Calibration Analysis of High-G MEMS Accelerometer Sensor Based on Wavelet and Wavelet Packet Denoising
High-G accelerometers are mainly used for motion measurement in some special fields, such as projectile penetration and aerospace equipment. This paper mainly explores the wavelet threshold denoising and wavelet packet threshold denoising in wavelet analysis, which is more suitable for high-G piezor...
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| Published in | Sensors (Basel, Switzerland) Vol. 21; no. 4; p. 1231 |
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| Main Authors | , , , , |
| Format | Journal Article |
| Language | English |
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09.02.2021
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| Abstract | High-G accelerometers are mainly used for motion measurement in some special fields, such as projectile penetration and aerospace equipment. This paper mainly explores the wavelet threshold denoising and wavelet packet threshold denoising in wavelet analysis, which is more suitable for high-G piezoresistive accelerometers. In this paper, adaptive decomposition and Shannon entropy criterion are used to find the optimal decomposition layer and optimal tree. Both methods use the Stein unbiased likelihood estimation method for soft threshold denoising. Through numerical simulation and Machete hammer test, the wavelet threshold denoising is more suitable for the dynamic calibration of a high-G accelerometer. The wavelet packet threshold denoising is more suitable for the parameter extraction of the oscillation phase. |
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| AbstractList | High-G accelerometers are mainly used for motion measurement in some special fields, such as projectile penetration and aerospace equipment. This paper mainly explores the wavelet threshold denoising and wavelet packet threshold denoising in wavelet analysis, which is more suitable for high-G piezoresistive accelerometers. In this paper, adaptive decomposition and Shannon entropy criterion are used to find the optimal decomposition layer and optimal tree. Both methods use the Stein unbiased likelihood estimation method for soft threshold denoising. Through numerical simulation and Machete hammer test, the wavelet threshold denoising is more suitable for the dynamic calibration of a high-G accelerometer. The wavelet packet threshold denoising is more suitable for the parameter extraction of the oscillation phase. High-G accelerometers are mainly used for motion measurement in some special fields, such as projectile penetration and aerospace equipment. This paper mainly explores the wavelet threshold denoising and wavelet packet threshold denoising in wavelet analysis, which is more suitable for high-G piezoresistive accelerometers. In this paper, adaptive decomposition and Shannon entropy criterion are used to find the optimal decomposition layer and optimal tree. Both methods use the Stein unbiased likelihood estimation method for soft threshold denoising. Through numerical simulation and Machete hammer test, the wavelet threshold denoising is more suitable for the dynamic calibration of a high-G accelerometer. The wavelet packet threshold denoising is more suitable for the parameter extraction of the oscillation phase.High-G accelerometers are mainly used for motion measurement in some special fields, such as projectile penetration and aerospace equipment. This paper mainly explores the wavelet threshold denoising and wavelet packet threshold denoising in wavelet analysis, which is more suitable for high-G piezoresistive accelerometers. In this paper, adaptive decomposition and Shannon entropy criterion are used to find the optimal decomposition layer and optimal tree. Both methods use the Stein unbiased likelihood estimation method for soft threshold denoising. Through numerical simulation and Machete hammer test, the wavelet threshold denoising is more suitable for the dynamic calibration of a high-G accelerometer. The wavelet packet threshold denoising is more suitable for the parameter extraction of the oscillation phase. |
| Author | Cao, Huiliang Jiao, Jingjing Shi, Yunbo Zhao, Rui Zhang, Juanjuan |
| AuthorAffiliation | Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China; shiyunbo@nuc.edu.cn (Y.S.); s1906105@st.nuc.edu.cn (J.Z.); s1706152@st.nuc.edu.cn (J.J.); zhaorui@nuc.edu.cn (R.Z.) |
| AuthorAffiliation_xml | – name: Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China; shiyunbo@nuc.edu.cn (Y.S.); s1906105@st.nuc.edu.cn (J.Z.); s1706152@st.nuc.edu.cn (J.J.); zhaorui@nuc.edu.cn (R.Z.) |
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| Keywords | noise reduction wavelet denoising MEMS accelerometer wavelet packet denoising high-G calibration |
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| SubjectTerms | Accelerometers Algorithms Decomposition high-G calibration MEMS accelerometer Microelectromechanical systems Neural networks noise reduction Sensors Signal to noise ratio Time series wavelet denoising wavelet packet denoising Wavelet transforms |
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| Title | Calibration Analysis of High-G MEMS Accelerometer Sensor Based on Wavelet and Wavelet Packet Denoising |
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