Remaining Useful Life Estimation of Insulated Gate Biploar Transistors (IGBTs) Based on a Novel Volterra k-Nearest Neighbor Optimally Pruned Extreme Learning Machine (VKOPP) Model Using Degradation Data - Liu, Zhen; Mei, Wenjuan; Zeng, Xianping; Yang, Chenglin; Zhou, Xiuyun (Sensors (Basel, Switzerland), 2017)
Keywords: degradation data; IGBT; prediction model; remaining useful life; Useful life; VKOPP; IGBT; prediction model; remaining useful life; VKOPP; degradation data