Patent overlay mapping: Visualizing technological distance

• Published in: Journal of the Association for Information Science and Technology Vol. 65; no. 12; pp. 2432 - 2443
• Main Authors: Kay, Luciano, Newman, Nils, Youtie, Jan, Porter, Alan L., Rafols, Ismael
• Format: Journal Article
• Language: English
• Published: Malden, MA Blackwell Publishing Ltd 01.12.2014; Wiley
• Subjects: Analogies; Bibliometrics. Scientometrics; Bibliometrics. Scientometrics. Evaluation; Categories; Citation analysis; Classification; Decision making; Exact sciences and technology; Information and communication sciences; information mapping; Information science. Documentation; innovation; Interprocessor communication; Library and information science. General aspects; Nanotechnology; Offices; Sciences and techniques of general use; Subject fields; Technology; Visualization; Patents; Research field; Similarity; Correlation analysis; Classification; Database; Categorization

This paper presents a new global patent map that represents all technological categories and a method to locate patent data of individual organizations and technological fields on the global map. This overlay map technique may support competitive intelligence and policy decision making. The global p...