Identification of major QTLs for yield-related traits with improved genetic map in wheat

• Published in: Frontiers in plant science Vol. 14; p. 1138696
• Main Authors: Ma, Feifei, Xu, Yunfeng, Wang, Ruifang, Tong, Yiping, Zhang, Aimin, Liu, Dongcheng, An, Diaoguo
• Format: Journal Article
• Language: English
• Published: Switzerland Frontiers Media S.A 17.03.2023
• Subjects: high-density linkage map; Plant Science; QTL mapping; the wheat 660K SNP array; wheat; yield-related traits; high-density linkage map; wheat; yield-related traits; QTL mapping; the wheat 660K SNP array

Identification of stable major quantitative trait loci (QTLs) for yield-related traits is important for yield potential improvement in wheat breeding. In the present study, we genotyped a recombinant inbred line (RIL) population using the Wheat 660K SNP array and constructed a high-density genetic m...