Generalized Theory of the Thru-Reflect-Match Calibration Technique

• Published in: IEEE transactions on microwave theory and techniques Vol. 63; no. 5; pp. 1693 - 1699
• Main Authors: Pulido-Gaytan, Manuel Alejandro, Apolinar Reynoso-Hernandez, J., Loo-Yau, Jose Raul, Zarate-de Landa, Andres, Maya-Sanchez, Maria del Carmen
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.05.2015; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Analyzers; Calibration; Calibration techniques; Formalism; Impedance; Impedance measurement; Mathematical analysis; measurements techniques; microwave measurements; Microwaves; on-wafer calibration; Power transmission lines; Preserves; Transmission line matrix methods; Transmission line measurements; vector network analysis (VNA); Vectors (mathematics)

The thru-reflect-match (TRM) calibration technique uses as standards a through connection of ports 1 and 2 of the vector network analyzer, two symmetrical highly reflecting loads, and two broadband loads (match) of impedance close to the measuring system impedance (Z o ). The classical theory of the...