Quantification of the Electromechanical Measurements by Piezoresponse Force Microscopy - Buragohain, Pratyush; Lu, Haidong; Richter, Claudia; Schenk, Tony; Kariuki, Pamenas; Glinsek, Sebastjan; Funakubo, Hiroshi; Íñiguez, Jorge; Defay, Emmanuel; Schroeder, Uwe; Gruverman, Alexei (Advanced materials (Weinheim), 2022)
Keywords: Capacitors; Coefficients; ferroelectric hafnium oxide; Ferroelectric materials; Ferroelectricity; Ferroelectrics; Hafnium oxide; Materials science; Microscopy; negative piezoelectric coefficient; PFM quantification; Piezoelectricity; piezoresponse force microscopy; Thin films