A Novel Mechanism-Equivalence-Based Tweedie Exponential Dispersion Process for Adaptive Degradation Modeling and Life Prediction - Wu, Jiayue; Liu, Yujie; Wang, Han; Ma, Xiaobing; Zhao, Yu (Sensors (Basel, Switzerland), 2025)
Keywords: Accuracy; Analysis; degradation analysis; Machine learning; mechanism equivalence; Methods; Parameter estimation; RUL prediction; Stochastic models; Stochastic processes; Stress; Trends; Tweedie exponential dispersion process; China; RUL prediction; Tweedie exponential dispersion process; degradation analysis; mechanism equivalence