Hao, Y., Khoo, H. M., von Ellenrieder, N., & Gotman, J. (2017). Subject‐level reliability analysis of fast fMRI with application to epilepsy. Magnetic resonance in medicine, 78(1), 370-382. https://doi.org/10.1002/mrm.26365
Chicago Style (17th ed.) CitationHao, Yongfu, Hui Ming Khoo, Nicolas von Ellenrieder, and Jean Gotman. "Subject‐level Reliability Analysis of Fast FMRI with Application to Epilepsy." Magnetic Resonance in Medicine 78, no. 1 (2017): 370-382. https://doi.org/10.1002/mrm.26365.
MLA (9th ed.) CitationHao, Yongfu, et al. "Subject‐level Reliability Analysis of Fast FMRI with Application to Epilepsy." Magnetic Resonance in Medicine, vol. 78, no. 1, 2017, pp. 370-382, https://doi.org/10.1002/mrm.26365.
Warning: These citations may not always be 100% accurate.