APA (7th ed.) Citation

Kay, L., Newman, N., Youtie, J., Porter, A. L., & Rafols, I. (2014). Patent overlay mapping: Visualizing technological distance. Journal of the Association for Information Science and Technology, 65(12), 2432-2443. https://doi.org/10.1002/asi.23146

Chicago Style (17th ed.) Citation

Kay, Luciano, Nils Newman, Jan Youtie, Alan L. Porter, and Ismael Rafols. "Patent Overlay Mapping: Visualizing Technological Distance." Journal of the Association for Information Science and Technology 65, no. 12 (2014): 2432-2443. https://doi.org/10.1002/asi.23146.

MLA (9th ed.) Citation

Kay, Luciano, et al. "Patent Overlay Mapping: Visualizing Technological Distance." Journal of the Association for Information Science and Technology, vol. 65, no. 12, 2014, pp. 2432-2443, https://doi.org/10.1002/asi.23146.