A Simple Method to Differentiate between Free-Carrier Recombination and Trapping Centers in the Bandgap of the p-Type Semiconductor

In this research, the ranges of the localized states in which the recombination and the trapping rates of free carriers dominate the entire transition rates of free carriers in the bandgap of the p-type semiconductor are described. Applying the Shockley–Read–Hall model to a p-type material under a l...

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Bibliographic Details
Published inAdvances in materials science and engineering Vol. 2021; no. 1
Main Author Shura, Megersa Wodajo
Format Journal Article
LanguageEnglish
Published New York Hindawi 2021
Hindawi Limited
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