Evaluation of Thermal Diffuse Electron Scattering in Au with the Imaging Plate

• Published in: Materials Transactions, JIM Vol. 36; no. 5; pp. 686 - 688
• Main Authors: Ohishi, Takashi, Shindo, Daisuke, Hiraga, Kenji, Kudoh, Jun-ichi
• Format: Journal Article
• Language: English
• Published: Sendai The Japan Institute of Metals 1995; Japan Institute of Metals
• Subjects: Applied sciences; Condensed matter: structure, mechanical and thermal properties; electron diffraction pattern; Exact sciences and technology; imaging plate; in-situ observation; Metals. Metallurgy; Physics; quantitative analysis; Structure and morphology; thickness; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); thermal diffuse scattering; Thin film structure and morphology; Thin films; Gold; Electron scattering; Electron diffraction; Temperature effects; In situ; Thermal diffuse scattering; Experimental study; Quantitative chemical analysis
• DOI: 10.2320/matertrans1989.36.686
• ISSN: 0916-1821

By using the imaging plate, electron diffraction patterns of an Au thin film were observed quantitatively by changing the temperature. Intensity of both Bragg reflections and the background in the electron diffraction patterns contributed from thermal diffuse scattering as well as plasmon scattering were measured accurately. It was shown that the background contributed from the thermal diffuse scattering in the electron diffraction patterns increased monotonously with the increase of temperature. The change in the observed intensity of the thermal diffuse scattering with the change in temperature was briefly discussed in terms of a theoretical model.