Optimal Scheme for Process Quality and Cost Control by Integrating a Continuous Sampling Plan and the Process Yield Index
The single level continuous sampling plan (CSP-1) is an in-line process control tool that has been commonly adopted in various manufacturing industries. However, CSP-1 is designed for only satisfying the quality constraint. At the same time, CSP-1 has disadvantages with the high probabilities of bot...
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Published in | Discrete dynamics in nature and society Vol. 2018; no. 2018; pp. 1 - 14 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
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Cairo, Egypt
Hindawi Publishing Corporation
01.01.2018
Hindawi John Wiley & Sons, Inc Wiley |
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Abstract | The single level continuous sampling plan (CSP-1) is an in-line process control tool that has been commonly adopted in various manufacturing industries. However, CSP-1 is designed for only satisfying the quality constraint. At the same time, CSP-1 has disadvantages with the high probabilities of both Type I and Type II errors due to its inherent deficiency coming from the operating procedure. In this work, an optimal scheme for process quality and cost control is proposed to monitor the process cost and improve the process quality. The CSP-1 and the process yield index (Spk) are integrated in the present scheme, which work independently and complementarily. The four parameters (clearance number, inspecting fraction, sample size, and critical value) are designed in the proposed scheme under simultaneously considering the quality and cost constraints. The sole feasible inspection scheme in CSP-1 under the two constraints is found and used for controlling the process quality. The probabilities of Type I and Type II errors are concurrently controlled at the stipulated level with the risk control scheme, which is constructed with two nonlinear inequation based on the accurate distribution of the index Spk. A case study is illustrated to validate the effectiveness and practicality of the proposed scheme. |
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AbstractList | The single level continuous sampling plan (CSP-1) is an in-line process control tool that has been commonly adopted in various manufacturing industries. However, CSP-1 is designed for only satisfying the quality constraint. At the same time, CSP-1 has disadvantages with the high probabilities of both Type I and Type II errors due to its inherent deficiency coming from the operating procedure. In this work, an optimal scheme for process quality and cost control is proposed to monitor the process cost and improve the process quality. The CSP-1 and the process yield index (Spk) are integrated in the present scheme, which work independently and complementarily. The four parameters (clearance number, inspecting fraction, sample size, and critical value) are designed in the proposed scheme under simultaneously considering the quality and cost constraints. The sole feasible inspection scheme in CSP-1 under the two constraints is found and used for controlling the process quality. The probabilities of Type I and Type II errors are concurrently controlled at the stipulated level with the risk control scheme, which is constructed with two nonlinear inequation based on the accurate distribution of the index Spk. A case study is illustrated to validate the effectiveness and practicality of the proposed scheme. The single level continuous sampling plan (CSP-1) is an in-line process control tool that has been commonly adopted in various manufacturing industries. However, CSP-1 is designed for only satisfying the quality constraint. At the same time, CSP-1 has disadvantages with the high probabilities of both Type I and Type II errors due to its inherent deficiency coming from the operating procedure. In this work, an optimal scheme for process quality and cost control is proposed to monitor the process cost and improve the process quality. The CSP-1 and the process yield index ( S p k ) are integrated in the present scheme, which work independently and complementarily. The four parameters (clearance number, inspecting fraction, sample size, and critical value) are designed in the proposed scheme under simultaneously considering the quality and cost constraints. The sole feasible inspection scheme in CSP-1 under the two constraints is found and used for controlling the process quality. The probabilities of Type I and Type II errors are concurrently controlled at the stipulated level with the risk control scheme, which is constructed with two nonlinear inequation based on the accurate distribution of the index S p k . A case study is illustrated to validate the effectiveness and practicality of the proposed scheme. The single level continuous sampling plan (CSP-1) is an in-line process control tool that has been commonly adopted in various manufacturing industries. However, CSP-1 is designed for only satisfying the quality constraint. At the same time, CSP- 1 has disadvantages with the high probabilities of both Type I and Type II errors due to its inherent deficiency coming from the operating procedure. In this work, an optimal scheme for process quality and cost control is proposed to monitor the process cost and improve the process quality. The CSP-1 and the process yield index ([S.sub.pk]) are integrated in the present scheme, which work independently and complementarily. The four parameters (clearance number, inspecting fraction, sample size, and critical value) are designed in the proposed scheme under simultaneously considering the quality and cost constraints. The sole feasible inspection scheme in CSP-1 under the two constraints is found and used for controlling the process quality. The probabilities of Type I and Type II errors are concurrently controlled at the stipulated level with the risk control scheme, which is constructed with two nonlinear inequation based on the accurate distribution of the index [S.sub.pk]. A case study is illustrated to validate the effectiveness and practicality of the proposed scheme. |
Audience | Academic |
Author | Tong, Shurong Wang, Keqin Li, Chunzhi |
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Cites_doi | 10.1080/03610919408813190 10.1016/j.ijpe.2015.12.016 10.1080/00949655.2016.1189553 10.1016/j.eswa.2009.02.076 10.1002/qre.450 10.1080/03610926.2011.562783 10.1080/16843703.2018.1534363 10.1080/07408178408974692 10.1016/j.cie.2004.06.005 10.1002/qre.1911 10.1002/qre.1614 10.1016/j.cie.2008.12.008 10.1016/j.ejor.2017.12.032 10.1080/02664760050120524 10.1002/qre.544 10.1080/0266476022000006702 10.1080/02664769822945 10.1515/EQC.2002.145 10.2307/1267727 10.1080/08982110008962596 10.1002/qre.1094 10.1214/aoms/1177731420 10.1080/02664760410001681765A 10.1016/j.cie.2014.02.006 10.1080/02664769300000022 10.1002/qre.1781 10.1016/j.cie.2009.11.002 10.1214/aoms/1177728428 10.1155/2015/483674 |
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Copyright | Copyright © 2018 Chunzhi Li et al. COPYRIGHT 2018 John Wiley & Sons, Inc. Copyright © 2018 Chunzhi Li et al. This is an open access article distributed under the Creative Commons Attribution License (the “License”), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. https://creativecommons.org/licenses/by/4.0 |
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References | 26 (21) 2001; 6 28 29 (8) 1984; 16 (25) 1959; 16 30 31 32 11 (15) 2018; 2018 33 12 34 13 35 (4) 2012; 6 14 36 37 16 (24) 1995; 19 38 17 18 19 (10) 1959 1 (23) 2000; 19 2 3 6 7 9 (27) 2002; 18 (22) 2012; 3 (5) 2004; 31 20 |
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SubjectTerms | Cost control Economic aspects Inspection Manufacturing industry Preventive maintenance Process controls Quality Reliability engineering Risk management Sampling Simulation |
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Title | Optimal Scheme for Process Quality and Cost Control by Integrating a Continuous Sampling Plan and the Process Yield Index |
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