Application of ellipsometry techniques to biological materials

• Published in: Thin solid films Vol. 519; no. 9; pp. 2589 - 2592
• Main Author: Arwin, Hans
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Amsterdam Elsevier B.V 28.02.2011; Elsevier
• Subjects: Beetles; Bioadsorption; Biological materials; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Cross-disciplinary physics: materials science; rheology; Density; Ellipsometry; Exact sciences and technology; Infrared ellipsometry; Infrared ellipsomety; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; Materials science; Mueller-matrix ellipsometry; Nanoscale materials and structures: fabrication and characterization; Nanostructure; Optical instruments, equipment and techniques; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation; Optical properties of specific thin films; Other topics in nanoscale materials and structures; Parametrization; Photonics; Physics; Polarimeters and ellipsometers; Proteins; Scarab beetles; TECHNOLOGY; TEKNIKVETENSKAP; Bioadsorption; Scarab beetles; Infrared ellipsometry; Mueller-matrix ellipsometry; Spectroscopic ellipsometry; Refractive index; Macromolecules; Mueller matrix; Nanostructures; Structural models; Proteins; Dielectric function; Temperature effects; Optical properties; Monolayers; Fibrinogen; Biological techniques; Crystal structure
• ISSN: 0040-6090; 1879-2731
• DOI: 10.1016/j.tsf.2010.11.082

Ellipsometry is well-suited for bioadsorption studies and numerous reports, mainly using null ellipsometry, are found on this subject whereas investigations addressing structural properties of thin biolayers are few. Here two examples based on the use of spectroscopic ellipsometry (SE) on the latter are briefly discussed. In the first example, time evolution of thickness, spectral refractive index and surface mass density of a fibrinogen matrix forming on a silicon substrate are investigated with SE and a structural model of the protein matrix is discussed. In the second example a model dielectric function concept for protein monolayers is presented. The model allows parameterization of the optical properties which facilitates monitoring of temperature induced degradation of a protein layer. More recently, photonic structures in beetles have been studied with SE. It is shown here that full Mueller-matrix SE can resolve very complex nanostructures in scarab beetles, more specifically chiral structures causing reflected light to become circularly polarized.