APA (7th ed.) Citation

Liu, Z., Mei, W., Zeng, X., Yang, C., & Zhou, X. (2017). Remaining Useful Life Estimation of Insulated Gate Biploar Transistors (IGBTs) Based on a Novel Volterra k-Nearest Neighbor Optimally Pruned Extreme Learning Machine (VKOPP) Model Using Degradation Data. Sensors (Basel, Switzerland), 17(11), 2524. https://doi.org/10.3390/s17112524

Chicago Style (17th ed.) Citation

Liu, Zhen, Wenjuan Mei, Xianping Zeng, Chenglin Yang, and Xiuyun Zhou. "Remaining Useful Life Estimation of Insulated Gate Biploar Transistors (IGBTs) Based on a Novel Volterra K-Nearest Neighbor Optimally Pruned Extreme Learning Machine (VKOPP) Model Using Degradation Data." Sensors (Basel, Switzerland) 17, no. 11 (2017): 2524. https://doi.org/10.3390/s17112524.

MLA (9th ed.) Citation

Liu, Zhen, et al. "Remaining Useful Life Estimation of Insulated Gate Biploar Transistors (IGBTs) Based on a Novel Volterra K-Nearest Neighbor Optimally Pruned Extreme Learning Machine (VKOPP) Model Using Degradation Data." Sensors (Basel, Switzerland), vol. 17, no. 11, 2017, p. 2524, https://doi.org/10.3390/s17112524.