=NO_FULL_TEXT |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0925-8388&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0925-8388&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0925-8388&client=summon |